IP Library Granted Patent US 9,922,967
Granted Patent B2
US 9,922,967 · App. 14/862,435 · Granted Mar 20, 2018

Multilevel template assisted wafer bonding

Inventor: Stephen B. Krasulick (Albuquerque, NM)
Assignee: SKORPIOS TECHNOLOGIES, INC.
H01L25/50G02B6/13H01L21/4857H01L21/746H01L21/76251H01L21/8258H01L21/84H01L31/18H01L25/167H01L33/0079H01L2224/16225H01L2224/18H01L2924/0002H01S5/021H01S5/0215H01S5/0224
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Quick Facts
Patent No.
US 9,922,967
App. No.
14/862,435
Granted
Mar 20, 2018
Kind
B2
Abstract

Fabricating a multilevel composite semiconductor structure includes providing a first substrate comprising a first material; dicing a second substrate to provide a plurality of dies; mounting the plurality of dies on a third substrate; joining the first substrate and the third substrate to form a composite structure; and joining a fourth substrate and the composite structure.

Claims (29)

1. A method of fabricating a multilevel semiconductor structure, the method comprising:

providing a first substrate including a first plurality of devices;

providing a second substrate including a second plurality of devices;

dicing the second substrate to provide a plurality of dies, each die including one or more of the second plurality of devices;

providing a third substrate;

mounting the plurality of dies on predetermined portions of the third substrate;

aligning the first substrate and the third substrate;

joining the first substrate and the third substrate to form a composite structure;

removing at least a portion of the third substrate from the composite structure;

providing a fourth substrate;

aligning the fourth substrate with the composite structure after providing the fourth substrate; and

joining the fourth substrate and the composite structure, after aligning the fourth substrate with the composite structure, to form a semiconductor structure having multiple levels.

2. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the first substrate is a silicon-on-insulator (SOI) substrate.

3. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the first plurality of devices are silicon-based devices.

4. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the first plurality of devices comprise photonic dies.

5. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the second substrate is a compound semiconductor substrate.

6. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , further comprising removing at least a portion of the fourth substrate from the semiconductor structure having multiple levels.

7. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein:

the plurality of dies is a first plurality of dies; and

the method further comprises mounting a second plurality of dies on predetermined portions of the fourth substrate before joining the fourth substrate and the composite structure.

8. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the fourth substrate comprises silicon.

9. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , further comprising forming an electrical interconnect in the composite structure.

10. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , further comprising:

providing a fifth substrate;

aligning the fifth substrate with the semiconductor structure having multiple levels; and

joining the fifth substrate with the semiconductor structure having multiple levels.

11. The method of fabricating the multilevel semiconductor structure as recited in claim 10 , wherein the first substrate, the fourth substrate, and the fifth substrate comprise silicon.

12. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , wherein the plurality of dies are seed dies and the method further comprises growing material on the seed dies.

13. The method of fabricating the multilevel semiconductor structure as recited in claim 1 , further comprising forming CMOS devices in the fourth substrate.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Nov 22, 2017
From: PACIFIC WESTERN BANK
To: SKORPIOS TECHNOLOGIES, INC.
Reel/Frame 044751/0469 →
SECURITY INTEREST Recorded Oct 23, 2017
From: SKORPIOS TECHNOLOGIES, INC.
To: PACIFIC WESTERN BANK
Reel/Frame 043926/0762 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2015
From: KRASULICK, STEPHEN B.
To: SKORPIOS TECHNOLOGIES, INC.
Reel/Frame 037369/0234 →
Continuity (14)
Continuation In Part 14261276 · Apr 24, 2014
Continuation 13733337 · Jan 3, 2013
Continuation 14862435
Continuation In Part 14245191 · Apr 4, 2014
Continuation 13869408 · Apr 24, 2013
Continuation 13527394 · Jun 19, 2012
Continuation 13112142 · May 20, 2011
Continuation 14862435
Continuation In Part 14482650 · Sep 10, 2014
Continuation 13745577 · Jan 18, 2013
Provisional Application 61583095 · Jan 4, 2012
Provisional Application 61420917 · Dec 8, 2010
Provisional Application 61588080 · Jan 18, 2012
Related Publication 20160111407A1 · Apr 21, 2016