IP Library Granted Patent US 8,557,137
Granted Patent B2
US 8,557,137 · App. 13/546,128 · Granted Oct 15, 2013

Polishing composition for nickel phosphorous memory disks

Inventors: Selvaraj Palanisamy Chinnathambi (Taman Jurong, SG); Haresh Siriwardane (Palm Garden, SG)
Assignee: Cabot Microelectronics Corporation
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Quick Facts
Patent No.
US 8,557,137
App. No.
13/546,128
Granted
Oct 15, 2013
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, oxalic acid, optionally, tartaric acid, optionally, a nonionic surfactant, optionally, a biocide, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.

Claims (19)

1. A chemical-mechanical polishing composition comprising:

(a) alpha alumina,

(b) fumed alumina,

(c) silica,

(d) an oxidizing agent that oxidizes nickel-phosphorous,

(e) about 0.1 wt.% to about 2 wt.% of oxalic acid,

(f) about 0.1 wt% to 0.75 wt.% tartaric acid,

(g) a nonionic surfactant,

(h) optionally, a biocide, and

(i) water,

wherein the polishing composition has a pH of about 2 to about 4.

2. The polishing composition of claim 1 , wherein the polishing composition comprises about 0.5 wt.% to about 2 wt.% of alpha alumina, about 0.1 wt.% to about 1 wt.% of fumed alumina, and about 0.5 wt.% to about 2 wt.% of silica.

3. The polishing composition of claim 1 , wherein the alpha alumina has an average particle size of about 300 nm to about 800 nm.

4. The polishing composition of claim 3 , wherein the alpha alumina has an average particle size of about 400 nm to about 600 nm.

5. The polishing composition of claim 1 , wherein the fumed alumina has an average particle size of about 75 nm to about 150 nm.

6. The polishing composition of claim 1 , wherein the silica has an average particle size of about 20 nm to about 120 nm.

7. The polishing composition of claim 1 , wherein the oxidizing agent is hydrogen peroxide.

8. The polishing composition of claim 1 , wherein the polishing composition comprises about 1 ppm to about 100 ppm of the nonionic surfactant.

9. The polishing composition of claim 1 , wherein the pH of the polishing composition is about 2 to about 3.

Assignments (9)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.
Reel/Frame 047521/0729 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT SUPPLEMENT Recorded Dec 23, 2013
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 031868/0561 →
Continuity (2)
Division 12364937 · Feb 3, 2009
Related Publication 20120273715A1 · Nov 1, 2012