IP Library Assignment 025173/0090
Patent Assignment
Reel/Frame 025173/0090

Change of Name

Recorded: 2010-10-21 Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties (92)
Non-Volatile Memory Device Which Supplies Erasable Voltage to a Flash Memoey Cell
Patent: 5,787,037 →
Application: 08/853,675 →
Differential Amplifier
Patent: 5,847,598 →
Application: 08/854,447 →
Semiconductor Memory Device Having a Small Memory Cell Driving Circuit
Patent: 6,125,074 →
Application: 08/855,889 →
Voltage Booster Circuit
Patent: 5,969,565 →
Application: 08/858,467 →
Pulse Generating Circuit Having Address Transition Detecting Circuit
Patent: 6,037,815 →
Application: 08/859,102 →
Bi-Phase Code Decoding System
Patent: 5,953,063 →
Application: 08/859,175 →
Process for Forming a Capacitor Incorporated in a Semiconductor Device
Patent: 6,146,966 →
Application: 08/859,210 →
Color Linear Image Sensor and Driving Method Therefor
Patent: 5,969,830 →
Application: 08/861,221 →
Fault Simulator of Creating a Signal Pattern for Use in a Fault Inspection of a Semiconductor Integrated Circuit
Patent: 5,903,580 →
Application: 08/861,731 →
Non-Volatile Semiconductor Storage with Memory Requirement and Availability Comparison Means and Method
Patent: 6,189,081 →
Application: 08/862,373 →
Method for Capturing Gaseous Impurities and Semiconductor Device Manufacturing Apparatus
Patent: 5,863,602 →
Application: 08/862,398 →
Programming Which Can Make Threshold Voltages of Programmed Memory Cells Have a Narrow Distribution in a Nonvolatile Semiconductor Memory
Patent: 5,757,699 →
Application: 08/862,965 →
Data Latching Circuit for Read-Out Operations of Data from Memory Device
Patent: 5,841,719 →
Application: 08/863,536 →
Fluorine Doping Concentrations in a Multi-Structure Semiconductor Device
Patent: 6,157,083 →
Application: 08/864,388 →
Tristate Buffer Having a Bipolar Transistor
Patent: 6,037,802 →
Application: 08/864,853 →
Method for Forming Doped Polysilicon Films
Patent: 5,783,257 →
Application: 08/864,907 →
Speech Recognition System
Patent: 5,909,665 →
Application: 08/864,914 →
Electro-Absorption Type Semiconductor Optical Modulator Having a Quantum Well Structure
Patent: 6,100,543 →
Application: 08/865,808 →
On Line-Character Recognition Method and Device
Patent: 6,175,651 →
Application: 08/865,856 →
Process of Fabricating Wiring Structure Having Metal Plug Twice Polished Under Different Conditions
Patent: 5,786,275 →
Application: 08/865,889 →
Microprocessor Capable of Carrying Out Different Data Length Instructions
Patent: 5,935,237 →
Application: 08/866,125 →
Differential Signal Generating Circuit Having Current Spike Suppressing Circuit
Patent: 5,986,463 →
Application: 08/866,261 →
Semiconductor Storage Device
Patent: 5,781,489 →
Application: 08/866,270 →
Semiconductor Memory Device and Method of Fabricating the Same
Patent: 6,396,098 →
Application: 08/866,272 →
Publication: US 2001/0046158
Ion Implantation Method Using Tilted Ion Beam
Patent: 5,827,774 →
Application: 08/867,146 →
Online Character Recognition System with Improved Standard Strokes Processing Efficiency
Patent: 6,035,063 →
Application: 08/868,071 →
Process of Growing Multiple Quantum Well Structure for Adjusting Photoluminescene Peak Wavelengths to Target Value
Patent: 5,888,840 →
Application: 08/869,443 →
Thin Film Formation Method for Ferroelectric Materials
Patent: 5,976,946 →
Application: 08/869,444 →
