Patent Assignment
Reel/Frame 024973/0153
Release of Security Interest
Recorded: 2010-09-13
Received: 2010-09-13
Pages: 26
Assignor
JPMORGAN CHASE BANK, N.A.
Executed: 2010-08-30
Assignee
LEAR CORPORATION
21557 TELEGRAPH ROAD, SOUTHFIELD, MI, 48033, UNITED STATES
Covered Properties
(32)
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
12/636,408 →
Semiconductor Device Comprising Capacitor and Method of Fabricating the Same
Application:
12/368,627 →
Semiconductor Device Comprising Capacitor and Method of Fabricating the Same
Application:
12/368,606 →
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
12/237,693 →
Semiconductor Device and Semiconductor Signal Processing Apparatus
Application:
12/213,131 →
Semiconductor Device Comprising Capacitor and Method of Fabricating the Same
Application:
12/153,763 →
Nonvolatile Memory Device with Write Error Suppressed in Reading Data
Application:
11/582,983 →
Semiconductor Device and Manufacturing Method Thereof for Reducing the Area of the Memory Cell Region
Application:
11/541,656 →
Semiconductor Device Comprising Capacitor and Method of Fabricating the Same
Application:
11/336,969 →
Semiconductor Device Comprising a Highly-Reliable, Constant Capacitance Capacitor
Application:
11/336,966 →
Semiconductor Device
Application:
11/206,016 →
Semiconductor Device and Semiconductor Signal Processing Apparatus
Application:
11/148,369 →
Oxygen Emergency Supply Means
Application:
11/141,119 →
Semiconductor Device
Application:
10/892,271 →
Semiconductor Memory Device with Row Selection Control Circuit
Application:
10/842,465 →
Semiconductor Device Comprising Capacitor and Method of Fabricating the Same
Application:
10/793,840 →
Semiconductor Device
Application:
10/692,811 →
Semiconductor Device with Dummy Patterns
Application:
10/419,770 →
Memory System Allowing Fast Operation of Processor While Using Flash Memory Incapable of Random Access
Application:
10/372,099 →
Method of Controlling the Operation of Non-Volatile Semiconductor Memory Chips
Application:
10/364,417 →
Semiconductor Device
Application:
10/347,804 →
Semiconductor Memory Device
Application:
10/326,141 →
Semiconductor Memory Device
Application:
10/322,626 →
Clock Synchronous Semiconductor Memory Device
Application:
10/140,937 →
Semiconductor Device and Manufacturing Method Thereof
Application:
10/114,264 →
Methods and Systems for Performing Thoracoscopic Cardiac Bypass and Other Procedures
Application:
09/945,867 →
Case for Encapsulating Mirror Element
Application:
09/931,990 →
Memory Device Redundant Repair Analysis Method, Recording Medium and Apparatus
Application:
09/912,534 →
Microprocessor Internally Provided with Test Circuit
Application:
09/785,466 →
Semiconductor Memory Device with Simple Refresh Control
Application:
09/777,694 →
Semiconductor Device Capable of Adjusting Timing of Input Waveform by Tester with High Accuracy
Application:
09/774,700 →
Semiconductor device comprising a highly-reliable, constant capacitance capacitor
Application:
09/756,864 →