IP Library Granted Patent US 10,293,459
Granted Patent B2
US 10,293,459 · App. 15/479,779 · Granted May 21, 2019

Polishing pad having polishing surface with continuous protrusions

Inventors: Paul Andre Lefevre (Portland, OR); William C. Allison (Beaverton, OR); Alexander William Simpson (Hillsboro, OR); Diane Scott (Portland, OR); Ping Huang (Beaverton, OR); Leslie M. Charns (Portland, OR); James Richard Rinehart (Portland, OR); Robert Kerprich (Portland, OR)
Assignee: Cabot Microelectronics Corporation
B24B37/26B24B37/205B24B37/22
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Quick Facts
Patent No.
US 10,293,459
App. No.
15/479,779
Granted
May 21, 2019
Kind
B2
Abstract

Polishing pads having a polishing surface with continuous protrusions are described. Methods of fabricating polishing pads having a polishing surface with continuous protrusions are also described.

Claims (33)

1. A polishing pad for polishing a substrate, the polishing pad comprising:

a polishing body having a polishing side opposite a back surface; and

a polishing surface comprising a plurality of protrusions continuous with the polishing side of the polishing body, each protrusion having a modified-quadrilateral polygon shape in a plane of the polishing surface, wherein the plurality of protrusions is arranged in an X-Y grid pattern, wherein the polishing body and polishing surface are together homogeneous and unitary, and wherein the polishing body and polishing surface comprise a molded polyurethane material, and further comprising:

a solid ring encompassing the plurality of protrusions at an outer most edge of the polishing side of the polishing body, the solid ring continuous with the polishing side of the polishing body, wherein a continuous groove is disposed between the solid ring and the plurality of protrusions.

2. The polishing pad of claim 1 , wherein the modified-quadrilateral polygon shape is selected from the group consisting of a quadrilateral polygon with one or more rounded corners, a quadrilateral polygon with one or more notched corners and a quadrilateral polygon with one or more arced sides.

3. The polishing pad of claim 1 , wherein the modified-quadrilateral polygon shape is selected from the group consisting of a modified-square shape, a modified-rectangular shape, a modified-rhombus shape, and a modified-trapezoidal shape.

4. The polishing pad or claim 1 , wherein the modified-quadrilateral polygon shape is a square with all four corners rounded.

5. The polishing pad or claim 1 , wherein the modified-quadrilateral polygon shape is a square with all four corners notched.

6. The polishing pad of claim 1 , further comprising:

a button region disposed centrally within the X-Y grid pattern of the plurality of protrusions, the button region having a square shape with notched corners.

7. The polishing pad of claim 6 , wherein the button region further comprises a clocking mark on one side of the square shape.

8. The polishing pad of claim 1 , wherein the plurality of protrusions is arranged in a plurality of high density regions having less spacing between adjacent protrusions within a high density region than between adjacent protrusions of adjacent high density regions.

9. The polishing pad of claim 8 , wherein each of the high density regions is substantially square or rectangular, and spacing between each of the high density regions of the plurality of high density regions forms an X-Y grid pattern.

10. The polishing pad of claim 1 , wherein each of the plurality of protrusions has a maximum lateral dimension approximately in the range of 1-30 millimeters, with a spacing between one another approximately in the range of 0.1-3 millimeters.

11. The polishing pad of claim 1 , wherein each protrusion of a first portion of the plurality of protrusions has a first maximum lateral dimension, and each protrusion of a second portion of the plurality of protrusions has a second, different, maximum lateral dimension.

12. The polishing pad of claim 11 , wherein a pattern of the plurality of protrusions comprises a protrusion having a maximum lateral dimension of approximately 10 millimeters surrounded by a plurality of protrusions each having a maximum lateral dimension of approximately 1 millimeter.

13. The polishing pad of claim 1 , wherein each protrusion of a first portion of the plurality of protrusions has a first shape in the plane of the polishing surface, and each protrusion of a second portion of the plurality of protrusions has a second, different, shape in the plane of the polishing surface.

14. The polishing pad of claim 1 , wherein the height of each of the plurality of protrusions is approximately in the range of 0.5-1 millimeter.

15. The polishing pad of claim 1 , wherein the plurality of protrusions comprises approximately between 50,000 and 200,000 protrusions for a polishing pad having a diameter approximately in the range of 29-32 inches.

16. The polishing pad of claim 1 , wherein the plurality of protrusions has a randomized pattern.

17. The polishing pad of claim 1 , wherein each protrusion of a first portion of the plurality of protrusions has a first height from the polishing body, and each protrusion of a second portion of the plurality of protrusions has a second, different, height from the polishing body, but all of the plurality of protrusions are substantially co-planar distal from the polishing body.

18. The polishing pad of claim 1 , wherein the molded polyurethane material has a pore density of closed cell pores approximately in the range of 6%-50% total void volume.

19. The polishing pad of claim 1 , further comprising:

a foundation layer disposed on the back surface of the polishing body.

20. The polishing pad of claim 1 , further comprising:

a detection region disposed in the back surface of the polishing body.

21. The polishing pad of claim 1 , further comprising:

an aperture disposed in the polishing surface and polishing body; and

an adhesive sheet disposed on the back surface of the polishing body, the adhesive sheet providing an impermeable seal for the aperture at the back surface of the polishing body.

22. The polishing pad of claim 1 , further comprising:

a sub pad disposed on the back surface of the polishing body.

23. The polishing pad of claim 1 , further comprising:

a local area transparency (LAT) region disposed in the polishing body, the LAT region interrupting a pattern of the plurality of protrusions.

Assignments (9)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2017
From: LEFEVRE, PAUL ANDRE; ALLISON, WILLIAM C.; SIMPSON, ALEXANDER WILLIAM; SCOTT, DIANE; HUANG, PING; CHARNS, LESLIE M.; RINEHART, JAMES; KERPRICH, ROBERT
To: NEXPLANAR CORPORATION
Reel/Frame 043067/0291 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
Continuity (2)
Division 13747139 · Jan 22, 2013
Related Publication 20170203409A1 · Jul 20, 2017