IP Library › Granted Patent US 10,269,432
Granted Patent B2
US 10,269,432 · App. 15/479,235 · Granted Apr 23, 2019

Method and apparatus for configuring array columns and rows for accessing flash memory cells

Inventors: Hieu Van Tran (San Jose, CA); Anh Ly (San Jose, CA); Thuan Vu (San Jose, CA); Vipin Tiwari (Dublin, CA); Nhan Do (Saratoga, CA)
Assignee: SILICON STORAGE TECHNOLOGY, INC.
G11C16/08G11C16/0425G11C16/10G11C16/14G11C16/24G11C16/26G11C16/28G11C16/32G11C16/3418G11C16/3427G11C2216/04G11C2216/22
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Quick Facts
Patent No.
US 10,269,432
App. No.
15/479,235
Granted
Apr 23, 2019
Kind
B2
Abstract

In one embodiment of the present invention, one row is selected and two columns are selected for a read or programming operation, such that twice as many flash memory cells can be read from or programmed in a single operation compared to the prior art. In another embodiment of the present invention, two rows in different sectors are selected and one column is selected for a read operation, such that twice as many flash memory cells can be read in a single operation compared to the prior art.

Claims (29)

1. A non-volatile memory device comprising:

an array of split gate flash memory cells comprising a plurality of split gate flash memory cells organized into rows and columns, wherein the array is further organized into a plurality of sectors, each sector comprising a plurality of rows of split gate flash memory cells; and

a row decoder selectively coupled to a first sector within the plurality of sectors and a second sector within the plurality of sectors;

wherein during a read operation, the row decoder selects one row of split gate flash memory cells in the first sector and one row of split gate flash memory cells in the second sector such that when a single column is selected, a read operation is performed on two split gate flash memory cells; and

wherein programming of the selected row of the first sector and programming of the selected row of the second sector occur at the same time.

2. A non-volatile memory device comprising:

an array of flash memory cells comprising a plurality of flash memory cells organized into rows and columns, wherein the array is further organized into plurality of sectors, each sector comprising a plurality of rows of flash memory cells;

a row decoder selectively coupled to a first sector within the plurality of sectors and a second sector within the plurality of sectors; and

a differential sense amplifier selectively coupled to the first sector and the second sector;

wherein during a read operation, the row decoder selects a first row of flash memory cells in the first sector and a second row of flash memory cells in the second sector and when a single column is selected the differential sense amplifier determines the difference in values stored by a selected flash memory cell in the first row and the single column and a selected flash memory cell in the second row and the single column, where the two selected flash memory cells are erased flash memory cells.

3. The non-volatile memory device of claim 2 , where an output of the differential sense amplifier is a ‘1’.

4. A non-volatile memory device comprising:

an array of flash memory cells comprising a plurality of flash memory cells organized into rows and columns, wherein the array is further organized into plurality of sectors, each sector comprising a plurality of rows of flash memory cells;

a row decoder selectively coupled to a first sector within the plurality of sectors and a second sector within the plurality of sectors; and

a differential sense amplifier selectively coupled to the first sector and the second sector;

wherein during a read operation, the row decoder selects a first row of flash memory cells in the first sector and a second row of flash memory cells in the second sector and when a single column is selected the differential sense amplifier determines the difference in values stored by a selected flash memory cell in the first row and the single column and a selected flash memory cell in the second row and the single column, the differential sense amplifier comprising:

a first circuit coupled to the selected flash memory cell in the first sector;

a second circuit coupled to the selected flash memory cell in the second sector; and

a comparator coupled to the first circuit and second circuit to determine a difference in values stored in the selected flash memory cell in the first sector and the selected flash memory cell in the second sector;

wherein the first circuit comprises a first input transistor and the second circuit comprises a second input transistor, the first input transistor and second input transistor having different widths.

5. A non-volatile memory device comprising:

an array of flash memory cells comprising a plurality of flash memory cells organized into rows and columns, wherein the array is further organized into plurality of sectors, each sector comprising a plurality of rows of flash memory cells;

a row decoder selectively coupled to a first sector within the plurality of sectors and a second sector within the plurality of sectors; and

a differential sense amplifier selectively coupled to the first sector and the second sector;

wherein during a read operation, the row decoder selects a first row of flash memory cells in the first sector and a second row of flash memory cells in the second sector and when a single column is selected the differential sense amplifier determines the difference in values stored by a selected flash memory cell in the first row and the single column and a selected flash memory cell in the second row and the single column, the differential sense amplifier comprising:

a first circuit coupled to the selected flash memory cell in the first sector;

a second circuit coupled to the selected flash memory cell in the second sector; and

a comparator coupled to the first circuit and second circuit to determine a difference in values stored in the selected flash memory cell in the first sector and the selected flash memory cell in the second sector;

wherein the first circuit comprises a first input transistor and the second circuit comprises a second input transistor, the first input transistor and second input transistor having different lengths.

Assignments (12)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
Continuity (2)
Division 15238681 · Aug 16, 2016
Related Publication 20180053560A1 · Feb 22, 2018