IP Library Granted Patent US 10,946,495
Granted Patent B2
US 10,946,495 · App. 14/611,064 · Granted Mar 16, 2021

Low density polishing pad

Inventors: Ping Huang (Beaverton, OR); William C. Allison (Beaverton, OR); Richard Frentzel (Murrieta, CA); Paul Andre Lefevre (Portland, OR); Robert Kerprich (Portland, OR); Diane Scott (Portland, OR)
Assignee: CMC Materials, Inc.
B24B37/24B24B37/205B24B37/26C08J9/0061C08J9/228C08J2333/00C08J2375/04C08J2433/00C08J2475/04
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Quick Facts
Patent No.
US 10,946,495
App. No.
14/611,064
Granted
Mar 16, 2021
Kind
B2
Abstract

Low density polishing pads and methods of fabricating low density polishing pads are described. In an example, a polishing pad for polishing a substrate includes a polishing body having a density approximately in the range of 0.4-0.55 g/cc. The polishing body includes a thermoset polyurethane material and a plurality of closed cell pores dispersed in the thermoset polyurethane material. Each of the plurality of closed cell pores has a shell composed of an acrylic co-polymer.

Claims (21)

1. A polishing pad for polishing a substrate, the polishing pad comprising:

a polishing body having a density approximately in the range of 0.4-0.55 g/cc and comprising:

a thermoset polyurethane material; and

a plurality of closed cell pores dispersed in the thermoset polyurethane material, each of the plurality of closed cell pores having a shell comprising an acrylic co-polymer, wherein the plurality of closed cell pores has a multi-modal distribution of diameters, and wherein the plurality of closed cell pores provides a total pore volume in the thermoset polyurethane material approximately in the range of 50-60% of the total volume of the thermoset polyurethane material.

2. The polishing pad of claim 1 , wherein the polishing body has a density approximately in the range of 0.44-0.52 g/cc.

3. The polishing pad of claim 1 , wherein the polishing body is a homogeneous polishing body.

4. The polishing pad of claim 1 , wherein the polishing body further comprises:

a first, grooved surface; and

a second, flat, surface opposite the first surface.

5. The polishing pad of claim 1 , wherein each of the plurality of closed cell pores is essentially spherical.

6. The polishing pad of claim 1 , wherein the polishing body is a molded polishing body.

7. The polishing pad of claim 1 , wherein the polishing body further comprises:

an opacifying filler distributed approximately evenly throughout the polishing body.

8. The polishing pad of claim 1 , further comprising:

a support layer disposed on a back surface of the polishing body.

9. The polishing pad of claim 1 , further comprising:

a detection region disposed in a back surface of the polishing body.

10. The polishing pad of claim 1 , further comprising:

a sub pad disposed on a back surface of the polishing body.

11. The polishing pad of claim 1 , further comprising:

a local area transparency (LAT) region disposed in, and covalently bonded with, the polishing body.

Assignments (11)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; NEXPLANAR CORPORATION
Reel/Frame 047586/0400 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
INTELLECTUAL PROPERTY SECURITY JOINDER AGREEMENT Recorded Dec 31, 2015
From: NEXPLANAR CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037407/0071 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2015
From: HUANG, PING; ALLISON, WILLIAM C.; FRENTZEL, RICHARD; LEFEVRE, PAUL ANDRE; KERPRICH, ROBERT; SCOTT, DIANE
To: NEXPLANAR CORPORATION
Reel/Frame 036414/0665 →
Continuity (1)
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