IP Library › Granted Patent US 12,295,215
Granted Patent B2
US 12,295,215 · App. 18/545,676 · Granted May 6, 2025

Methods of fabricating OLED panel with inorganic pixel encapsulating barrier

Inventors: Ji-young Choung (Hwaseong-si, KR); Dieter Haas (Santa Clara, CA); Yu Hsin Lin (Zhubei, TW); Jungmin Lee (Santa Clara, CA); Seong Ho Yoo (San Ramon, CA); Si Kyoung Kim (Gwangju-si, KR)
Assignee: Applied Materials, Inc.
H10K59/122H10K50/84H10K50/844H10K59/173H10K59/873H10K71/00H10K59/1201
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Quick Facts
Patent No.
US 12,295,215
App. No.
18/545,676
Granted
May 6, 2025
Kind
B2
Abstract

Embodiments described herein relate to sub-pixel circuits and methods of forming sub-pixel circuits that may be utilized in a display such as an organic light-emitting diode (OLED) display. The device includes a plurality of sub-pixels, each sub-pixel of the plurality of sub-pixels defined by adjacent pixel-defining layer (PDL) structures with inorganic overhang structures disposed on the PDL structures, each sub-pixel having an anode, organic light-emitting diode (OLED) material disposed on the anode, and a cathode disposed on the OLED material. The device is made by a process including the steps of: depositing the OLED material and the cathode by evaporation deposition, and depositing an encapsulation layer disposed over the cathode.

Claims (57)

1. A device, comprising:

a substrate;

overhang structures disposed over the substrate, the overhang structures having a bottommost surface having a bottom width less than a top width of a top surface, the overhang structures comprising a conductive material;

an organic light-emitting diode (OLED) material disposed:

on the top surface of the overhang structures;

on a sidewall of the overhang structures adjacent to the top surface; and

between adjacent overhang structures;

a cathode disposed:

on the OLED material on the top surface of the overhang structures; and

over a sidewall of the overhang structures, the cathode having:

a lower portion disposed along the sidewall adjacent to the bottommost surface with an endpoint before the top surface of the overhang structures; and

an upper portion disposed along the sidewall adjacent to the top surface of the overhang structures; and

between the adjacent overhang structures; and

an encapsulation layer disposed:

over the cathode over the top surface of the overhang structures;

along the sidewall of the overhang structures; and

between the adjacent overhang structures, the encapsulation layer separates the OLED material and the cathode adjacent to the top surface of the overhang structures from the OLED material and the cathode between the adjacent overhang structures, wherein the encapsulation layer contacts the sidewall of the overhang structures between the lower portion of the cathode along the sidewall of the overhang structures and the upper portion of the cathode on the OLED material disposed adjacent to the top surface of the overhang structures.

2. The device of claim 1 , wherein the conductive material includes a metal-containing material.

3. The device of claim 2 , wherein the metal-containing material includes copper, titanium, aluminum, molybdenum, silver, indium tin oxide, indium zinc oxide, or combinations thereof.

4. The device of claim 1 , wherein the OLED material comprises a hole injection layer (HIL), a hole transport layer (HTL), an emissive layer (EML), and an electron transport layer (ETL).

5. The device of claim 1 , wherein the substrate is a pre-patterned indium tin oxide (ITO) glass substrate.

6. The device of claim 1 , further comprising a global passivation layer disposed over the overhang structures and the encapsulation layer.

