IP Library Granted Patent US 8,518,135
Granted Patent B1
US 8,518,135 · App. 13/594,947 · Granted Aug 27, 2013

Polishing composition containing hybrid abrasive for nickel-phosphorous coated memory disks

Inventors: Rujee Lorpitthaya (Singapore, SG); Selvaraj Palanisamy Chinnathambi (Taman Jurong, SG); Haresh Siriwardane (Woodlands, SG)
Assignee: Cabot Microelectronics Corporation
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Quick Facts
Patent No.
US 8,518,135
App. No.
13/594,947
Granted
Aug 27, 2013
Kind
B1
Abstract

The invention provides a polishing composition that contains (a) an abrasive comprising (i) first alpha alumina particles that have an average aspect ratio of 0.8:1 to 1.2:1, (ii) second alpha alumina that have an average aspect ratio of greater than 1.2:1, (iii) fumed alumina particles, and (iv) wet-process silica particles, and (b) water. The invention also provides a method of polishing a substrate, especially a nickel-phosphorous substrate, with the polishing composition.

Claims (39)

1. A polishing composition comprising:

(a) an abrasive comprising:

(i) first alpha alumina particles, wherein the first alpha alumina particles have an average aspect ratio of 0.8:1 to 1.2:1,

(ii) second alpha alumina particles, wherein the second alpha alumina particles have an average aspect ratio of greater than 1.2:1,

(iii) fumed alumina particles,

(iv) wet-process silica particles, and

(b) water.

2. The composition of claim 1 , wherein the second alpha alumina particles have an average aspect ratio of 1.3:1 to 5:1.

3. The composition of claim 1 , wherein the weight ratio of the first alpha alumina particles to the second alpha alumina particles is 0.1:1 to 1:1.

4. The composition of claim 1 , wherein the abrasive comprises (i) 1 to 10 wt. % of the first alpha alumina particles, (ii) 20 to 60 wt. % of the second alpha alumina particles, (iii) 5 to 20 wt. % of fumed alumina particles, and (iv) 20 to 60 wt. % of wet-process silica particles, based on the total weight of the abrasive in the polishing composition.

5. The composition of claim 1 , wherein the composition comprises 1 wt. % to 10 wt. % of the abrasive.

6. The composition of claim 1 , wherein the composition further comprises an oxidizing agent.

7. The composition of claim 1 , wherein the composition further comprises a chelating agent for nickel.

8. The composition of claim 1 , wherein the composition further comprises a nonionic surfactant.

9. The composition of claim 1 , wherein the first alpha alumina particles have an average particle size of 200 nm to 600 nm, and the second alpha alumina particles have an average particle size of 100 nm to 600 nm.

10. The composition of claim 1 , wherein the composition has a pH of 1 to 4.

11. A method of polishing a substrate, which method comprises:

(i) providing a substrate,

(ii) providing a polishing pad,

(iii) providing a polishing composition comprising:

(a) an abrasive comprising:

(A) first alpha alumina particles, wherein the first alpha alumina particles have an average aspect ratio of 0.81:1 to 1.2:1,

(B) a second alpha alumina particles, wherein the second alpha alumina particles have an average aspect ratio of greater than 1:2,

(C) fumed alumina particles,

(D) wet-process silica particles, and

(b) water,

(iv) contacting a surface of the substrate with the polishing pad and the polishing composition, and

(v) abrading at least a portion of the surface of the substrate to remove at least some portion of the substrate and to polish the surface of the substrate.

12. The method of claim 11 , wherein the second alpha alumina particles have an average aspect ratio of 1.3:1 to 5:1.

13. The method of claim 11 , wherein the weight ratio of the first alpha alumina particles to the second alpha alumina particles is 0.1:1 to 1:1.

14. The method of claim 11 , wherein the abrasive comprises (i) 1 to 10 wt. % of the first alpha alumina particles, (ii) 20 to 60 wt. % of the second alpha alumina panicles, (iii) 5 to 20 wt .% of fumed alumina particles, and (iv) 20 to 60 wt. % of wet-process silica panicles, based on the total weight of the abrasive in the polishing composition.

15. The method of claim 11 , wherein the composition comprises 1 wt. % to 10 wt. % of the abrasive.

16. The method of claim 11 , wherein the composition further comprises an oxidizing agent.

17. The method of claim 11 , wherein the composition further comprises a chelating agent for nickel.

18. The method of claim 11 , wherein the composition further comprises a nonionic surfactant.

19. The method of claim 11 , wherein the first alpha alumina particles have an average particle size of 200 nm to 600 nm, and the second alpha alumina particles have an average particle size of 100 nm to 600 nm.

20. The method of claim 11 , wherein the composition has a pH of 1 to 4.

21. The method of claim 11 , wherein the substrate comprises at least one layer of nickel-phosphorous, and at least some nickel-phosphorous is removed from the surface of the substrate to polish the surface of the substrate.

22. The method of claim 21 , wherein the substrate is a nickel-phosphorous coated aluminum memory disk.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.
Reel/Frame 047521/0729 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT SUPPLEMENT Recorded Dec 23, 2013
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 031868/0561 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2013
From: LORPITTHAYA, RUJEE; PALANISAMY CHINNATHAMBI, SELVARAJ; SIRIWARDANE, HARESH
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 030445/0665 →