IP Library › Granted Patent US 10,640,680
Granted Patent B2
US 10,640,680 · App. 15/951,358 · Granted May 5, 2020

Chemical-mechanical processing slurry and methods

Inventors: Lu Tian (Singapore, SG); Ke Zhang (Singapore, SG); Andrew Haerle (Sutton, MA); Hon Wu Lau (Singapore, SG)
Assignee: Cabot Microelectronics Corporation
C09G1/02G11B5/8404H01L21/3212
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Quick Facts
Patent No.
US 10,640,680
App. No.
15/951,358
Granted
May 5, 2020
Kind
B2
Abstract

Described are chemical mechanical processing (CMP) compositions and related methods, including compositions and methods for polishing nickel-containing substrate surfaces such as nickel phosphorus (NiP) surfaces for hard disk applications, wherein the compositions contain highly irregular-shaped fused silica abrasive particles.

Claims (22)

1. A chemical-mechanical polishing composition comprising:

liquid carrier,

about 0.5 to 12 weight percent abrasive particles comprising highly irregular-shaped fused silica abrasive particles, wherein at least half of the surfaces of the highly irregular shaped fused silica are non-rounded, non-smooth, bumpy, or rough, and have a cornered or angular edge,

the composition further comprising one or more of a metal ion accelerator, stabilizer, nickel complexing agent, chelating agent, and pH control agent, and

optionally, an oxidizing agent.

2. The polishing composition of claim 1 wherein the highly irregular-shaped fused silica abrasive particles have an average particle size in a range from 50 to 2000 nanometers.

3. The polishing composition of claim 1 wherein the highly irregular-shaped fused silica abrasive particles have an average particle size in a range from 100 to 1000 nanometers.

4. The polishing composition of claim 1 , further comprising abrasive particles selected from the group consisting of silicon nitride, titanium oxide, thorium oxide, alumina, yttria, zirconia, diamond, and ceria.

5. The polishing composition of claim 1 further comprising colloidal silica particles.

6. The polishing composition of claim 5 wherein the polishing composition contains:

from 10 to 40 parts by weight of the highly irregular-shaped fused silica abrasive particles, and

from 60 to 90 parts by weight colloidal silica particles, based on 100 parts by weight total abrasive particles in the slurry.

7. The polishing composition of claim 5 wherein the polishing composition contains,

from 0.1 to 10 weight percent of the highly irregular-shaped fused silica abrasive particles, and

up to 25 weight percent colloidal silica particles, based on total weight slurry.

8. The polishing composition of claim 5 wherein the polishing composition contains at point-of-use:

from 0.1 to 5 weight percent of the highly irregular-shaped fused silica abrasive particles, and

from 1 to 10 weight percent colloidal silica particles, based on total weight slurry.

9. The polishing composition of claim 5 wherein the polishing composition is a concentrate and contains:

from 5 to 40 weight percent of the highly irregular-shaped fused silica abrasive particles, and

from 10 to 50 weight percent colloidal silica particles, based on total weight slurry.

10. The polishing composition of claim 1 having a pH below about 3.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2018
From: TIAN, LU; ZHANG, KE; HAERLE, ANDREW; LAU, HON WU
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 045518/0434 →
Continuity (2)
Provisional Application 62485441 · Apr 14, 2017
Related Publication 20180298234A1 · Oct 18, 2018