Apparatus and Method for Depositing a Film on a Substrate by Chemical Vapor Deposition
Patent: 6,077,355 →
Application: 08/869,887 →
Method for Manufacturing Bump Leaded Film Carrier Type Semiconductor Device
Patent: 5,905,303 →
Application: 08/873,593 →
Semiconductor Device Having a Barrier Film Formed to Prevent the Entry of Moisture and Method of Manufacturing the Same
Patent: 6,011,308 →
Application: 08/874,359 →
Moving Picture Decoding System
Patent: 5,754,234 →
Application: 08/874,575 →
Semiconductor Substrate, Process for Production Thereof, and Semiconductor Device
Patent: 5,858,855 →
Application: 08/874,737 →
Equivalent Inductance Circuit Having a Common Input/Output Terminal
Patent: 5,955,900 →
Application: 08/877,646 →
Semiconductor Device Incorporating a Stepped Contct Hole
Patent: 5,952,724 →
Application: 08/878,947 →
Synchronous Semiconductor Memory Circuit
Patent: 5,896,341 →
Application: 08/879,215 →
Merthod of Manufacturing Bilmos
Patent: 5,904,519 →
Application: 08/879,320 →
Semiconductor Memory Device Synchronous with External Clock Signal for Ouputting Data Bits Through a Small Number of Data Lines
Patent: 35,934 →
Application: 08/879,516 →
Ghost Removal Apparatus
Patent: 5,973,752 →
Application: 08/879,772 →
Reference Voltage Generating Circuit Capable of Suppressing Spurious Voltage
Patent: 5,831,473 →
Application: 08/880,992 →
Semiconductor Storage Device
Patent: 5,808,950 →
Application: 08/881,303 →
Data Processing Method and Apparatus
Patent: 6,275,923 →
Application: 08/883,228 →
Direct Memory Access (Dma) via Separate Bus Utilizing a Buffer for Connecting the Bus to the Memory During Dma Mode and Disconnecting It Otherwise
Patent: 5,958,025 →
Application: 08/883,312 →
Semiconductor Device Having a Thin Film Capacitor and a Resistance Measuring Element
Patent: 5,847,423 →
Application: 08/883,334 →
Voltage to Current Conversion Circuit for Converting Voltage to Multiple Current Outputs
Patent: 5,867,035 →
Application: 08/886,249 →
Non-Volatile Semiconductor Memory Device with Variable Source Voltage
Patent: 5,892,715 →
Application: 08/888,924 →
Semiconductor Device with Connected Source Electrode Pads at Diagonal Corners
Patent: 5,856,687 →
Application: 08/889,052 →
Method for Fabricating a Semiconductor Device with Multi-Level Structured Insulator
Patent: 5,972,800 →
Application: 08/890,312 →
Production Method for a Misfet, Complememtnary Misfet
Patent: 5,970,351 →
Application: 08/890,826 →
Single-Chip Synchronous Dynamic Random Access Memory (Dram) System Including First Address Generator Operable in First and Second Modes
Patent: 5,852,586 →
Application: 08/891,193 →
Buried-Channel Mos Transistor and Process of Producing Same
Patent: 5,933,737 →
Application: 08/895,260 →
Semiconductor Device Having Multilayered Wiring Structure
Patent: 5,798,569 →
Application: 08/895,823 →
Circuit Built-in Light-Receiving Element
Patent: 6,049,118 →
Application: 08/896,195 →
Process for Production of Semiconductor Device with Foreign Element Introduced into Silicon Dioxide Film
Patent: 6,057,217 →
Application: 08/896,906 →
Semiconductor Device Capable of Avoiding Damage by Esd
Patent: 5,869,871 →
Application: 08/896,952 →
Semiconductor Memory Device Controlled in Synchronous with External Clock
Patent: 6,021,077 →
Application: 08/897,545 →
Sense Amplifier Circuit Having High Speed Operation
Patent: 5,999,470 →
Application: 08/898,113 →
Microprocessor Equipped with an a/D Converter
