IP Library Granted Patent US 8,383,003
Granted Patent B2
US 8,383,003 · App. 12/456,546 · Granted Feb 26, 2013

Polishing systems

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Quick Facts
Patent No.
US 8,383,003
App. No.
12/456,546
Granted
Feb 26, 2013
Kind
B2
Abstract

Described herein are polishing apparatus, polishing formulations, and polymeric substrates for use in polishing surfaces, and related methods. The apparatus, formulations, substrates, and methods may each be used in applications involving the polishing of metal and/or metal-containing surfaces such as semiconductor wafers. The apparatus, formulations, polymeric substrates, and related methods described herein may be used without abrasives, and in some instances, without mechanical friction of a pad surface against the surface to be polished. Therefore, defects on a polished surface due to such mechanical polishing processes may be reduced.

Claims (27)

1. A method for polishing a metallized surface of a polish substrate, the method comprising:

contacting the metallized surface with a latent boundary layer released from a porous polymeric surface of a polymeric substrate below the polish substrate when a downward force is applied to the porous polymeric substrate;

forming metal cations from metal or metal-containing species on the metallized surface;

solvating the metal cations with an external aqueous phase of a polishing formulation; and

extracting solvated metal cations from the external aqueous phase with an organic phase of the polishing formulation,

wherein at least one of the external aqueous phase and the organic phase is capable of permeating the porous polymeric surface of the polymeric substrate.

2. The method of claim 1 , comprising extracting solvated metal cations from the external aqueous phase at least partially within a body of the polymeric substrate below the porous polymeric surface.

3. The method of claim 1 , comprising permeating the organic phase through the porous polymeric surface to contact the external aqueous phase.

4. The method of claim 1 , comprising permeating the external aqueous phase comprising solvated metal cations through the porous polymeric surface to contact the organic phase.

5. The method of claim 1 , further comprising agitating at least one of the external aqueous phase and the organic phase relative to the polish substrate.

6. The method of claim 1 , further comprising moving at least one of the polymeric substrate and the polish substrate relative to the other of the polymeric substrate and the polish substrate.

7. The method of claim 1 , adapted for removing copper or copper-containing species from the metallized surface.

8. The method of claim 1 , adapted for removing tantalum or tantalum-containing species from the metallized surface.

9. The method of claim 1 , adapting for selectively removing one or more metals and/or metal-containing species from a metallized surface comprising a multiple metals or metal-containing species.

10. The method of claim 1 , comprising electrochemically forming the metal cations.

11. A method for polishing a metallized surface of a substrate, the method comprising:

positioning the substrate at a height so that the metallized surface is above and opposes a polymeric surface of a polymeric substrate;

forming metal cations from metal or metal-containing species on the metallized surface;

providing an aqueous solution to form a latent boundary layer released from the polymeric surface when a downward force is applied to the polymeric substrate;

controlling contact of the latent boundary layer and the metallized surface by adjusting the height of the substrate above the polymeric surface of the polymeric substrate; and

transporting solvated metal cations across a first interface to extract the metal cations from the aqueous solution with an organic phase.

12. The method of claim 11 , wherein the polymeric surface of the polymeric substrate is porous, and at least one of the aqueous solution and the organic phase is capable of permeating the porous polymeric surface.

13. The method of claim 11 , adapted for removing copper or copper-containing species from the metallized surface.

14. The method of claim 11 , adapted for removing tantalum or tantalum-containing species from the metallized surface.

15. The method of claim 11 , comprising electrochemically forming the metal cations.

16. The method of claim 11 , comprising complexing the solvated metal cations with a complexing agent to transport the solvated metal cations across the first interface to enter the organic phase as a metal-containing complex.

17. The method of claim 16 , further comprising transporting the metal-containing complex across a second interface to enter an aqueous phase internal to the organic phase.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION; NEXPLANAR CORPORATION
Reel/Frame 047586/0400 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2017
From: NEXPLANAR CORPORATION
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043046/0377 →
INTELLECTUAL PROPERTY SECURITY JOINDER AGREEMENT Recorded Dec 31, 2015
From: NEXPLANAR CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 037407/0071 →