Patent Assignment
Reel/Frame 030740/0481
Assignment of Assignor's Interest
Recorded: 2013-07-03
Pages: 226
Assignor
STMICROELECTRONICS, INC. (FORMERLY KNOWN AS SGS-THOMSON MICROELECTRONICS, INC.)
Executed: 2012-05-23
Assignee
MICRON TECHNOLOGY, INC.
8000 SO. FEDERAL WAY, BOISE, IDAHO, 83716-9632
Covered Properties
(77)
Redundancy Element Check in Ic Memory Without Programming Substitution of Redundant Elements
Patent:
5,404,331 →
Application:
08/099,606 →
Disabling Sense Amplifier
Patent:
5,377,150 →
Application:
08/099,947 →
Distributed nor Tag Match Apparatus
Patent:
5,572,456 →
Application:
08/114,747 →
Precharge Device for an Integrated Circuit Internal Bus
Patent:
5,402,379 →
Application:
08/114,749 →
Latch Controlled Output Driver
Patent:
5,396,108 →
Application:
08/129,257 →
Edge Transition Detection Disable Circuit to Alter Memory Device Operating Characteristics
Patent:
5,418,756 →
Application:
08/129,763 →
Static Test Mode Noise Filter
Patent:
5,440,178 →
Application:
08/160,608 →
Method and Device for Acquiring Redundancy Information from a Packaged Memory Chip
Patent:
6,101,618 →
Application:
08/172,848 →
Data Comparing Sense Amplifier
Patent:
5,568,073 →
Application:
08/172,853 →
Stress Test Mode
Patent:
5,835,427 →
Application:
08/172,854 →
Static Memory Long Write Test
Patent:
5,577,051 →
Application:
08/173,197 →
Method and Apparatus for Programming Signal Timing
Patent:
5,579,326 →
Application:
08/189,589 →
Integrated Circuit with Fuse Circuitry Simulating Fuse Blowing
Patent:
5,517,455 →
Application:
08/220,976 →
Structure Capable of Simultaneously Testing Redundant and Non-Redundant Memory Elements During Stress Testing of an Integrated Circuit Memory Device
Patent:
5,530,674 →
Application:
08/235,161 →
Circuit Which Provides Power on Reset Disable During a Test Mode
Patent:
5,455,799 →
Application:
08/267,666 →
Long Write Test
Patent:
5,583,816 →
Application:
08/267,667 →
Test Mode Control Circuit of an Integrated Circuit Device
Patent:
5,982,188 →
Application:
08/282,047 →
Variable Input Threshold Adjustment
Patent:
5,589,783 →
Application:
08/282,177 →
Apparatus and Method for Enabling a Bus Driver When a Data Signal Is Valid
Patent:
5,566,112 →
Application:
08/288,334 →
Full Memory Chip Long Write Test Mode
Patent:
5,502,678 →
Application:
08/315,337 →
Pre-Charged Exclusionary Wired-Connected Programmed Redundant Select
Patent:
5,495,446 →
Application:
08/316,087 →
Circuit Structure and Method for Stress Testing of Bit Lines
Patent:
5,610,866 →
Application:
08/331,699 →
Low Current Differential Level Shifter
Patent:
5,517,148 →
Application:
08/331,892 →
Circuit for Providing a Compensated Bias Voltage
Patent:
5,568,084 →
Application:
08/357,664 →
Output Driver Circuitry with Selective Limited Output High Voltage
Patent:
5,594,373 →
Application:
08/359,397 →
Voltage Reference Circuit Having a Threshold Voltage Shift
Patent:
5,598,122 →
Application:
08/359,926 →
Adjustable Current Source
Patent:
5,581,209 →
Application:
08/359,927 →
Dynamically Controlled Voltage Reference Circuit
Patent:
5,589,794 →
Application:
08/360,227 →
Output Driver Circuitry with Limited Output High Voltage
Patent:
5,596,297 →
Application:
08/360,228 →
Voltage Reference Circuit Using an Offset Compensating Current Source
Patent:
5,548,241 →
Application:
08/360,229 →
Post-Fabrication Selectable Registered and Non-Registered Memory
Patent:
5,579,263 →
Application:
08/362,187 →
Voltage Regulator for an Output Driver with Reduced Output Impedance
Patent:
5,576,656 →
Application:
08/414,103 →
Apparatus and Method for Mapping a Redundant Memory Column to a Defective Memory Column
