IP Library Granted Patent US 10,220,487
Granted Patent B2
US 10,220,487 · App. 15/042,777 · Granted Mar 5, 2019

Customized polishing pads for CMP and methods of fabrication and use thereof

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Quick Facts
Patent No.
US 10,220,487
App. No.
15/042,777
Granted
Mar 5, 2019
Kind
B2
Abstract

The present application relates to polishing pads for chemical mechanical planarization (CMP) of substrates, and methods of fabrication and use thereof. The pads described in this invention are customized to polishing specifications where specifications include (but not limited to) to the material being polished, chip design and architecture, chip density and pattern density, equipment platform and type of slurry used. These pads can be designed with a specialized polymeric nano-structure with a long or short range order which allows for molecular level tuning achieving superior thermo-mechanical characteristics. More particularly, the pads can be designed and fabricated so that there is both uniform and nonuniform spatial distribution of chemical and physical properties within the pads. In addition, these pads can be designed to tune the coefficient of friction by surface engineering, through the addition of solid lubricants, and creating low shear integral pads having multiple layers of polymeric material which form an interface parallel to the polishing surface. The pads can also have controlled porosity, embedded abrasive, novel grooves on the polishing surface, for slurry transport, which are produced in situ, and a transparent region for endpoint detection.

Claims (6)

1. A method of fabricating a polishing pad for polishing a substrate, the method comprising:

forming a first polymer matrix precursor in a first region of a formation mold;

forming a second polymer matrix precursor in a second region of the formation mold, the second region adjacent to the first region, wherein the first polymer matrix precursor and the second polymer matrix precursor differ by a relative amount of a curative included in the first and second polymer matrix precursors; and

co-curing the first polymer matrix precursor and the second polymer matrix precursor to form a polishing body having a first matrix region formed from the first polymer matrix precursor and having a second matrix region formed from the second polymer matrix precursor, wherein co-curing the first polymer matrix precursor and the second polymer matrix precursor comprises forming a first polyurethane material and a second polyurethane material, respectively, and wherein co-curing the first polymer matrix precursor and the second polymer matrix precursor comprises forming the first matrix region with a first compressibility and forming the second matrix region with a second compressibility different from the first compressibility, wherein co-curing the first polymer matrix precursor and the second polymer matrix precursor comprises forming a boundary between the first matrix region and the second matrix region, wherein forming the boundary comprises forming a region from a mixture of the first polymer matrix precursor and the second polymer matrix precursor, and wherein the pad is circular and an outer annulus of the circular pad is the first matrix region.

2. The method of claim 1 , wherein the curative is a polyamine.

3. The method of claim 1 , wherein the curative is a polyol.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
CHANGE OF NAME Recorded Nov 6, 2018
From: NEOPAD TECHNOLOGIES CORPORATION
To: NEXPLANAR CORPORATION
Reel/Frame 047430/0493 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2016
From: ROY, PRADIP; DEOPURA, MANISH; MISRA, SUDHANSHU
To: NEOPAD TECHNOLOGIES CORPORATION
Reel/Frame 037726/0845 →