Patent: 6,046,692 →
Application: 08/898,959 →
Non-Volatile Semiconductor Storage Apparatus and Production Thereof
Patent: 5,891,773 →
Application: 08/898,960 →
Semiconductor Device
Patent: 5,821,154 →
Application: 08/899,060 →
Apparatus for and Method of Processing Data
Patent: 6,084,441 →
Application: 08/900,279 →
Semiconductor Testing Device with Redundant Circuits
Patent: 5,994,914 →
Application: 08/900,339 →
Method of Layout of Semiconductor Integrated Circuits
Patent: 6,026,225 →
Application: 08/900,666 →
Semiconductor Device
Patent: 6,064,089 →
Application: 08/900,823 →
Ccd Image Sensor with Overflow Barrier for Discharging Excess Electrons at High Speed
Patent: 5,902,995 →
Application: 08/901,458 →
Photodetector Having Means for Processing Optical Input Signals
Patent: 5,942,749 →
Application: 08/901,629 →
High Speed Low-Power Consumption Semiconductor Non-Volatile Memory Device
Patent: 5,801,992 →
Application: 08/901,811 →
Plasma Treatment System
Patent: 5,988,104 →
Application: 08/902,037 →
Small Size Semiconductor Package
Patent: 6,043,111 →
Application: 08/903,340 →
Input Circuit
Patent: 6,043,678 →
Application: 08/905,497 →
Estimation of Failure Section Region with Small Simulation Calculation Quantity
Patent: 5,968,195 →
Application: 08/905,641 →
Single-Chip Memory System Including Buffer
Patent: 6,085,297 →
Application: 08/905,730 →
Current Sensing Circuit Formed in Narrow Area and Having Sensing Electrode on Major Surface of Semiconductor Substrate
Patent: 5,828,308 →
Application: 08/906,503 →
Audio Signal Processing Circuit
Patent: 6,253,303 →
Application: 08/907,869 →
Semiconductor Integrated Circuit Memory
Patent: 6,023,442 →
Application: 08/907,947 →
Electrically Writable Nonvolatile Semiconductor Memory Device
Patent: 5,867,427 →
Application: 08/908,673 →
Pickup Apparatus and Method for Laser Beams Having Different Wavelengths
Patent: 5,956,312 →
Application: 08/910,005 →
Method for Reading Cd-Rom
Patent: 5,974,006 →
Application: 08/910,011 →
Processor and Its Operation Processing Method for Processing Operation Having Bit Width Exceeding Data Width of Bit Storage Unit
Patent: 5,854,919 →
Application: 08/910,027 →
High Voltage Generating Circuit Able to Generate Positive High Voltage and Negative High Voltage at the Same Time
Patent: 5,831,844 →
Application: 08/910,171 →
Method of Fabricating Electrostatic Discharge Device
Patent: 5,985,722 →
Application: 08/910,247 →
Charged-Beam Exposure Mask and Charged-Beam Exposure Method
Patent: 5,968,686 →
Application: 08/910,424 →
An Integrated Circuit
Patent: 6,115,783 →
Application: 08/911,935 →
Large Scale Integrated Circuit Having Functional Blocks Controlled with Clock Signals That Conduct Setting Operations at Different Times
Patent: 5,963,075 →
Application: 08/914,091 →
Atm Switch Capable of Detecting Addressing Errors
Patent: 6,034,959 →
Application: 08/914,800 →
Frequency Divider Testing Circuit Using Clock-Sampling Window Variable with Divider Output
Patent: 6,008,655 →
Application: 08/915,115 →
Matrix Liquid Crystal Display
Patent: 5,973,660 →
Application: 08/915,143 →
Semiconductor Device Mounting Structure
Patent: 6,016,013 →
Application: 08/915,272 →
Method for Collecting a Metallic Contaminants from a Wafer
Patent: 5,994,142 →
Application: 08/915,273 →
Solid-State Image Pickup Device Capable of Reducing Fixed Pattern Noise and Preventing Smear
Patent: 5,912,482 →
Application: 08/915,275 →
Semiconductor Memory Circuit
Patent: 36,203 →
Application: 08/916,280 →
Mask Pattern Forming Method Capable of Correcting Errors by Proximity Effect and Developing Process
Patent: 5,871,874 →
Application: 08/917,756 →
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest May 9, 1997
From: AMANAI, MASAKAZU
To: NEC CORPORATION
Reel/Frame 008550/0790 →
Assignment of Assignor's Interest May 12, 1997
From: MURAKAMI, NOBUO; HASHIMOTO, KIYOKAZU
To: NEC CORPORATION
Reel/Frame 008554/0086 →
Assignment of Assignor's Interest May 12, 1997
From: SONE, KAZUYA
To: NEC CORPORATION
Reel/Frame 008554/0703 →
(Assignment of Assignor's Interest) Re-Record to Correct the Recordation Date of 5-12-97 to 5-14-97 Previously at Reel 8554, Frame 0703. May 14, 1997
From: SONE, KAZUYA
To: NEC CORPORATION
Reel/Frame 008740/0449 →
Assignment of Assignor's Interest May 19, 1997
From: NAGANAWA, KOJI
To: NEC CORPORATION
Reel/Frame 008571/0913 →
Assignment of Assignor's Interest May 20, 1997
From: TOGAMI, TETSUJI
To: NEC CORPORATION
Reel/Frame 008572/0284 →
Assignment of Assignor's Interest May 20, 1997
From: HIDAKA, KENJI
To: NEC CORPORATION
Reel/Frame 008570/0820 →
Assignment of Assignor's Interest May 21, 1997
From: KIMURA, TETSUJI
To: NEC CORPORATION
Reel/Frame 008583/0221 →
Assignment of Assignor's Interest May 22, 1997
From: HONMURA, HIROSHI
To: NEC CORPORATION
Reel/Frame 008633/0268 →
Assignment of Assignor's Interest May 23, 1997
From: WATANABE,HIROHITO; HIROTA, TOSHIYUKI; OGAWA, TAKASHI
To: NEC CORPORATION
Reel/Frame 008582/0705 →
Assignment of Assignor's Interest May 28, 1997
From: USAMI, TATSUYA; ISHIKAWA, HIRAKU
To: NEC CORPORATION
Reel/Frame 008634/0026 →
Assignment of Assignor's Interest May 29, 1997
From: WATARAI, SEIICHI
To: NEC CORPORATION
Reel/Frame 008589/0798 →
Assignment of Assignor's Interest May 29, 1997
From: KATO, YASUKO
To: NEC CORPORATION
Reel/Frame 008586/0947 →
Assignment of Assignor's Interest May 30, 1997
From: ISHIGE, KIYOKAZU
To: NEC CORPORATION
Reel/Frame 008600/0099 →
Assignment of Assignor's Interest May 30, 1997
From: IKEBATA, YOSHIKAZU; YOSHIDA, KAZUNAGA; NAKASHIMA, YUTAKA
To: NEC CORPORATION
Reel/Frame 008601/0802 →
Assignment of Assignor's Interest May 30, 1997
From: OKAMOTO, TOSHIHARU
To: NEC CORPORATION
Reel/Frame 008602/0484 →
Assignment of Assignor's Interest May 30, 1997
From: SAKATA, YASUTAKA
To: NEC CORPORATION
Reel/Frame 008582/0166 →
Assignment of Assignor's Interest May 30, 1997
From: KUBO, AKIRA
To: NEC CORPORATION
Reel/Frame 008585/0031 →
Assignment of Assignor's Interest May 30, 1997
From: TAKIGUCHI, TOMIO
To: NEC CORPORATION
Reel/Frame 008601/0735 →
Assignment of Assignor's Interest Jun 2, 1997
From: KITAJIMA, HIROSHI
To: NEC CORPORATION
Reel/Frame 008617/0860 →
Assignment of Assignor's Interest Jun 3, 1997
From: TAKESHIMA, TOSHIO; SUGAWARA, HIROSHI
To: NEC CORPORATION
Reel/Frame 008611/0379 →
Assignment of Assignor's Interest Oct 23, 1997
From: HIROTA, TOSHIYUKI; WATANABE, HIROHITO; AISO, FUMIKI; FUJIWARA, SHUJI
To: NEC CORPORATION
Reel/Frame 008769/0879 →
Assignment of Assignor's Interest Oct 27, 1997
From: FUJIO, RYOSUKE
To: NEC CORPORATION
Reel/Frame 008771/0119 →
Assignment of Assignor's Interest Oct 31, 1997
From: CHIBA, MASAKAZU; OHUCHI, MITSUROU
To: NEC CORPORATION
Reel/Frame 008786/0682 →
Assignment of Assignor's Interest Dec 1, 1997
From: HIRATA, MASAYOSHI
To: NEC CORPORATION
Reel/Frame 008824/0202 →