IP Library Granted Patent US 6,998,292
Granted Patent B2
US 6,998,292 · App. 10/308,458 · Granted Feb 14, 2006

Apparatus and method for inter-chip or chip-to-substrate connection with a sub-carrier

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Quick Facts
Patent No.
US 6,998,292
App. No.
10/308,458
Granted
Feb 14, 2006
Kind
B2
Abstract

The present invention is directed to a method and an apparatus where the standard wire bonding of TBGA's is replaced using a solid intermediate subcarrier on which the die may be flip chipped and which may then be flip chipped onto the substrate. The subcarrier has a number of conductors replacing the wire bond. In this manner, a better reflection suppression, better impedance matching, smaller conductor pitch and other advantages are achieved. The subcarrier may also be used for mounting multiple dies in a single substrate.

Claims (36)

1. A method of electrically connecting a die to a substrate, comprising:

providing a die having an upper surface with a number of connecting points;

providing a substrate having an upper surface, a lower surface, a cavity adapted to receive the die, a number of connection points at the upper surface of the substrate, and a number of connection elements for connection to an electrical circuit external to the substrate;

introducing the die into the cavity;

providing a subcarrier including a number of individually shielded electrical conductors;

electrically connecting connection points of the die to connection points of the substrate by positioning the subcarrier with respect to the die and the substrate; and

wherein the electrical conductors are shielded by a number of vias.

2. The method according to claim 1 wherein electrically connecting connection points of the die to connection points of the substrate by positioning the subcarrier with respect to the die and the substrate comprises:

fixing the die and the subcarrier element in relation to each other so that connection points of the die obtain electrical connection to at least one of the conductors of the subcarrier element; and

fixing the subcarrier element and the substrate in relation to each other so that conductors of the subcarrier element obtain electrical connection to at least one of the connection points of the substrate and so that the die is introduced into the cavity.

3. The method according to claim 2 further comprising providing a second die having an upper surface having a number of connection points, and wherein:

the cavity is adapted to receive both the die and the second die;

fixing the die and the subcarrier element in relation to each other further comprises fixing the second die and the subcarrier element to each other so that connection points of the second die obtain electrical connection to at least one of the conductors of the subcarrier element; and

fixing the subcarrier element and the substrate in relation to each other further comprises introducing the second die in the cavity.

4. A method of electrically connecting a die to another element, comprising:

providing a die having an upper surface having a number of connection points;

providing an element having an upper surface with a number of connection points;

providing a subcarrier element having a surface with a number of individually shielded electrical conductors;

providing a substrate having a number of connection points and a cavity adapted to receive the die and the other element;

fixing the die and the subcarrier element in relation to each other so that connection points of the die obtain electrical connection to at least one of the conductors of the subcarrier element;

fixing the subcarrier element and the element in relation to each other so that the connection points of the element obtain electrical connection to at least one of the conductors of the subcarrier element;

introducing the die and the element in the cavity;

providing electrical contact between the substrate and at least one of the die, the element, and the subcarrier element; and

wherein the electrical conductors are shielded by a number of vias.

5. A method according to claim 4 , wherein providing electrical contact between the substrate and at least one of the die, the element, and the subcarrier element further comprises fixing the subcarrier element and the substrate in relation to each other so that connection points of the substrate obtain electrical connection to at least one of the conductors of the subcarrier element.

6. The method according to claim 5 , wherein the connection points of the die, the element, and the substrate define at least substantially congruent planes.

7. The method according to claim 6 , wherein the conductors of the subcarrier element define a plane parallel to the congruent planes.

8. The method according to claim 4 , wherein the connection points abut the conductors so as to obtain the electrical connection.

9. The method according to claim 4 , wherein the connection points are electrically connected to the conductors.

10. The method according to claim 4 further comprising providing a heat sink.

11. The method according to claim 10 , wherein providing the substrate further comprises:

providing the cavity in a manner such that at least part of the cavity is in thermal contact with the heat sink; and

providing thermal contact between the heat sink and at least one of the die, the subcarrier element, and the element.

12. The method according to claim 11 , wherein thermal contact is provided by a thermally conducting material selected from a group consisting of at least one of a fluid, a glue, an epoxy, a resilient material, and a foam.

13. The method according to claim 4 , wherein providing the subcarrier element further comprises providing the subcarrier element that is substantially stiff and electrically insulating and has a number of electrical conductors on a surface.

14. The method according to claim 4 , wherein some of the conductors are provided so as to have the same or equivalent predetermined characteristic impedance.

Assignments (13)
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.), INC.; MICROSEMI FREQUENCY AND TIME CORPORATION; MICROSEMI COMMUNICATIONS, INC.; MICROSEMI SOC CORP.; MICROSEMI CORP. - POWER PRODUCTS GROUP; MICROSEMI CORP. - RF INTEGRATED SOLUTIONS
Reel/Frame 046251/0391 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2017
From: MICROSEMI COMMUNICATIONS, INC.
To: MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 042523/0577 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC. (F/K/A LEGERITY, INC., ZARLINK SEMICONDUCTOR (V.N.) INC., CENTELLAX, INC., AND ZARLINK SEMICONDUCTOR (U.S.) INC.); MICROSEMI FREQUENCY AND TIME CORPORATION (F/K/A SYMMETRICON, INC.); MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION); MICROSEMI SOC CORP. (F/K/A ACTEL CORPORATION); MICROSEMI CORP. - POWER PRODUCTS GROUP (F/K/A ADVANCED POWER TECHNOLOGY INC.); MICROSEMI CORP. - RF INTEGRATED SOLUTIONS (F/K/A AML COMMUNICATIONS, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037691/0697 →
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
MERGER AND CHANGE OF NAME Recorded May 13, 2015
From: VITESSE SEMICONDUCTOR CORPORATION; LLIU100 ACQUISITION CORP.
To: MICROSEMI COMMUNICATIONS, INC.
Reel/Frame 035651/0708 →
SUPPLEMENTAL SECURITY AGREEMENT Recorded Apr 29, 2015
From: MICROSEMI COMMUNICATIONS, INC.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 035532/0925 →
RELEASE OF SECURITY INTEREST Recorded Apr 28, 2015
From: WHITEBOX VSC, LTD.
To: VITESSE SEMICONDUCTOR CORPORATION
Reel/Frame 035526/0090 →
RELEASE OF SECURITY INTEREST Recorded Nov 5, 2014
From: US BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: VITESSE SEMICONDUCTOR CORPORATION
Reel/Frame 034176/0162 →
COLLATERAL ASSIGNMENT (INTELLECTUAL PROPERTY) Recorded Nov 5, 2009
From: VITESSE SEMICONDUCTOR CORPORATION
To: U.S. BANK NATIONAL ASSOCIATION
Reel/Frame 023471/0267 →
SECURITY AGREEMENT Recorded Oct 22, 2009
From: VITESSE SEMICONDUCTOR CORPORATION
To: WHITEBOX VSC, LTD.
Reel/Frame 023401/0813 →
RELEASE OF SECURITY INTEREST Recorded Nov 14, 2007
From: OBSIDIAN, LLC, AS COLLATERAL AGENT
To: VITESSE SEMICONDUCTOR CORPORATION
Reel/Frame 020112/0306 →
SECURITY AGREEMENT Recorded Jun 29, 2006
From: VITESSE SEMICONDUCTOR CORPORATION
To: OBSIDIAN, LLC, AS COLLATERAL AGENT
Reel/Frame 017846/0847 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2003
From: MCDONOUGH, ROBERT J.; SUN, WEIMIN
To: VITESSE SEMICONDUCTOR CORPORATION
Reel/Frame 013412/0295 →