IP Library Granted Patent US 9,555,518
Granted Patent B2
US 9,555,518 · App. 14/183,894 · Granted Jan 31, 2017

Polishing pad with multi-modal distribution of pore diameters

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Quick Facts
Patent No.
US 9,555,518
App. No.
14/183,894
Granted
Jan 31, 2017
Kind
B2
Abstract

Polishing pads with multi-modal distributions of pore diameters are described. Methods of fabricating polishing pads with multi-modal distributions of pore diameters are also described.

Claims (17)

1. A method of fabricating a polishing pad for polishing a semiconductor substrate, the method comprising:

mixing a pre-polymer and a curative to form a mixture in a formation mold; and

curing the mixture to provide a molded homogeneous polishing body comprising a thermoset polyurethane material and a plurality of closed cell pores disposed in the thermoset polyurethane material, the plurality of closed cell pores having a multi-modal distribution of diameters, wherein the molded homogeneous polishing body further comprises a first, grooved surface and a second, flat surface opposite the first surface, and wherein curing the mixture comprises grading the multi-modal distribution of diameters throughout the thermoset polyurethane material with a gradient from the first, grooved surface to the second, flat surface, wherein the mixing further comprises adding a plurality of porogens to the pre-polymer and the curative to provide a first portion of the closed cell pores, each having a physical shell, and wherein the mixing further comprises injecting a gas into the pre-polymer and the curative, or into a product formed there from, to provide a second portion of the closed cell pores, each having no physical shell.

2. The method of claim 1 , wherein the pre-polymer is an isocyanate.

3. The method of claim 1 , wherein the multi-modal distribution of diameters is a bimodal distribution of diameters comprising a small diameter mode proximate to the first, grooved surface, and comprising a large diameter mode proximate to the second, flat surface.

4. The method of claim 1 , wherein mixing the pre-polymer and the curative comprises mixing an isocyanate and an aromatic diamine compound, respectively.

5. The method of claim 1 , wherein the mixing further comprises adding an opacifying lubricant to the pre-polymer and the curative to provide an opaque molded homogeneous polishing body.

6. The method of claim 1 , wherein curing the mixture comprises first partially curing in the formation mold and then further curing in an oven.

7. A method of fabricating a polishing pad for polishing a semiconductor substrate, the method comprising:

mixing a pre-polymer and a curative to form a mixture in a formation mold; and

curing the mixture to provide a molded homogeneous polishing body comprising a thermoset polyurethane material and a plurality of closed cell pores disposed in the thermoset polyurethane material, the plurality of closed cell pores having a multi-modal distribution of diameters, wherein the molded homogeneous polishing body further comprises a first, grooved surface and a second, flat surface opposite the first surface, and wherein curing the mixture comprises grading the multi-modal distribution of diameters throughout the thermoset polyurethane material with a gradient from the first, grooved surface to the second, flat surface, wherein the multi-modal distribution of diameters is a bimodal distribution of diameters comprising a small diameter mode proximate to the first, grooved surface, and comprising a large diameter mode proximate to the second, flat surface.

8. The method of claim 7 , wherein the mixing further comprises adding a plurality of porogens to the pre-polymer and the curative to provide the closed cell pores, each having a physical shell.

9. The method of claim 7 , wherein the mixing further comprises injecting a gas into the pre-polymer and the curative, or into a product formed there from, to provide the closed cell pores, each having no physical shell.

10. The method of claim 7 , wherein the pre-polymer is an isocyanate and the mixing further comprises adding water to the pre-polymer and the curative to provide the closed cell pores, each having no physical shell.

11. The method of claim 7 , wherein mixing the pre-polymer and the curative comprises mixing an isocyanate and an aromatic diamine compound, respectively.

12. The method of claim 7 , wherein the mixing further comprises adding an opacifying lubricant to the pre-polymer and the curative to provide an opaque molded homogeneous polishing body.

13. The method of claim 7 , wherein curing the mixture comprises first partially curing in the formation mold and then further curing in an oven.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; NEXPLANAR CORPORATION
Reel/Frame 047586/0400 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
INTELLECTUAL PROPERTY SECURITY JOINDER AGREEMENT Recorded Dec 31, 2015
From: NEXPLANAR CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037407/0071 →