Patent Assignment
Reel/Frame 034037/0711
Assignment of Assignor's Interest
Recorded: 2014-10-23
Pages: 16
Assignor
APTINA IMAGING CORPORATION
Executed: 2014-10-23
Assignee
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
5005 E MCDOWELL ROAD, MD A700, PHOENIX, ARIZONA, 85008
Covered Properties
(64)
Multi-sample method and system for rendering antialiased images
Application:
09/823,935 →
Publication:
US 2002/0140706
Linear-Logarithmic Pixel Sensors and Gain Control Circuits Therefor
Extended Depth of Field Using a Multi-Focal Length Lens with a Controlled Range of Spherical Aberration and a Centrally Obscured Aperture
SOI CMOS device with reduced DIBL
Application:
11/048,035 →
Publication:
US 2005/0205931
Static Random Access Memory Cell
Multi-sample method and system for rendering antialiased images
Application:
11/417,749 →
Publication:
US 2006/0197778
Method and Apparatus for Decreasing Layout Area in a Pipelined Analog-to-Digital Converter
Reducing reflections in image sensors
Application:
11/511,039 →
Publication:
US 2008/0055729
Backlit Subject Detection in an Image
Imbalance determination and correction in image sensing
Application:
11/513,583 →
Publication:
US 2008/0055455
Method and System for Fabricating Semiconductor Components with Lens Structures and Lens Support Structures
Light shaping apparatus
Application:
11/642,078 →
Publication:
US 2008/0149853
Configurable pixel array system and method
Application:
11/650,215 →
Publication:
US 2008/0165257
Static Random Access Memory Cell
Static Random Access Memory Cell
Static Random Access Memory Cell
Current Mirror Bias Trimming Technique
Class Ab Differential Amplifier with Output Stage Common Mode Feedback
Application:
11/765,211 →
Publication:
US 2008/0315951
Lens Correction Logic for Image Sensors
Suppression of Row-Wise Noise in Cmos Image Sensors
Configurable Pixel Array System and Method
Microelectronic Imagers and Methods for Manufacturing Such Microelectronic Imagers
Thin Semiconductor Die Packages and Associated Systems and Methods
Extended Depth of Field Using a Multi-Focal Length Lens with a Controlled Range of Spherical Aberration and a Centrally Obscured Aperture
Method and Apparatus for Controlling Dual Conversion Gain Signal in Imaging Devices
Systems, methods and devices for a CMOS imager having a pixel output clamp
Application:
11/880,072 →
Publication:
US 2009/0021623
Microelectronic Imager Packages and Associated Methods of Packaging
Application:
11/940,184 →
Publication:
US 2009/0121300
Microelectronic Imaging Units Having an Infrared-Absorbing Layer and Associated Systems and Methods
Application:
11/951,528 →
Publication:
US 2009/0146234
Apparatus and Method for Extended Depth of Field Imaging
Apparatus and Method for Extended Depth of Field Imaging
Emi Shielding for Imager Devices
Packaged Semiconductor Assemblies and Associated Systems and Methods
Application:
11/969,613 →
Publication:
US 2009/0102002
Electromagnetic Interference Shield Structures for Semiconductor Components
Application:
12/057,762 →
Publication:
US 2009/0243012
Integrated Conductive Shield for Microelectronic Device Assemblies and Associated Methods
Application:
12/058,244 →
Publication:
US 2009/0243051
Embedded Cache Memory in Image Sensors
Microelectronic Devices Having an Emi Shield and Associated Systems and Methods
Methods and Systems for Intensity Modeling Including Polarization
Reduced-Dimension Microelectronic Component Assemblies with Wire Bonds and Methods of Making Same
Application:
12/136,687 →
Publication:
US 2008/0296781
Microelectronic Imagers with Stacked Lens Assemblies and Processes for Wafer-Level Packaging of Microelectronic Imagers
Application:
12/147,421 →
Publication:
US 2009/0321861
Extended Depth-of-Field Lenses and Methods for Their Design, Optimization and Manufacturing
Microelectronic Imager Packages with Covers Having Non-Planar Surface Features
Application:
12/173,658 →
Publication:
US 2010/0013041
Systems and Methods for Noise Reduction in High Dynamic Range Imaging
Systems and Methods for the Efficient Computation of Image Transforms
Auto-Focusing Techniques Based on Statistical Blur Estimation and Associated Systems and Methods
Use of Z-Order Data in an Image Sensor
Object Detection Using an in-Sensor Detector
Optical Simulator Using Parallel Computations
Application:
12/550,657 →
Publication:
US 2011/0054872
Systems and Methods for Image Restoration
Systems and Methods for an Adjustable Filter Engine
