IP Library Granted Patent US 9,931,728
Granted Patent B2
US 9,931,728 · App. 14/732,497 · Granted Apr 3, 2018

Polishing pad with foundation layer and polishing surface layer

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Quick Facts
Patent No.
US 9,931,728
App. No.
14/732,497
Granted
Apr 3, 2018
Kind
B2
Abstract

Polishing pads with foundation layers and polishing surface layers are described. In an example, a polishing pad for polishing a substrate includes a foundation layer. A polishing surface layer is bonded to the foundation layer. Methods of fabricating polishing pads with a polishing surface layer bonded to a foundation layer are also described.

Claims (39)

1. A method of fabricating a polishing pad for polishing a substrate, the method comprising:

roughening a surface of a foundation layer

providing, in a formation mold, the foundation layer and a mixture formed from mixing a set of polymerizable materials;

coupling a pattern of protrusions of the formation mold with the mixture; and, with the pattern of protrusions coupled with the mixture,

at least partially curing the mixture to form a molded homogeneous polishing surface layer directly on the foundation layer, the molded homogeneous polishing surface layer comprising a pattern of grooves corresponding to the pattern of protrusions of the formation mold, further comprising:

removing the foundation layer having the molded homogeneous polishing surface layer formed thereon from the base of the formation mold when the extent of curing is sufficient to maintain geometry of the molded homogeneous polishing surface layer but insufficient for the molded homogeneous polishing surface layer to withstand mechanical stress.

2. The method of claim 1 , wherein providing the foundation layer comprises placing the foundation layer in a base of the formation mold, wherein providing the mixture comprises providing the mixture in the base of the formation mold, on the foundation layer, wherein coupling the pattern of protrusions of the formation mold comprises coupling a lid of the formation mold with the mixture, the lid having disposed thereon the pattern of protrusions, and wherein at least partially curing the mixture comprises heating the base of the formation mold.

3. The method of claim 1 , wherein the foundation layer extends beyond the molded homogeneous polishing surface layer, and wherein removing the foundation layer having the molded homogeneous polishing surface layer formed thereon from the base of the formation mold comprises taking hold of the foundation layer but not the molded homogeneous polishing surface layer.

4. The method of claim 1 , wherein at least partially curing the mixture comprises heating both the mixture and the foundation layer.

5. The method of claim 1 , further comprising:

removing the molded homogeneous polishing surface layer from the foundation layer; and

forming a second homogeneous polishing surface layer on the foundation layer.

6. The method of claim 1 , wherein providing the foundation layer in the formation mold comprises first removing a previously formed polishing surface layer from the foundation layer.

7. The method of claim 1 , wherein forming the molded homogeneous polishing surface layer comprises forming a thermoset polyurethane material.

8. The method of claim 1 , wherein mixing the set of polymerizable materials further comprises adding a plurality of porogens to the set of polymerizable materials to form a plurality of closed cell pores in the molded homogeneous polishing surface layer, each closed cell pore having a physical shell.

9. The method of claim 1 , wherein mixing the set of polymerizable materials further comprises injecting a gas into the set of polymerizable materials, or into a product formed there from, to form a plurality of closed cell pores in the molded homogeneous polishing surface layer, each closed cell pore having no physical shell.

10. The method of claim 1 , wherein mixing the set of polymerizable materials comprises mixing an isocyanate and an aromatic diamine compound.

11. The method of claim 1 , wherein mixing the set of polymerizable materials further comprises adding an opacifying particle filler to the set of polymerizable materials to form an opaque molded homogeneous polishing surface layer.

12. The method of claim 1 , further comprising:

further curing the molded homogeneous polishing surface layer by heating the foundation layer having the molded homogeneous polishing surface layer formed thereon in an oven.

13. The method of claim 1 , wherein a polishing pad comprising the foundation layer having the molded homogeneous polishing surface layer formed thereon is suitable for performing a polishing process without performing a backside cut of the foundation layer.

14. The method of claim 1 , wherein at least partially curing the mixture forms the molded homogeneous polishing surface layer covalently bonded with the foundation layer.

15. A method of fabricating a polishing pad for polishing a substrate, the method comprising:

roughening a surface of a foundation layer

providing, in a formation mold, the foundation layer and a mixture formed from mixing a set of polymerizable materials;

coupling a pattern of protrusions of the formation mold with the mixture; and, with the pattern of protrusions coupled with the mixture,

at least partially curing the mixture to form a molded homogeneous polishing surface layer attached to the foundation layer, the molded homogeneous polishing surface layer comprising a pattern of grooves corresponding to the pattern of protrusions of the formation mold; and

removing the foundation layer having the molded homogeneous polishing surface layer attached thereto from the base of the formation mold when the extent of curing is sufficient to maintain geometry of the molded homogeneous polishing surface layer but insufficient for the molded homogeneous polishing surface layer to withstand mechanical stress.

16. The method of claim 15 , wherein the foundation layer having the molded homogeneous polishing surface layer attached thereto is removed from the base of the formation mold less than approximately 4 minutes after coupling the pattern of protrusions of the formation mold with the mixture.

17. The method of claim 15 , wherein removing the foundation layer having the molded homogeneous polishing surface layer attached thereto from the formation mold is performed immediately after the material of the molded homogeneous polishing surface layer gels.

18. The method of claim 15 , wherein the foundation layer extends beyond the molded homogeneous polishing surface layer, and wherein removing the foundation layer having the molded homogeneous polishing surface layer attached thereto from the base of the formation mold comprises taking hold of the foundation layer but not the molded homogeneous polishing surface layer.

19. The method of claim 15 , wherein at least partially curing the mixture comprises heating both the mixture and the foundation layer.

20. The method of claim 15 , further comprising:

removing the molded homogeneous polishing surface layer from the foundation layer; and

forming a second homogeneous polishing surface layer attached to the foundation layer.

21. The method of claim 15 , wherein providing the foundation layer in the formation mold comprises first removing a previously formed polishing surface layer from the foundation layer.

22. The method of claim 15 , further comprising:

further curing the molded homogeneous polishing surface layer by heating the foundation layer having the molded homogeneous polishing surface layer attached thereto in an oven.

23. The method of claim 15 , wherein a polishing pad comprising the foundation layer having the molded homogeneous polishing surface layer attached thereto is suitable for performing a polishing process without performing a backside cut of the foundation layer.

Assignments (11)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; NEXPLANAR CORPORATION
Reel/Frame 047586/0400 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2018
From: ALLISON, WILLIAM C.; SCOTT, DIANE; LEFEVRE, PAUL ANDRE; LACASSE, JAMES P.; SIMPSON, ALEXANDER WILLIAM
To: NEXPLANAR CORPORATION
Reel/Frame 044813/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
INTELLECTUAL PROPERTY SECURITY JOINDER AGREEMENT Recorded Dec 31, 2015
From: NEXPLANAR CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037407/0071 →