Patent:
5,572,470 →
Application:
08/438,349 →
Apparatus and Method for Mapping a Redundant Memory Column to a Defective Memory Column
Patent:
5,574,688 →
Application:
08/438,903 →
Circuit for Providing a Bias Voltage Compensated for P-Channel Transistor Variations
Patent:
5,640,122 →
Application:
08/464,551 →
Circuit and Method for Biasing Bit Lines
Patent:
5,768,206 →
Application:
08/484,491 →
Structure for Deselecting Broken Select Lines in Memory Arrays
Patent:
5,648,933 →
Application:
08/509,211 →
Column Redundancy of a Multiple Block Memory Architecture
Patent:
5,608,678 →
Application:
08/509,351 →
Circuitry and Methodology to Test Single Bit Failures of Integrated Circuit Memory Devices
Patent:
5,633,828 →
Application:
08/519,075 →
Write Controlled Address Buffer
Patent:
5,629,896 →
Application:
08/521,800 →
Test Mode Activation and Data Override
Patent:
6,144,594 →
Application:
08/587,709 →
Circuit and Method for Setting the Time Duration of a Write to a Memory Cell
Patent:
5,864,696 →
Application:
08/587,711 →
Clocked Sense Amplifier with Wordline Tracking
Patent:
5,802,004 →
Application:
08/587,728 →
Switching Master Slave Circuit
Patent:
5,783,958 →
Application:
08/588,648 →
Write Pass Through Circuit
Patent:
5,657,292 →
Application:
08/588,662 →
Pipelined Chip Enable Control Circuitry and Methodology
Patent:
5,701,275 →
Application:
08/588,730 →
Data-Input Device for Generating Test Signals on Bit and Bit-Complement Lines
Patent:
5,845,059 →
Application:
08/588,762 →
Output Driver Circuitry Having a Single Slew Rate Resistor
Patent:
5,801,563 →
Application:
08/588,988 →
Low-Power Read Circuit and Method for Controlling a Sense Amplifier
Patent:
5,619,466 →
Application:
08/589,024 →
Write Driver Having a Test Function
Patent:
5,745,432 →
Application:
08/589,141 →
Integrated Circuit That Supports and Method for Wafer-Level Testing
Patent:
5,808,947 →
Application:
08/710,357 →
Circuit and Method for Selecting a Signal
Patent:
6,037,799 →
Application:
08/758,587 →
External Write Pulse Control Method and Structure
Patent:
5,764,592 →
Application:
08/771,642 →
Sense Amplifier Control of a Memory Device
Patent:
5,959,910 →
Application:
08/844,696 →
Structure for Deselective Broken Select Lines in Memory Arrays
Patent:
36,319 →
Application:
08/966,042 →
Circuit and Method for Reading a Memory Cell
Patent:
5,995,421 →
Application:
09/087,399 →
Method and Structure for Enhancing the Access Time of Integrated Circuit Memory Devices
Patent:
5,946,264 →
Application:
09/183,231 →
Stress Test Mode Entry at Power Up for Low/Zero Power Memories
Patent:
6,081,466 →
Application:
09/183,451 →
Control Circuit for Terminating a Memory Access Cycle in a Memory Block of an Electronic Storage Device
Patent:
6,034,917 →
Application:
09/183,589 →
Initialization for Fuse Control
Patent:
6,041,000 →
Application:
09/183,840 →
Pipelined Non-Blocking Level Two Cache System with Inherent Transaction Collision-Avoidance
Apparatus and Method for Switching Between Two Power Supplies of an Integrated Circuit
Patent:
6,118,188 →
Application:
09/217,321 →
Method and Apparatus for Increasing Comparator Gain Without Affecting Standby Current
Patent:
6,084,390 →
Application:
09/217,323 →
Communications System and Method for Reducing the Effects of Transmitter Non-Linear Distortion on a Received Signal
Patent:
6,434,189 →
Application:
09/335,024 →
Reference Voltage Asjustment
Patent:
6,281,734 →
Application:
09/476,036 →
Power Supply Switch Reference Circuitry
Patent:
37,876 →
Application:
09/568,201 →
Integrated Volatile and Non-Volatile Memory
Patent:
6,594,192 →
