IP Library Granted Patent US 9,039,914
Granted Patent B2
US 9,039,914 · App. 13/478,292 · Granted May 26, 2015

Polishing composition for nickel-phosphorous-coated memory disks

Inventors: Selvaraj Palanisamy Chinnathambi (Jurong, SG); Haresh Siriwardane (Woodlands, SG)
Assignee: Cabot Microelectronics Corporation
C09K3/1463H01L21/3212H01L21/30625B81C2201/0104
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Quick Facts
Patent No.
US 9,039,914
App. No.
13/478,292
Granted
May 26, 2015
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition containing wet-process silica, an oxidizing agent that oxidizes nickel-phosphorous, a chelating agent, polyvinyl alcohol, and water. The invention also provides a method of chemically-mechanically polishing a substrate, especially a nickel-phosphorous substrate, by contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.

Claims (36)

1. A method of chemically-mechanically polishing a memory or rigid disk substrate, which method comprises:

(i) providing a memory or rigid disk substrate comprising at least one layer of nickel-phosphorous,

(ii) providing a polishing pad,

(iii) providing a polishing composition comprising:

(a) wet-process silica,

(b) an oxidizing agent that oxidizes nickel-phosphorous,

(c) a chelating agent,

(d) polyvinyl alcohol, wherein the polyvinyl alcohol has a degree of hydrolysis of about 90% or more,

(e) water,

wherein the polishing composition has a pH of about 1 to about 4,

(iv) contacting a surface of the substrate with the polishing pad and the polishing composition, and

(v) abrading at least a portion of the surface of the substrate to remove at least some nickel-phosphorous from the surface of the substrate and to polish the surface of the substrate.

2. The method of claim 1 , wherein the polishing composition comprises about 1 wt. % to about 10 wt. % of wet-process silica.

3. The method of claim 1 , wherein the oxidizing agent is hydrogen peroxide.

4. The method of claim 1 , wherein the chelating agent is glycine or alanine.

5. The method of claim 1 , wherein the polishing composition comprises about 0.1 wt. % to about 2 wt. % of the chelating agent.

6. The method of claim 1 , wherein the polyvinyl alcohol has a degree of hydrolysis of about 98% or more.

7. The method of claim 1 , wherein the polishing composition comprises about 0.1 wt. % to about 2 wt. % of polyvinyl alcohol.

8. The method of claim 1 , wherein the polishing composition has a pH of about 1 to about 3.

9. The method of claim 1 , wherein the substrate is a nickel-phosphorous-coated aluminum disk.

10. The method of claim 1 , wherein the wet-process silica has an average particle size of about 10 nm to about 80 nm.

11. The method of claim 10 , wherein the wet-process silica has an average particle size of about 10 nm to about 30 nm.

12. The method of claim 1 , wherein the polyvinyl alcohol has a molecular weight of about 8,000 g/mol to about 50,000 g/mol.

13. The method of claim 12 , wherein the polyvinyl alcohol has a molecular weight of about 13,000 g/mol to about 23,000 g/mol.

14. A method of chemically-mechanically polishing a memory or rigid disk substrate, which method comprises:

(i) providing a memory or rigid disk substrate,

(ii) providing a polishing pad,

(iii) providing the polishing composition comprising:

(a) wet-process silica,

(b) an oxidizing agent that oxidizes nickel-phosphorous,

(c) a chelating agent,

(d) polyvinyl alcohol, wherein the polyvinyl alcohol has a molecular weight of about 8,000 g/mol to about 50,000 g/mol,

(e) water,

wherein the polishing composition has a pH of about 1 to about 4, and wherein the polishing composition does not comprise a heterocyclic compound,

(iv) contacting a surface of the substrate with the polishing pad and the polishing composition, and

(v) abrading at least a portion of the surface of the substrate to remove at least some portion of the surface of the substrate so as to polish the surface of the substrate.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.
Reel/Frame 047521/0729 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT SUPPLEMENT Recorded Dec 23, 2013
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 031868/0561 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2013
From: PALANISAMY CHINNATHAMBI, SELVARAJ; SIRIWARDANE, HARESH
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 029658/0886 →
Continuity (1)
Related Publication 20130313226A1 · Nov 28, 2013