Device testing architecture of an integrated circuit
A device test architecture and interface is provided to enable efficient testing embedded cores within devices. The test architecture interfaces to standard IEEE 1500 core test wrappers and provides high test data bandwidth to the wrappers from an external tester. The test architecture includes compare circuits that allow for comparison of test response data to be performed within the device. The test architecture further includes a memory for storing the results of the test response comparisons. The test architecture includes a programmable test controller to allow for various test control operations by simply inputting an instruction to the programmable test controller from the external tester. The test architecture includes a selector circuit for selecting a core for testing. Additional features and embodiments of the device test architectures are also disclosed.
1. An integrated circuit comprising:
an input bus;
a control bus;
a first embedded core having a first test access port circuit coupled to the control bus;
a second embedded core having a second test access port circuit coupled to the control bus;
a first wrapper coupled to the first embedded core, the first wrapper coupled to the control bus;
a second wrapper coupled to the second embedded core, the second wrapper coupled to the control bus;
a first test access mechanism coupled to the first wrapper, the first test access mechanism including:
a first test access mechanism first input coupled to the input bus; and
a first test access mechanism second input coupled to the control bus;
a second test access mechanism coupled to the second wrapper, the second test access mechanism including:
a second test access mechanism first input coupled to the input bus; and
a second test access mechanism second input coupled to the control bus; and
a system test access mechanism controller including:
a first enable output coupled to:
the first wrapper;
the first test access port circuit; and
the first test access mechanism;
a second enable output coupled to:
the second wrapper;
the second test access port circuit; and
the second test access mechanism; and
a system test access mechanism controller interface control output coupled to the control bus;
a mode input;
a scan input; and
a scan output.
2. The integrated circuit of claim 1 , wherein:
the system test access mechanism controller includes a scan router having the scan input and the scan output.
3. The integrated circuit of claim 2 , wherein: the scan router includes:
a first test access mechanism data input;
a second test access mechanism data input;
a first test access mechanism data output;
a second test access mechanism data output;
a first wrapper input; a second wrapper input;
a first wrapper output; a second wrapper output;
a first comparator scan input;
a second comparator scan input;
a first comparator scan output; and
a second comparator scan output.
4. The integrated circuit of claim 1 , wherein:
the system test access mechanism controller includes an instruction decode circuit coupled to the mode input.
5. The integrated circuit of claim 4 , wherein:
the instruction decode circuit includes the first enable output and the second enable output.
6. The integrated circuit of claim 5 , wherein:
the system test access mechanism controller includes an instruction register coupled to the instruction decode circuit.
7. The integrated circuit of claim 6 , wherein:
the instruction register is coupled to the input bus.
8. The integrated circuit of claim 6 , wherein:
the instruction register is coupled to a load enable input.