Application:
09/653,495 →
Content Addressable Memory (Cam) with Battery Back-Up
Dual Bank Flash Memory Device and Method
Redundancy Circuit and Method for Flash Memory Devices
Single Ended Output Sense Amplifier Circuit with Reduced Power Consumption and Noise
Tamper Memory Cell
User Ram Flash Clear
Reset Initialization
Voltage Translating Control Structure
Reset Circuit
Esd Bonding Pad
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 30, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006645/0395 →
Assignment of Assignor's Interest
Jul 30, 1993
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSOM MICROELECTRONICS, INC.
Reel/Frame 006666/0209 →
Assignment of Assignor's Interest
Aug 31, 1993
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006707/0888 →
Assignment of Assignor's Interest
Aug 31, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006684/0754 →
Assignment of Assignor's Interest
Sep 30, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006724/0702 →
Assignment of Assignor's Interest
Sep 30, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006716/0956 →
Assignment of Assignor's Interest
Nov 30, 1993
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006799/0126 →
Assignment of Assignor's Interest
Dec 22, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006840/0601 →
Assignment of Assignor's Interest
Dec 22, 1993
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006820/0828 →
Assignment of Assignor's Interest
Dec 22, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006824/0614 →
Assignment of Assignor's Interest
Dec 22, 1993
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006828/0888 →
Assignment of Assignor's Interest
Jan 31, 1994
From: MCCLURE,DAVID C.
To: SGS-THOMSON MICROELECTRONICS,INC.
Reel/Frame 006864/0640 →
Assignment of Assignor's Interest
Mar 31, 1994
From: MCCLURE, DAVID CHARLES; SLEMMER, WILLIAM CARL
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007002/0008 →
Assignment of Assignor's Interest
Apr 29, 1994
From: MCCLURE, DAVID CHARLES; TEEL, THOMAS AUSTIN
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 006995/0881 →
Assignment of Assignor's Interest
Jun 29, 1994
From: MCCLURE, DAVID CHARLES; TEEL, THOMAS AUSTIN
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007060/0302 →
Assignment of Assignor's Interest
Jun 29, 1994
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007060/0049 →
Assignment of Assignor's Interest
Jul 29, 1994
From: LYSINGER, MARK ALAN
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007088/0717 →
Assignment of Assignor's Interest
Jul 29, 1994
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007100/0698 →
Assignment of Assignor's Interest
Aug 10, 1994
From: LYSINGER, MARK A.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007106/0620 →
Assignment of Assignor's Interest
Sep 30, 1994
From: TEEL, THOMAS AUSTIN; MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007168/0961 →
Assignment of Assignor's Interest
Sep 30, 1994
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007172/0758 →
Assignment of Assignor's Interest
Oct 31, 1994
From: YIN, RONG
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007253/0534 →
Assignment of Assignor's Interest
Oct 31, 1994
From: MCCLURE, DAVID C.
To: SGS-THOMSON MICROELECTRINCS, INC.
Reel/Frame 007225/0879 →
Assignment of Assignor's Interest
Dec 16, 1994
From: MCCLURE, DAVID CHARLES; TEEL, THOMAS A.
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007294/0891 →
Assignment of Assignor's Interest
Dec 20, 1994
From: MCCLURE, DAVID CHARLES
To: SGS-THOMSON MICROELECTRONICS, INC.
Reel/Frame 007294/0971 →