Stacked electronic devices
Disclosed is a stacked electronic device including a first and second bonded structure. The first bonded structure includes a first and second semiconductor element, each having a semiconductor region, a front side on one side of the semiconductor region including active circuitry, and a back side opposite the front side. The front side of the first semiconductor element is bonded and electrically connected to the front side of the second semiconductor element. The second bonded structure includes a third and fourth semiconductor element, which can include similar components to the first and second semiconductor elements. The front side of the third semiconductor element is bonded and electrically connected to the front side of the fourth semiconductor element. The back side of the second semiconductor element is bonded and electrically connected to the back side of the third semiconductor element.
1 . A stacked electronic device comprising:
a first bonded structure comprising:
a first semiconductor element having a first front side including active circuitry and a first back side opposite the first front side; and
a second semiconductor element having a second front side including active circuitry and a second back side opposite the second front side, the first front side bonded and electrically connected to the second front side; and
a second bonded structure comprising:
a third semiconductor element having a third front side including active circuitry and a third back side opposite the third front side; and
a fourth semiconductor element having a fourth front side including active circuitry and a fourth back side opposite the fourth front side, the third front side bonded and electrically connected to the fourth front side,
wherein the second back side of the second semiconductor element is bonded and electrically connected to the third back side of the third semiconductor element, and
wherein a side edge of the first bonded structure extending from the first back side to the second back side has a lateral misalignment relative to a side edge of the second bonded structure extending from the third back side to the fourth back side.
2 . The stacked electronic device of claim 1 , wherein the first front side is directly bonded to the second front side without an intervening adhesive, and wherein the second back side of the second semiconductor element is directly bonded to the third back side of the third semiconductor element without an intervening adhesive.
3 . The stacked electronic device of claim 2 , wherein a first plurality of contact pads on the first front side are directly bonded to a second plurality of contact pads on the second front side without an intervening adhesive; wherein the first plurality of contact pads are at least partially embedded in a first nonconductive field region; wherein the second plurality of contact pads are at least partially embedded in a second nonconductive field region; and wherein the first and second nonconductive field regions are directly bonded without an intervening adhesive.
4 . The stacked electronic device of claim 3 , wherein a first plurality of conductive features on the second back side are directly bonded to a second plurality of conductive features on the third back side without an intervening adhesive; wherein the first plurality of conductive features comprises a first plurality of through-substrate vias (TSVs) extending to the second back side and the second plurality of conductive features comprises a second plurality of through-substrate vias (TSVs) extending to the third back side; and wherein the second back side includes a first backside nonconductive field region and the third back side includes a second backside nonconductive field region, the first and second backside nonconductive field regions directly bonded to one another without an intervening adhesive.
5 . The stacked electronic device of claim 1 , wherein the first semiconductor element includes a first side edge between the first front side and the first back side, and the second semiconductor element includes a second side edge between the second front side and the second back side, wherein the first and second side edges are flush with one another to define the side edge of the first bonded structure.
6 . The stacked electronic device of claim 5 , wherein the third semiconductor element includes a third side edge between the third front side and the third back side, and the fourth semiconductor element includes a fourth side edge between the fourth front side and the fourth back side, wherein the third and fourth side edges are flush with one another to define the side edge of the second bonded structure, wherein the side edge of the first bonded structure includes first markings indicative of a first singulation process, and wherein the side edge of the second bonded structure includes second markings indicative of a second singulation process different from the first singulation process.
7 . The stacked electronic device of claim 6 , wherein the first bonded structure is bonded to the second bonded structure along a bond interface, and wherein a neutral axis of the stacked electronic structure is vertically offset from the bond interface by no more than 10% of a thickness of the stacked first and second bonded structures.
8 . The stacked electronic device of claim 7 , wherein the first bonded structure comprises a mirrored pair of memory dies.
9 . The stacked electronic device of claim 1 , wherein a thickness of the first bonded structure is no more than 100 microns.
10 . The stacked electronic device of claim 1 , further comprising a third bonded structure including fifth and sixth bonded semiconductor elements, the third bonded structure bonded and electrically connected to the second bonded structure.
11 . The stacked electronic device of claim 10 , further comprising a fourth bonded structure including seventh and eighth bonded semiconductor elements, the fourth bonded structure bonded and electrically connected to the third bonded structure.
12 . A stacked electronic structure comprising:
a first bonded structure including a first semiconductor die bonded to a second semiconductor die, each of the first and second semiconductor dies including a front side with active circuitry, a back side opposite the front side, and a side edge between the front and back sides, the respective side edges of the first and second semiconductor dies being flush with one another to define a first side edge of the first bonded structure; and
a second bonded structure stacked on and electrically connected to the first bonded structure at a bond location, forming a conductive path across the bond location between the first and second bonded structure, the second bonded structure including a third semiconductor die bonded to a fourth semiconductor die, each of the third and fourth semiconductor dies including a front side with active circuitry, a back side opposite the front side, and a side edge between the front and back sides, the respective side edges of the third and fourth semiconductor dies being flush with one another to define a second side edge of the second bonded structure,
wherein the first side edge of the first bonded structure has a lateral misalignment relative to the second side edge of the second bonded structure.
13 . The stacked electronic device of claim 12 , wherein the back side of the first semiconductor die is direct hybrid bonded to the back side of the second semiconductor die without an intervening adhesive.
14 . The stacked electronic device of claim 13 , wherein the front side of the second semiconductor die is direct hybrid bonded to the front side of the third semiconductor die.
15 . The stacked electronic device of claim 12 , wherein the front side of the first semiconductor die is direct hybrid bonded to the front side of the second semiconductor die without an intervening adhesive.
16 . The stacked electronic device of claim 15 , wherein the back side of the second semiconductor die is direct hybrid bonded to the back side of the third semiconductor die.
17 . The stacked electronic device of claim 12 , wherein the back side of the first semiconductor die is direct hybrid bonded to the front side of the second semiconductor die without an intervening adhesive.
18 . The stacked electronic device of claim 17 , wherein the back side of the second semiconductor die is direct hybrid bonded to the front side of the third semiconductor die.
19 . The stacked electronic device of claim 12 , wherein the second bonded structure is stacked on and solder bonded to the first bonded structure.
20 . The stacked electronic device of claim 12 , wherein the second bonded structure is stacked on and hybrid bonded to the first bonded structure.
21 . A stacked electronic structure comprising:
a first bonded structure including a first semiconductor die bonded to a second semiconductor die, each of the first and second semiconductor dies including a front side having active circuitry and a plurality of contact pads, a back side opposite the front side, and a plurality of through-substrate vias (TSVs) disposed between the plurality of contact pads and the back side; and
a second bonded structure stacked on and electrically connected to the first bonded structure along a bond interface, the second bonded structure including a third semiconductor die bonded to a fourth semiconductor die, each of the third and fourth semiconductor dies including a front side having active circuitry and a plurality of contact pads, a back side opposite the front side, and a plurality of through-substrate vias (TSVs) disposed between the plurality of contact pads and the back side,
wherein a neutral axis of the stacked electronic structure is vertically offset from the bond interface by no more than 15% of a thickness of the stacked first and second bonded structures.
22 . The stacked electronic device of claim 21 , wherein the back side of the first semiconductor die is direct hybrid bonded to the back side of the second semiconductor die without an intervening adhesive.