Fuses for memory repair
Structures for fuses to control repair of multiple memories embedded on an integrated circuit are provided along with methods of use. A set of fuses is shared to control repair of a plurality of memories. Some of the fuses are associated with a memory to be repaired. Others of the fuses identify how the repair is accomplished.
1. An integrated circuit, comprising:
a plurality of memories each with a redundant section;
a first set of permanent storage devices to identify one of the plurality of memories, and
a second set of permanent storage devices to specify use of the redundant section of the memory identified by the first set of permanent storage devices.
2. The integrated circuit of claim 1 , wherein the first set of permanent storage devices and the second set of permanent storage devices are fuses.
3. The integrated circuit of claim 2 , wherein the fuses are electrical fuses.
4. The integrated circuit of claim 3 , wherein the plurality of memories comprises a plurality of static random access memories.
5. The integrated circuit of claim 1 , wherein the first set of permanent storage devices and the second set of permanent storage devices are antifuses.
6. The integrated circuit of claim 1 , wherein the plurality of memories comprises a random access memory.
7. The integrated circuit of claim 6 , wherein the random access memory is static random access memory.
8. The integrated circuit of claim 6 , wherein the random access memory is dynamic random access memory.
9. The integrated circuit of claim 1 , further comprising built-in self test circuitry operatively coupled to at least one of the plurality of memories, to the first set of permanent storage devices, and to the second set of permanent storage devices.
10. The integrated circuit of claim 1 , wherein the redundant section comprises a spare column and the second set of permanent storage devices specifies column replacement.
11. The integrated circuit of claim 1 , wherein the redundant section comprises a spare row and the second set of permanent storage devices specifies row replacement.
12. An integrated circuit, comprising:
a plurality of memories each with a redundant section;
a first plurality of sets of permanent storage devices, one associated with each of the plurality of memories, storing data to conditionally enable use of the redundant section of the associated memory;
circuitry sensing data programmed into the first sets of permanent storage devices to generate memory repair enable signals;
a second plurality of sets of permanent storage devices, each specifying a redundancy utilization;
circuitry sensing data programmed into the second sets of permanent storage devices to generate repair control signals; and
multiplexers selecting one of the repair control signals based on the repair enable signals.
13. The integrated circuit of claim 12 , wherein the first set of permanent storage devices and the second set of permanent storage devices are fuses.
14. The integrated circuit of claim 13 , wherein the fuses are electrical fuses.
15. The integrated circuit of claim 14 , wherein the plurality of memories comprises a plurality of static random access memories.
16. The integrated circuit of claim 12 , wherein the first set of permanent storage devices and the second set of permanent storage devices are antifuses.
17. The integrated circuit of claim 12 , wherein the plurality of memories comprises a random access memory.
18. The integrated circuit of claim 17 , wherein the random access memory is static random access memory.
19. The integrated circuit of claim 17 , wherein the random access memory is dynamic random access memory.
20. The integrated circuit of claim 12 , further comprising built-in self test circuitry operatively coupled to at least one of the plurality of memories, to the first sets of permanent storage devices, and to the second sets of permanent storage devices.
21. The integrated circuit of claim 12 , wherein the redundant section comprises a spare column and the second set of permanent storage devices specifies column replacement.
22. The integrated circuit of claim 12 , wherein the redundant section comprises a spare row and the second set of permanent storage devices specifies row replacement.
23. A process for programming fuses for repair of integrated circuit memories, comprising:
testing memories in an integrated circuit;
identifying a faulty memory;
identifying a repair for the faulty memory;
programming first permanent storage devices on the integrated circuit to signal the identified faulty memory; and
programming second permanent storage devices on the integrated circuit to signal the identified repair for the faulty memory.
24. The process of claim 23 , further comprising:
a second testing of memories in the integrated circuit;
a second identifying of a faulty memory;
a second identifying of a repair for the faulty memory;
a second programming of permanent storage devices on the integrated circuit to signal the identified faulty memory; and
a second programming of permanent storage devices on the integrated circuit to signal the identified repair.
25. The process of claim 24 , wherein the testing memories on an integrated circuit is performed on a wafer of integrated circuits and the second testing of memories on the integrated circuit is performed after packaging the integrated circuit.
26. A process for repair of memories embedded in an integrated circuit, comprising:
testing memories in an integrated circuit;
identifying a faulty memory;
identifying a repair for the faulty memory;
programming a first set of permanent storage devices on the integrated circuit to signal the identified faulty memory;
programming a second set of permanent storage devices on the integrated circuit to signal the identified repair,
sensing the status programmed into the permanent storage devices;
identifying a memory for repair from the sensed status; and
repairing the identified memory based on the sensed status.