Semiconductor devices and methods of manufacturing semiconductor devices
In one example, a semiconductor device can comprise a unit substrate comprising a unit conductive structure and a unit dielectric structure, and an electronic component coupled to the unit conductive structure. The unit substrate can comprise a portion of a singulated subpanel substrate of a panel substrate. Other examples and related methods are also disclosed herein.
1 . A method of manufacturing a semiconductor device, comprising:
receiving a panel comprising a panel base to which a plurality of subpanel substrates are coupled, the plurality of subpanel substrates comprising a first subpanel substrate, wherein the first subpanel substrate comprise a dielectric structure and a conductive structure;
cutting around a perimeter of the first subpanel substrate through a layer of a material over the panel base;
removing the first subpanel substrate from the panel;
providing a first electronic component and a second electronic component on the first subpanel substrate;
providing a first encapsulant on the first subpanel substrate, wherein the first encapsulant covers a lateral side of the first electronic component and a lateral side of the second electronic component;
singulating the first subpanel substrate into individual unit substrates, wherein cutting occurs prior to singulating, and wherein removing occurs after cutting and prior to providing the first electronic component, the second electronic component, and the first encapsulant.
2 . The method of claim 1 , comprising:
cutting around the first subpanel substrate through the layer of material by, at least in part, moving a first blade around at least a first partial perimeter of the first subpanel substrate.
3 . The method of claim 1 , wherein the layer of material comprises a subpanel body on an upper surface of the panel base and on an upper surface of the first subpanel substrate.
4 . The method of claim 1 , wherein the layer of material comprises an adhesive layer on an upper surface of the panel base and on a lower surface of the first subpanel substrate.
5 . The method of claim 1 , wherein:
the layer of material couples the first subpanel substrate to the panel base.
6 . The method of claim 1 , wherein, after cutting the layer of material, the layer of material is on an upper side of the panel base outside a footprint of the first subpanel substrate and on a lateral side of the first subpanel substrate.
7 . The method of claim 1 , wherein the panel is rectangular and the first subpanel substrate is circular.
8 . The method of claim 1 , wherein the plurality of subpanel substrates comprises a second subpanel substrate that is contiguous with the first subpanel substrate.
9 . A method of manufacturing a semiconductor device, comprising:
receiving a panel to which a plurality of subpanels are coupled, the plurality of subpanels comprising a first subpanel;
cutting around a perimeter of the first subpanel through a layer of a material over the panel, wherein cutting includes cutting through the panel;
removing the first subpanel from the panel; and
singulating the first subpanel into individual unit substates, wherein cutting occurs prior to singulating, and wherein removing occurs after cutting and prior to singulating.
10 . The method of claim 9 , wherein:
cutting around the perimeter of the first subpanel through the layer of material comprises, at least in part, moving a first blade around at least a first partial perimeter of the first subpanel.
11 . The method of claim 9 , comprising:
providing a first electronic component and a second electronic component on the first subpanel; and
providing a first encapsulant on the first subpanel, wherein the first encapsulant covers a lateral side of the first electronic component and a lateral side of the second electronic component;
wherein removing occurs after cutting and prior to providing the first electronic component, the second electronic component, and the first encapsulant.
12 . A method of manufacturing a semiconductor device, comprising:
receiving a panel to which a plurality of subpanels are coupled, the plurality of subpanels comprising a first subpanel;
cutting around a perimeter of the first subpanel through a layer of a material over the panel;
removing the first subpanel from the panel; and
singulating the first subpanel into individual unit substates, wherein cutting occurs prior to singulating, and wherein removing occurs after cutting and prior to singulating,
providing a first electronic component and a second electronic component on the first subpanel; and
providing a first encapsulant on the first subpanel, wherein the first encapsulant covers a lateral side of the first electronic component and a lateral side of the second electronic component;
wherein removing occurs after cutting and prior to providing the first electronic component, the second electronic component, and the first encapsulant.
13 . The method of claim 12 , wherein:
cutting around the perimeter of the first subpanel through the layer of material comprises, at least in part, moving a first blade around at least a first partial perimeter of the first subpanel.
14 . The method of claim 12 , comprising:
providing a first electronic component and a second electronic component on the first subpanel; and
providing a first encapsulant on the first subpanel, wherein the first encapsulant covers a lateral side of the first electronic component and a lateral side of the second electronic component;
wherein removing occurs after cutting and prior to providing the first electronic component, the second electronic component, and the first encapsulant.
15 . The method of claim 12 , wherein the panel is rectangular and the subpanels in the plurality of subpanels are circular.
16 . The method of claim 12 , wherein cutting includes cutting through the panel.