Systems and Methods for Presence Detection
Systems and Methods for Local Tone Mapping of High Dynamic Range Images
Systems and Methods for Addressing and Synchronizing Multiple Devices
Systems and Methods for Adaptive Control and Dynamic Range Extension of Image Sensors
Image Sensor with Dual Layer Photodiode Structure
Application:
12/826,313 →
Publication:
US 2011/0317048
Optical Black Pixel Cell Readout Systems and Methods
Systems and Methods for Calibrating Image Sensors
Imaging Systems and Methods for Providing a Switchable Impedance to Ground
Imaging Systems and Methods Including Pixel Arrays with Reduced Numbers of Metal Lines and Control Signals
Systems and Methods for Providing Shiftable Column Circuitry of Imager Pixel Arrays
Systems and Methods for Adaptive Control and Dynamic Range Extension of Image Sensors
Application:
13/946,891 →
Publication:
US 2013/0308021
Systems and Methods for Presence Detection
Application:
14/064,575 →
Publication:
US 2014/0050360
Systems and Methods for an Adjustable Filter Engine
Systems and Methods for Providing Shiftable Column Circuitry of Imager Pixel Arrays
Systems and Methods for Control of Multiple Devices Through a Two-Wire Control Bus
Application:
61/261,876 →
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 16, 2004
From: ANDO, HARUHISA; TAKAYANAGI, ISAO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 015473/0240 →
Assignment of Assignor's Interest
Apr 21, 2005
From: BOEMLER, CHRISTIAN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 016503/0173 →
Assignment of Assignor's Interest
May 5, 2005
From: GEORGE, NICHOLAS; CHI, WANLI
To: AUTOMATIC RECOGNITION & CONTROL, INC.
Reel/Frame 015975/0882 →
Assignment of Assignor's Interest
Aug 18, 2006
From: CHO, TAEHEE
To: MICRON TECHNOLOGY INC.
Reel/Frame 018250/0195 →
Assignment of Assignor's Interest
Aug 28, 2006
From: LI, JIUTAO; LI, JIN; BOETTIGER, ULRICH
To: MICRON TECHNOLOGY, INC.
Reel/Frame 018244/0174 →
Assignment of Assignor's Interest
Aug 31, 2006
From: OVSIANNIKOV, ILIA
To: MICRON TECHNOLOGY, INC.
Reel/Frame 018259/0449 →
Assignment of Assignor's Interest
Aug 31, 2006
From: OVSIANNIKOV, ILIA
To: MICRON TECHNOLOGY, INC.
Reel/Frame 018259/0467 →
Assignment of Assignor's Interest
Nov 28, 2006
From: PERKINS, ANDREW E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 018624/0407 →
Assignment of Assignor's Interest
Dec 20, 2006
From: HEBERT, DAVID E.; CHADWICK, GARY L.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 018707/0499 →
Assignment of Assignor's Interest
Jan 5, 2007
From: BOETTIGER, ULRICH
To: MICRON TECHNOLOGY INC.
Reel/Frame 018764/0382 →
Assignment of Assignor's Interest
May 31, 2007
From: MOHOLT, JORGEN; PAHR, PER OLAF; MARTINUSSEN, TORE
To: MICRON TECHNOLOGY, INC.
Reel/Frame 019363/0168 →
Assignment of Assignor's Interest
Jul 13, 2007
From: WILLASSEN, TRYGVE
To: MICRON TECHNOLOGY, INC.
Reel/Frame 019593/0871 →
Assignment of Assignor's Interest
Jul 17, 2007
From: HUGGETT, ANTHONY
To: MICRON TECHNOLOGY, INC.
Reel/Frame 019574/0071 →
Assignment of Assignor's Interest
Jul 17, 2007
From: RYSINSKI, JEFFREY; VINAYAGAMOORTHY, SANJAYAN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 019568/0316 →
Assignment of Assignor's Interest
Oct 20, 2008
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 021724/0068 →
Assignment of Assignor's Interest
Oct 21, 2008
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 021725/0637 →
Assignment of Assignor's Interest
Nov 17, 2008
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 021854/0547 →
Assignment of Assignor's Interest
Nov 18, 2008
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 021855/0675 →
Assignment of Assignor's Interest
Nov 18, 2008
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 021855/0816 →
Assignment of Assignor's Interest
Jan 26, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 022162/0799 →
Assignment of Assignor's Interest
Jun 30, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 022898/0615 →
Assignment of Assignor's Interest
Jul 13, 2009
From: BOEMLER, CHRISTIAN
To: MICRON TECHNOLOGY, INC.
Reel/Frame 022947/0650 →
Assignment of Assignor's Interest
Jul 13, 2009
From: PETERSON, JAMES R.; MULLIS, ROBERT H.; HUNTER, GREGORY M.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 022947/0300 →
Assignment of Assignor's Interest
Aug 13, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 023094/0136 →
Assignment of Assignor's Interest
Sep 10, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 023212/0656 →