7. A device, comprising:

a substrate;

overhang structures disposed over the substrate, the overhang structures having a bottommost surface having a bottom width less than a top width of a top surface, the overhang structures comprising a conductive material;

an organic light-emitting diode (OLED) material, the OLED material having:

a first portion disposed over and adjacent to the top surface of the overhang structures; and

a second portion disposed between adjacent overhang structures;

a cathode, the cathode having:

a third portion disposed over the OLED material on the top surface of the overhang structures;

a fourth portion disposed between the adjacent overhang structures and over a sidewall of the overhang structures, the cathode having a portion disposed along the sidewall adjacent to the bottommost surface with an endpoint before the top surface of the overhang structures; and

a fifth portion disposed along the sidewall adjacent to the top surface of the overhang structures; and

an encapsulation layer disposed:

over the cathode over the top surface of the overhang structures;

along the sidewall of the overhang structures, the encapsulation layer along the sidewall separates the first portion of the OLED material and the third portion of the cathode from the second portion of the OLED material and the fourth portion of the cathode, wherein the encapsulation layer contacts the sidewall of the overhang structures between the fourth portion of the cathode and the fifth portion of the cathode on the OLED material adjacent to the top surface of the overhang structures; and

between the adjacent overhang structures.

8. The device of claim 7 , wherein the conductive material includes a metal-containing material.

9. The device of claim 8 , wherein the metal-containing material includes copper, titanium, aluminum, molybdenum, silver, indium tin oxide, indium zinc oxide, or combinations thereof.

10. The device of claim 7 , wherein the OLED material comprises a hole injection layer (HIL), a hole transport layer (HTL), an emissive layer (EML), and an electron transport layer (ETL).

11. The device of claim 7 , wherein the substrate is a pre-patterned indium tin oxide (ITO) glass substrate.

12. The device of claim 7 , further comprising a global passivation layer disposed over the overhang structures and the encapsulation layer.

13. A device, comprising:

a substrate;

overhang structures disposed over the substrate, the overhang structures having a bottommost surface having a bottom width less than a top width of a top surface, the overhang structures comprising a conductive material;

an organic light-emitting diode (OLED) material disposed:

on the top surface of the overhang structures;

along a portion of a sidewall of the overhang structures; and

between adjacent overhang structures;

a cathode disposed:

on the OLED material on the top surface of the overhang structures;

along a lower portion of the sidewall of the overhang structures adjacent to the bottommost surface with an endpoint before the top surface of the overhang structures, and along an upper portion disposed along the sidewall adjacent to the top surface of the overhang structures; and

between the adjacent overhang structures; and

an encapsulation layer disposed:

over the cathode over the top surface of the overhang structures;

along the sidewall of the overhang structures; and

between the adjacent overhang structures, the encapsulation layer separates the OLED material and the cathode over the top surface of the overhang structures from the OLED material and the cathode between the adjacent overhang structures, wherein the encapsulation layer contacts the sidewall of the overhang structures between the lower portion of the cathode along the sidewall of the overhang structures and the upper portion of the cathode on the OLED material disposed adjacent to the top surface of the overhang structures.

