IP Library Granted Patent US 8,968,058
Granted Patent B2
US 8,968,058 · App. 13/101,826 · Granted Mar 3, 2015

Polishing pad with alignment feature

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Quick Facts
Patent No.
US 8,968,058
App. No.
13/101,826
Granted
Mar 3, 2015
Kind
B2
Abstract

Polishing pads with alignment marks are described. Methods of fabricating polishing pads with alignment marks are also described.

Claims (20)

1. A polishing pad for polishing a substrate, the polishing pad comprising:

a polishing body having a polishing surface and a back surface, the polishing surface having a pattern of grooves comprising a polishing region, wherein the polishing region of the pattern of grooves comprises an alignment feature creating a singular asymmetry within the pattern of grooves, wherein the pattern of grooves comprises a plurality of circumferential grooves intersecting with a plurality of radial grooves, and wherein the alignment feature comprises an interruption in one of the circumferential grooves, the interruption disposed between two radial grooves.

2. The polishing pad of claim 1 , wherein the alignment feature has a length-wise dimension approximately in the range of ⅛ th of an inch to ¼ of an inch.

3. The polishing pad of claim 1 , wherein the alignment feature is adapted to remain throughout the polishing lifetime of the polishing pad.

4. The polishing pad of claim 1 , wherein the plurality of circumferential grooves is a plurality of concentric polygons.

5. The polishing pad of claim 1 , wherein the alignment feature indicates a location of a detection region disposed in the back surface of the polishing pad.

6. The polishing pad of claim 5 , wherein the alignment feature is positioned for alignment with a feature on a platen of a chemical mechanical polishing apparatus.

7. The polishing pad of claim 1 , wherein the polishing body is a molded polishing body, and wherein the alignment feature indicates a location of a region in a mold used for forming the molded polishing body.

8. The polishing pad of claim 1 , wherein the polishing body is a homogeneous polishing body comprising a thermoset polyurethane material.

9. The polishing pad of claim 1 , further comprising:

a local area transparency (LAT) region disposed in the polishing body.

10. A polishing pad for polishing a substrate, the polishing pad comprising:

a polishing body having a polishing surface and a back surface, the polishing surface having a pattern of grooves comprising a polishing region, wherein the pattern of grooves comprises a plurality of circumferential grooves intersecting with a plurality of radial grooves, and wherein the polishing region of the pattern of grooves comprises an alignment feature comprising an interruption in one of the circumferential grooves, the interruption disposed between two radial grooves.

11. The polishing pad of claim 10 , wherein the alignment feature has a length-wise dimension approximately in the range of ⅛ th of an inch to ¼ of an inch.

12. The polishing pad of claim 10 , wherein the alignment feature is adapted to remain throughout the polishing lifetime of the polishing pad.

13. The polishing pad of claim 10 , wherein the plurality of circumferential grooves is a plurality of concentric polygons.

14. The polishing pad of claim 10 , wherein the polishing body is a molded polishing body, and wherein the alignment feature indicates a location of a region in a mold used for forming the molded polishing body.

15. The polishing pad of claim 10 , wherein the polishing body is a homogeneous polishing body comprising a thermoset polyurethane material.

16. The polishing pad of claim 10 , further comprising:

a local area transparency (LAT) region disposed in the polishing body.

Assignments (11)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; NEXPLANAR CORPORATION
Reel/Frame 047586/0400 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
INTELLECTUAL PROPERTY SECURITY JOINDER AGREEMENT Recorded Dec 31, 2015
From: NEXPLANAR CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037407/0071 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2011
From: KERPRICH, ROBERT; ALLISON, WILLIAM C.; SCOTT, DIANE
To: NEXPLANAR CORPORATION
Reel/Frame 026580/0700 →