IP Library Granted Patent US 9,425,037
Granted Patent B2
US 9,425,037 · App. 13/351,339 · Granted Aug 23, 2016

Silicon polishing compositions with improved PSD performance

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Quick Facts
Patent No.
US 9,425,037
App. No.
13/351,339
Granted
Aug 23, 2016
Kind
B2
Abstract

The invention relates to a chemical-mechanical polishing composition comprising silica, one or more tetraalkylammonium salts, one or more bicarbonate salts, one or more alkali metal hydroxides, one or more aminophosphonic acids, one or more rate accelerator compounds, one or more polysaccharides, and water. The polishing composition reduces surface roughness and PSD of polished substrates. The invention further relates to a method of chemically-mechanically polishing a substrate, especially a silicon substrate, using the polishing composition described herein.

Claims (33)

1. A chemical-mechanical polishing composition comprising:

(a) silica,

(b) one or more tetraalkylammonium salts,

(c) one or more bicarbonate salts,

(d) one or more alkali metal hydroxides, (e) one or more aminophosphonic acids,

(f) at least one rate accelerator compound is a heterocyclic aliphatic amine,

(g) one or more polysaccharides selected from the group consisting of hydroxyalkylcelluloses, dextrans, carboxylated dextrans, and sulfonated dextrans, wherein a least one polysaccharide has an average molecular weight less than 300,000 g/mol, and

(f) water.

2. The polishing composition of claim 1 , wherein the heterocyclic aliphatic amine is aminoethylpiperazine.

3. A chemical-mechanical polishing composition comprising:

(a) silica,

(b) one or more tetraaikylammonium salts,

(c) one or more bicarbonate salts,

(d) one or more alkali metal hydroxides, (e) one or more aminophosphonic acids,

(f) one or more rate accelerator compounds selected from the group consisting of heterocyclic amines, mono amino acids, and hydroxy acids,

(g) at least one polysaccharides is a dextran, wherein at least one polysaccharide has an average molecular weight less than 300,000 g/mol, and

(f) water.

4. A chemical-mechanical polishing composition comprising:

(a) silica,

(b) one or more tetraalkyiammonium salts,

(c) one or more bicarbonate salts,

(d) one or more alkali metal hydroxides, (e) one or more aminophosphonic acids,

(f) one or more rate accelerator compounds selected from the group consisting of heterocyclic amines, mono amino acids, and hydroxy acids,

(g) at least one polysaccharides is a carboxylated dextran, wherein at least one polysaccharide has an average molecular weight less than 300,000 g/mol, and

(f) water.

5. A chemical-mechanical polishing composition comprising:

(a) silica,

(b) one or more tetraalkyiammonium salts,

(c) one or more bicarbonate salts,

(d) one or more alkali metal hydroxides, (e) one or more aminophosphonic acids,

(f) one or more rate accelerator compounds selected from the group consisting of heterocyclic amines, mono amino acids, and hydroxy acids,

(g) at least one polysaccharides is a sulfonated dextran, wherein at least one polysaccharide has an average molecular weight less than 300,000 g/mol, and

(f) water.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 5, 2012
From: REISS, BRIAN; CLARK, JOHN; JONES, LAMON; WHITE, MICHAEL
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 028003/0146 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →