IP Library Granted Patent US 12,477,754
Granted Patent B2
US 12,477,754 · App. 17/636,113 · Granted Nov 18, 2025

Thin-film components for integrated circuits

Inventor: Richard Price (Sedgefield, GB)
Assignee: PRAGMATIC SEMICONDUCTOR LIMITED
H10D1/474H01C1/01H01C1/14H01C7/006H01C17/003H01C17/075H01C17/28H01L21/02565H10D1/47H10D8/60H10D30/6755H10D30/6757H10D62/80H10D84/02H10D84/204H10D84/811H10D86/0221H10D86/423H10D86/481H10D86/60H10D86/80H10D99/00
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Quick Facts
Patent No.
US 12,477,754
App. No.
17/636,113
Granted
Nov 18, 2025
Kind
B2
Abstract

A thin-film electronic component includes a first terminal, a second terminal, and a first current path between the first terminal and the second terminal, wherein the first current path is formed from a first segment of a first material and a first segment of a second material arranged in series between the first terminal and the second terminal.

Claims (37)

1 . A thin-film electronic component including a first terminal, a second terminal, and a first current path between the first terminal and the second terminal, wherein the first current path is formed from a first segment of a layer of a first material and a first segment of a layer of a second material arranged in series between the first terminal and the second terminal,

wherein thickness of the layer of the first material has a thickness and the layer of the second material has a thickness, and

wherein the thin-film electronic component is a thin film transistor, TFT, and the first terminal is a source terminal of the TFT and the second terminal is a drain terminal of the TFT, and the first segments of the layers of the first and second materials form the channel of the TFT, and wherein the first material is a resistive material and the second material is a semiconducting material.

2 . The thin-film electronic component of claim 1 , wherein the first segment of the layer of the second material includes a first part and a second part, the first part extending from one of the source terminal and the drain terminal to meet the first segment of the layer of the first material, and the second part extending from the source terminal to the drain terminal.

3 . The thin-film electronic component of claim 1 , wherein the resistivity of the first material is less than the resistivity of the second material when the TFT is in an on-state.

4 . The thin-film electronic component of claim 1 , wherein the first segment of the layer of the first material adjoins one of the source terminal and the drain terminal.

5 . The thin-film electronic component of claim 1 , wherein the first segment of the layer of the second material includes a third part, and the first segment of the layer of the first material is arranged in series between the first and third parts of the layer of the second material in the first current path.

6 . The thin-film electronic component of claim 1 , wherein the TFT includes a second current path between the source terminal and the drain terminal that is in parallel to the first current path, the second current path being formed from a second segment of the layer of the first material and a second segment of the layer of the second material arranged in series between the first terminal and the second terminal.

7 . The thin-film electronic component of claim 6 , wherein the first segments of the layers of the first and second materials of the first current path are arranged in an opposite order to the second segments of the layers of the first and second materials of the second current path.

8 . The thin-film electronic component of claim 1 , wherein the layer of the first material and the layer of the second material are formed from a same source material.

9 . A thin-film integrated circuit including the thin-film electronic component of claim 1 .

10 . The thin-film electronic component of claim 1 , wherein the thickness of the layer of the first material is different than the thickness of the layer of the second material.

11 . The thin-film electronic component of claim 1 , wherein the thickness of the layer of the first material is equal to the thickness of the layer of the second material.

12 . A method for fabricating a thin-film electronic component, the thin-film electronic component including a first terminal, a second terminal, and a first current path between the first terminal and the second terminal, wherein the first current path is formed from a first segment of a layer of a first material and a first segment of a layer of a second material arranged in series between the first terminal and the second terminal, and the method comprising:

depositing the layer of the first material;

patterning the layer of first material to form the first segment of the first material;

depositing the layer of the second material;

patterning the layer of the second material to form the first segment of the second material;

depositing a layer of conductive material; and

patterning the layer of conductive material to form the first and second terminals between which the first segments of the layers of the first and second materials form the first current path,

wherein the layer of the first material has a thickness and the layer of the second material has a thickness, and

wherein the thin-film electronic component is a thin-film transistor, TFT, and the first terminal is a source terminal of the TFT and the second terminal is a drain terminal of the TFT, and the first segments of the layers of the first and second materials form the channel of the TFT, and wherein the first material is a resistive material and the second material is a semiconducting material.

13 . The method of claim 12 , wherein the thickness of the layer of the first material is equal to the thickness of the layer of the second material.

14 . The method of claim 12 , wherein the thickness of the layer of the first material is different than the thickness of the layer of the second material.

15 . A method for fabricating a thin-film electronic component, the thin-film electronic component including a first terminal, a second terminal, and a first current path between the first terminal and the second terminal, wherein the first current path is formed from a first segment of a layer of a first material and a first segment of a layer of a second material arranged in series between the first terminal and the second terminal, and the method comprising:

depositing the layer of the first material;

patterning the layer of first material to form the first segment of the first material;

depositing the layer of the second material:

patterning the layer of the second material to form the first segment of the second material;

depositing a layer of conductive material; and

patterning the layer of conductive material to form the first and second terminals between which the first segments of the layers of the first and second materials form the first current path, wherein the layer of the first material has a thickness and the layer of the second material has a thickness,

wherein the thin-film electronic component is a resistor and the first material has a resistivity at least an order of magnitude higher than the resistivity of the second material,

wherein the thin-film electronic component includes a second current path between the first terminal and the second terminal that is in parallel to the first current path, the second current path being formed from a second segment of the layer of the first material and a second segment of the layer of the second material arranged in series between the first terminal and the second terminal, and wherein

the patterning of the layer of the first material forms the second segment of the layer of the first material; and

the patterning of the layer of the second material forms the second segment of the layer of the second material.

16 . The method of claim 15 , wherein the thickness of the layer of the first material is equal to the thickness of the layer of the second material.

17 . The method of claim 15 , wherein the thickness of the layer of the first material is different than the thickness of the layer of the second material.

Assignments (2)
CHANGE OF NAME Recorded Oct 14, 2024
From: PRAGMATIC PRINTING LIMITED
To: PRAGMATIC SEMICONDUCTOR LIMITED
Reel/Frame 068888/0492 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2022
From: PRICE, RICHARD
To: PRAGMATIC PRINTING LTD.
Reel/Frame 059225/0473 →
Priority Claims (4)
GB 1912025 · Aug 21, 2019 · national
GB 1913610 · Sep 20, 2019 · national
GB 1915158 · Oct 18, 2019 · national
GB 1917079 · Nov 22, 2019 · national
Continuity (1)
Related Publication 20220293797A1 · Sep 15, 2022
References Cited (193)
US 3996551A · Croson · 1976 [cited by applicant]
US 4609903A · Toyokura et al. · 1986 [cited by applicant]
US 5466484A · Spraggins et al. · 1995 [cited by applicant]
US 5489547A · Erdeljac et al. · 1996 [cited by applicant]
US 5872381A · Kato et al. · 1999 [cited by applicant]
US 5930638A · Reedy et al. · 1999 [cited by applicant]
US 6403438B1 · Santangelo · 2002 [cited by applicant]
US 7183593B2 · Yeo et al. · 2007 [cited by applicant]
US 7633373B1 · Johnson et al. · 2009 [cited by applicant]
US 8343819B2 · Doris et al. · 2013 [cited by applicant]
US 8513723B2 · Booth, Jr. et al. · 2013 [cited by applicant]
US 9406872B1 · Annunziata et al. · 2016 [cited by applicant]
US 9446946B2 · Schalberger et al. · 2016 [cited by applicant]
US 10204683B2 · Price et al. · 2019 [cited by applicant]
US 11316518B2 · De Oliveira · 2022 [cited by applicant]
US 11575380B2 · De Oliveira · 2023 [cited by applicant]
US 20010041412A1 · Takasu · 2001 [cited by applicant]
US 20020084487A1 · Takasu · 2002 [cited by applicant]
US 20020084492A1 · Osanai et al. · 2002 [cited by applicant]
US 20030047782A1 · Hasegawa et al. · 2003 [cited by applicant]
US 20040183130A1 · Dara · 2004 [cited by applicant]
US 20050035409A1 · Ko et al. · 2005 [cited by applicant]
US 20050074929A1 · Hasegawa et al. · 2005 [cited by applicant]
US 20050181589A1 · Miyawaki · 2005 [cited by applicant]
US 20050242349A1 · Lee et al. · 2005 [cited by applicant]
US 20050253178A1 · Yamaguchi et al. · 2005 [cited by applicant]
US 20060091793A1 · Baude et al. · 2006 [cited by applicant]
US 20060145296A1 · Coolbaugh et al. · 2006 [cited by applicant]
US 20060189049A1 · Afentakis et al. · 2006 [cited by applicant]
US 20060249793A1 · Beach · 2006 [cited by examiner]
US 20070041141A1 · Deng · 2007 [cited by applicant]
US 20070046421A1 · Gogineni et al. · 2007 [cited by applicant]
US 20080237800A1 · Chinthakindi et al. · 2008 [cited by applicant]
US 20090090977A1 · Freeman et al. · 2009 [cited by applicant]
US 20100013026A1 · Booth, Jr. et al. · 2010 [cited by applicant]
US 20100079169A1 · Kim et al. · 2010 [cited by applicant]
US 20100148168A1 · Lai et al. · 2010 [cited by applicant]
US 20100156588A1 · Privitera · 2010 [cited by applicant]
US 20110012112A1 · Yamazaki et al. · 2011 [cited by applicant]
US 20110012117A1 · Yamazaki et al. · 2011 [cited by applicant]
US 20110057918A1 · Kimura et al. · 2011 [cited by applicant]
US 20110097860A1 · Iida · 2011 [cited by applicant]
US 20110133177A1 · Suzawa et al. · 2011 [cited by applicant]
US 20110169089A1 · Doris et al. · 2011 [cited by applicant]
US 20110175152A1 · Booth, Jr. et al. · 2011 [cited by applicant]
US 20120098071A1 · Aggarwal et al. · 2012 [cited by applicant]
US 20120187493A1 · Doris et al. · 2012 [cited by applicant]
US 20130092924A1 · Sasagawa et al. · 2013 [cited by applicant]
US 20130221346A1 · Lu et al. · 2013 [cited by applicant]
US 20130309808A1 · Zhang et al. · 2013 [cited by applicant]
US 20130328169A1 · Choi · 2013 [cited by applicant]
US 20140021583A1 · Lo et al. · 2014 [cited by applicant]
US 20140027702A1 · Lu et al. · 2014 [cited by applicant]
US 20140306219A1 · Yamazaki et al. · 2014 [cited by applicant]
US 20150093844A1 · Hsia et al. · 2015 [cited by applicant]
US 20150155313A1 · Yamazaki et al. · 2015 [cited by applicant]
US 20150162396A1 · Yagi et al. · 2015 [cited by applicant]
US 20150187878A1 · Yamazaki et al. · 2015 [cited by applicant]
US 20150294984A1 · Cheng et al. · 2015 [cited by applicant]
US 20150318340A1 · Dirnecker · 2015 [cited by applicant]
US 20160093638A1 · Cheng et al. · 2016 [cited by applicant]
US 20160123817A1 · Bennett et al. · 2016 [cited by applicant]
US 20160141312A1 · Nakatani et al. · 2016 [cited by applicant]
US 20160163738A1 · Sato · 2016 [cited by applicant]
US 20160233338A1 · Lu et al. · 2016 [cited by applicant]
US 20160329392A1 · Miyake · 2016 [cited by applicant]
US 20170125604A1 · Oshima · 2017 [cited by applicant]
US 20170162646A1 · Lee et al. · 2017 [cited by applicant]
US 20170301796A1 · Ishihara et al. · 2017 [cited by applicant]
US 20180019297A1 · Dirnecker · 2018 [cited by examiner]
US 20180046004A1 · Yamazaki et al. · 2018 [cited by applicant]
US 20180261664A1 · Dirnecker et al. · 2018 [cited by applicant]
US 20180337288A1 · Shin · 2018 [cited by applicant]
US 20190019859A1 · Daigle et al. · 2019 [cited by applicant]
US 20190148361A1 · Lu et al. · 2019 [cited by applicant]
US 20190221516A1 · Kande et al. · 2019 [cited by applicant]
US 20190346500A1 · Ren et al. · 2019 [cited by applicant]
US 20200135445A1 · Yamazaki et al. · 2020 [cited by applicant]
US 20200295126A1 · Agam et al. · 2020 [cited by applicant]
US 20210226629A1 · De Oliveira · 2021 [cited by applicant]
US 20220216871A1 · De Oliveira · 2022 [cited by applicant]
US 20230238377A1 · Price et al. · 2023 [cited by applicant]
CN 1359156A · 2002 [cited by applicant]
CN 1409400A · 2003 [cited by applicant]
CN 1722448A · 2006 [cited by applicant]
CN 102576732A · 2012 [cited by applicant]
CN 103311128A · 2013 [cited by applicant]
CN 106463507A · 2017 [cited by applicant]
CN 107305843A · 2017 [cited by applicant]
CN 109786365A · 2019 [cited by applicant]
CN 114556495A · 2022 [cited by applicant]
CN 114556603A · 2022 [cited by applicant]
CN 114600234A · 2022 [cited by applicant]
DE 102020000633A1 · 2020 [cited by applicant]
EP 1063630A2 · 2000 [cited by applicant]
EP 2202802A1 · 2010 [cited by applicant]
EP 3236503A1 · 2017 [cited by applicant]
EP 2979302B1 · 2020 [cited by applicant]
GB 727505A · 1955 [cited by applicant]
GB 2490752A · 2012 [cited by applicant]
GB 2525184A · 2015 [cited by applicant]
GB 2561004A · 2018 [cited by applicant]
GB 2570569A · 2019 [cited by applicant]
GB 2586520A · 2021 [cited by applicant]
GB 2586522A · 2021 [cited by applicant]
GB 2587793A · 2021 [cited by applicant]
GB 2589937A · 2021 [cited by applicant]
GB 2586520A9 · 2021 [cited by applicant]
GB 2598074A · 2022 [cited by applicant]
GB 2602408A · 2022 [cited by applicant]
GB 2610886A · 2023 [cited by applicant]
JP S6094757A · 1985 [cited by applicant]
JP 2003007847A · 2003 [cited by applicant]
JP 2002124641A · 2004 [cited by applicant]
JP 2008124188A · 2008 [cited by applicant]
JP 2010087518A · 2010 [cited by applicant]
JP 2010225725A · 2010 [cited by applicant]
JP 2011077106A · 2011 [cited by applicant]
JP 2018006412A · 2018 [cited by applicant]
JP 2018137423A · 2018 [cited by applicant]
WO WO8903121A1 · 1989 [cited by applicant]
WO WO9307629A · 1993 [cited by applicant]
WO WO2012071878A1 · 2012 [cited by applicant]
WO WO2015079362A1 · 2015 [cited by applicant]
WO WO2015097597A1 · 2015 [cited by applicant]
WO WO2018004672A1 · 2018 [cited by applicant]
WO WO2018197988A1 · 2018 [cited by applicant]
WO WO2019116020A1 · 2019 [cited by applicant]
WO WO2021032977A1 · 2021 [cited by applicant]
WO WO2021032978A1 · 2021 [cited by applicant]
WO WO2021032979A1 · 2021 [cited by applicant]
WO WO2021032980A1 · 2021 [cited by applicant]
Klibanov, Lev “Integrated Resistors for an Advanced Node Cmos” EE Times; Nov. 16, 2016. [cited by applicant]
Wikipedia “Multiple Patterning” Available at https://en.wikipedia.org/w/index.php?title=Multiple_patterning&oldid=914700788; Sep. 8, 2019. [cited by applicant]
Examination Report Under Section 18(3) for Great Britain Application No. 2000887.6 mailed Mar. 27, 2023. [cited by applicant]
U.S. Appl. No. 17/636,083, filed Feb. 17, 2022, Price et al. [cited by applicant]
U.S. Appl. No. 17/636,090, filed Feb. 17, 2022, Price et al. [cited by applicant]
U.S. Appl. No. 17/636,099, filed Feb. 17, 2022, Price. [cited by applicant]
U.S. Appl. No. 17/636,108, filed Feb. 17, 2022, Price. [cited by applicant]
Kawakita, Masatoshi et al. “Laterally Configured Resistive Switching Device Based on Transition-Metal Nano-Gap Electrode on Gd Oxide” Applied Physics Letters 108, 023101 (2016). [cited by applicant]
Mack, Chris A. “Seeing Double” IEEE Spectrum; Nov. 1, 2008. [cited by applicant]
Nayak, Pradipta K. et al. “Thin Film Complementary Metal Oxide Semiconductor (CMOS) Device Using a Single-Step Deposition of the Channel Layer” Scientific Reports; 4: 4672; Apr. 14, 2014. [cited by applicant]
International Search Report for International Application No. PCT/GB2020/051987, mailed Nov. 26, 2020. [cited by applicant]
Written Opinion for International Application No. PCT/GB2020/051987, mailed Nov. 26, 2020. [cited by applicant]
Invitation to Pay Additional Fees and, Where Applicable, Protest Fee for International Application No. PCT/GB2020/051986, mailed Nov. 5, 2020. [cited by applicant]
International Search Report for International Application No. PCT/GB2020/051986, mailed Jan. 13, 2021. [cited by applicant]
Written Opinion for International Application No. PCT/GB2020/051986, mailed Jan. 13, 2021. [cited by applicant]
International Search Report for International Application No. PCT/GB2020/051988, mailed Nov. 2, 2020. [cited by applicant]
Written Opinion for International Application No. PCT/GB2020/051988, mailed Nov. 2, 2020. [cited by applicant]
Invitation to Pay Additional Fees and, Where Applicable, Protest Fee for International Application No. PCT/GB2020/051989, mailed Nov. 25, 2020. [cited by applicant]
International Search Report for International Application No. PCT/GB2020/051989, mailed Feb. 8, 2021. [cited by applicant]
Written Opinion for International Application No. PCT/GB2020/051989, mailed Feb. 8, 2021. [cited by applicant]
Invitation to Pay Additional Fees and, Where Applicable, Protest Fee for International Application No. PCT/GB2020/051990, mailed Nov. 2, 2020. [cited by applicant]
International Search Report for International Application No. PCT/GB2020/051990, mailed Dec. 23, 2020. [cited by applicant]
Written Opinion for International Application No. PCT/GB2020/051990, mailed Dec. 23, 2020. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3) for Great Britain Application No. 1912025.2, mailed Jan. 28, 2020. [cited by applicant]
Examination Report Under Section 18(3) for Great Britain Application No. 1912025.2, mailed Jan. 17, 2022. [cited by applicant]
Search Report Under Section 17(5) for Great Britain Application No. 2000887.6 mailed Jul. 22, 2020. [cited by applicant]
Search Report Under Section 17(6) for Great Britain Application No. 2000887.6 mailed Mar. 3, 2021. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3) for Great Britain Application No. 1913610.0, mailed Mar. 11, 2020. [cited by applicant]
Examination Report Under Section 18(3) for Great Britain Application No. 1913610.0, mailed Sep. 10, 2021. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3) for Great Britain Application No. GB 1915158.8, mailed Apr. 20, 2020. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3) for Great Britain Application No. 1917079.4, mailed May 7, 2020. [cited by applicant]
Search Report Under Section 17(6) for Great Britain Application No. 1917079.4, mailed Mar. 22, 2021. [cited by applicant]
Examination Report Under Section 18(3) for Great Britain Application No. 1917079.4, mailed Aug. 25, 2021. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3) for Great Britain Application No. 2117276.2, mailed Dec. 14, 2021. [cited by applicant]
Combined Search and Examination Report Under Sections 17 and 18(3), for corresponding Great Britain Application No. 2202910.2, mailed Apr. 5, 2022. [cited by applicant]
Notification of First Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080071825.6, mailed Dec. 27, 2023. [cited by applicant]
Office Action (Restriction Requirement) for U.S. Appl. No. 17/636,099, mailed Dec. 29, 2023. [cited by applicant]
International Preliminary Report on Patentability for International Application No. PCT/GB2020/051987, mailed Mar. 3, 2022. [cited by applicant]
International Preliminary Report on Patentability for International Application No. PCT/GB2020/051986, mailed Mar. 3, 2022. [cited by applicant]
International Preliminary Report on Patentability for International Application No. PCT/GB2020/051988, mailed Mar. 3, 2022. [cited by applicant]
International Preliminary Report on Patentability for International Application No. PCT/GB2020/051989, mailed Mar. 3, 2022. [cited by applicant]
International Preliminary Report on Patentability for International Application No. PCT/GB2020/051990, mailed Mar. 3, 2022. [cited by applicant]
Office Action (Restriction Requirement) for U.S. Appl. No. 17/636,083, mailed Mar. 6, 2024. [cited by applicant]
Office Action for U.S. Appl. No. 17/636,099, mailed Feb. 29, 2024. [cited by applicant]
Office Action for corresponding European Patent Application No. 20764719.9, mailed Jun. 25, 2024. [cited by applicant]
Office Action for corresponding European Patent Application No. 20764722.3, mailed Jun. 7, 2024. [cited by applicant]
Notification of Second Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080071825.6, mailed Jul. 15, 2024. [cited by applicant]
Office Action for U.S. Appl. No. 17/636,083, mailed Aug. 9, 2024. [cited by applicant]
Notice of Allowance for U.S. Appl. No. 17/636,099, mailed Jul. 31, 2024. [cited by applicant]
Office Action for U.S. Appl. No. 17/636,108, mailed Jul. 18, 2024. [cited by applicant]
Notification of First Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080071849.1, mailed May 7, 2024. [cited by applicant]
U.S. Appl. No. 18/931,684, filed Oct. 30, 2024, Price et al. [cited by applicant]
Notification of First Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080073505.4, mailed Dec. 26, 2024. [cited by applicant]
Notification of Second Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080071849.1, mailed Oct. 30, 2024. [cited by applicant]
Office Action (Restriction Requirement) for U.S. Appl. No. 17/636,090 mailed Dec. 23, 2024. [cited by applicant]
Notice of Allowance for U.S. Appl. No. 17/636,108, mailed Dec. 29, 2024. [cited by applicant]
Notification of Third Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080071849.1, mailed Mar. 18, 2025. [cited by applicant]
Notice of Allowance for U.S. Appl. No. 17/636,083, mailed Mar. 7, 2025. [cited by applicant]
Office Action for U.S. Appl. No. 17/636,090 mailed Apr. 23, 2025. [cited by applicant]
U.S. Appl. No. 19/222,511, filed May 29, 2025, Price et al. [cited by applicant]
Notification of Second Office Action (Including Translation) for corresponding Chinese Patent Application No. 202080073505.4, mailed Jun. 30, 2025. [cited by applicant]