14. The device of claim 13 , wherein the conductive material includes copper, titanium, aluminum, molybdenum, silver, indium tin oxide, indium zinc oxide, or combinations thereof.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2023
From: CHOUNG, JI-YOUNG; HAAS, DIETER; LIN, YU HSIN; LEE, JUNGMIN; YOO, SEONG HO; KIM, SI KYOUNG
To: APPLIED MATERIALS, INC.
Reel/Frame 065914/0317 →
Continuity (11)
Continuation 18346059 · Jun 30, 2023
Continuation 18314915 · May 10, 2023
Continuation 18049868 · Oct 26, 2022
Continuation 18049825 · Oct 26, 2022
Continuation 17498482 · Oct 11, 2021
Continuation 17193321 · Mar 5, 2021
Continuation 17193347 · Mar 5, 2021
Provisional Application 63084445 · Sep 28, 2020
Provisional Application 63075025 · Sep 4, 2020
Provisional Application 63075028 · Sep 4, 2020
Related Publication 20240164149A1 · May 16, 2024
References Cited (54)
US 6060728A · Ghosh et al. · 2000 [cited by applicant]
US 6137220A · Nagayama · 2000 [cited by examiner]
US 6476988B1 · Yudasaka · 2002 [cited by applicant]
US 8686629B2 · Oh et al. · 2014 [cited by applicant]
US 8987717B2 · Kang · 2015 [cited by applicant]
US 9324962B2 · Kim · 2016 [cited by applicant]
US 9337244B2 · Hatano et al. · 2016 [cited by applicant]
US 10170526B1 · Yang · 2019 [cited by applicant]
US 10580843B2 · Zhao et al. · 2020 [cited by applicant]
US 10615231B2 · Wu et al. · 2020 [cited by applicant]
US 20090009069A1 · Takata · 2009 [cited by applicant]
US 20120217516A1 · Hatano · 2012 [cited by examiner]
US 20140131743A1 · Jiang et al. · 2014 [cited by applicant]
US 20150060809A1 · Kim et al. · 2015 [cited by applicant]
US 20190058020A1 · Tsai et al. · 2019 [cited by applicant]
US 20190088730A1 · Lee et al. · 2019 [cited by applicant]
US 20190348482A1 · Bae et al. · 2019 [cited by applicant]
US 20210135150A1 · Wang et al. · 2021 [cited by applicant]
CN 105742311A · 2016 [cited by applicant]
CN 106206620A · 2016 [cited by applicant]
CN 108735791A · 2018 [cited by applicant]
CN 109860239A · 2019 [cited by applicant]
CN 110494986A · 2019 [cited by applicant]
EP 3026725A1 · 2016 [cited by applicant]
EP 20210864841A1 · 2023 [cited by applicant]
JP 2008135325A · 2008 [cited by applicant]
JP 2012190794A · 2012 [cited by applicant]
JP 2016225319A · 2016 [cited by applicant]
KR 20020067671A · 2002 [cited by applicant]
KR 20090004672A · 2009 [cited by applicant]
KR 20140052969A · 2014 [cited by applicant]
KR 20140085979A · 2014 [cited by applicant]
KR 20150025902A · 2015 [cited by applicant]
KR 20150067974A · 2015 [cited by applicant]
KR 20150042989A · 2015 [cited by applicant]
KR 20160017339A · 2016 [cited by applicant]
KR 20160062261A · 2016 [cited by applicant]
KR 20170003298A · 2017 [cited by applicant]
Tanaka et al. English Translation JP2008135325A, pp. 1-22 (Year: 2008). [cited by examiner]
English Translation of KR20160017339A provided on IDS received Mar. 8, 2024 (Year: 2016). [cited by examiner]
International Search Report/Written Opinion issued to PCT/US2021/021077 on Jun. 23, 2021. [cited by applicant]
International Search Report/Written Opinion issued to PCT/US2021/021097 on Jul. 1, 2021. [cited by applicant]
Chinese Office Action dated Jul. 14, 2023, for CN Application No. 202180005553.4. [cited by applicant]
Chinese Office Action issued to Patent Application No. 202180005553.4 on Jul. 8, 2023. [cited by applicant]
China Office Action issued to Patent Application No. 202180005553.4 on Oct. 13, 2023. [cited by applicant]
Korean Notice of Sumission of Third Party Oberservation issued to Patent Application No. 10-2023-7011144 on Nov. 12, 2023. [cited by applicant]
EP Third Party Observation for application No. EP20210864841. [cited by applicant]
Chinease Office Action issued to Patent Application No. 202311158836.X on Nov. 11, 2023. [cited by applicant]
European Third Party Observation for application No. EP20210864841 on Feb. 9, 2024. [cited by applicant]
European Search Report issued to Patent Application No. 21864841.8 on Jan. 24, 2024. [cited by applicant]
Japanese Office Action issued to Application No. 2023-514739 on Feb. 28, 2024. [cited by applicant]
Korean Notice of Submission of Third Party Observations issued to Application No. 10-2023-7011144 on Mar. 7, 2024. [cited by applicant]
Korean Office Action issued to patent application No. 10-2023-7011144 on Sep. 27, 2024. [cited by applicant]
Japanese Office Action issued to Application No. 2023-514739 on Nov. 12, 2024. [cited by applicant]
Cited By (1)
US 12,751,121