Patent Assignment
Reel/Frame 047567/0134
Release of Security Interest
Recorded: 2018-09-11
Pages: 12
Assignor
COMERICA BANK, N.A.
Executed: 2018-09-04
Assignee
LUMASENSE TECHNOLOGIES HOLDINGS, INC.
3301 LEONARD COURT, SANTA CLARA, CALIFORNIA, 95054
Covered Properties
(69)
Knock Detector Using Optical Fiber Thermometer
Patent:
5,052,214 →
Application:
07/293,228 →
Method and Apparatus for Monitoring Particles Using Back-Scattered Light Without Interfernce by Bubbles
Patent:
5,012,119 →
Application:
07/353,963 →
Dew Point Measuring Apparatus Installation System
Patent:
5,024,532 →
Application:
07/354,739 →
Autocalibrating Dual Sensor Non-Contact Temperature Measuring Device
Patent:
5,216,625 →
Application:
07/429,983 →
Fiberoptic Techniques for Measuring the Magnitude of Local Microwave Fields and Power
Patent:
5,110,216 →
Application:
07/472,351 →
Non-Contact Techniques for Measuring Temperature or Radiation-Heated Objects
Patent:
5,154,512 →
Application:
07/507,605 →
Light Collection Method and Apparatus
Patent:
5,064,269 →
Application:
07/525,467 →
Interference Removal
Patent:
5,208,644 →
Application:
07/526,558 →
Method for Control of Photoresist Develop Processes
Patent:
5,196,285 →
Application:
07/526,639 →
Method of Endpoint Detection and Structure Therefor
Patent:
5,190,614 →
Application:
07/578,056 →
Apparatus and Method for Monitoring Radiant Energy Signals with Variable Signal Gain and Resolution Enhancement
Patent:
5,138,149 →
Application:
07/578,538 →
Modular Luminescence-Based Measuring System Using Fast Digital Signal Processing
Patent:
5,107,445 →
Application:
07/621,900 →
Through the Wafer Optical Transmission Sensor
Patent:
5,166,525 →
Application:
07/653,622 →
Knock Detector Using Optical Fiber Thermometer
Patent:
5,099,681 →
Application:
07/657,326 →
Method of Making a Fiberoptic Sensor of a Microwave Field
Patent:
5,109,595 →
Application:
07/678,704 →
Temperature Measurement with Combined Photo-Luminescent and Black Body Sensing Techniques
Patent:
5,112,137 →
Application:
07/683,258 →
Techniques for Measuring the Thickness of a Film Formed on a Substrate
Patent:
5,166,080 →
Application:
07/692,578 →
Modular Luminescence-Based Measuring System Using Fast Digital Signal Processing
Patent:
5,351,268 →
Application:
07/773,039 →
Temperature Measurement with Combined Photo-Luminescent and Black Body Sensing Techniques
Patent:
5,183,338 →
Application:
07/808,012 →
Autocalibrating Dual Sensor Non-Contact Temperature Measuring Device
Patent:
5,294,200 →
Application:
07/859,819 →
Apparatus and Method for Monitoring a Temperature Using a Thermally Fused Composite Blackbody Temperature Probe
Patent:
5,364,186 →
Application:
07/874,829 →
Endpoint and Uniformity Determinations in Material Layer Processing Through Monitoring Multiple Surface Regions Across the Layer
Patent:
5,308,447 →
Application:
07/896,132 →
Non-Contact Techniques for Measuring Temperature of Radiation-Heated Objects
Patent:
5,318,362 →
Application:
07/943,927 →
Luminescent Decay Time Measurements by Use of a Ccd Camera
Patent:
5,304,809 →
Application:
07/945,229 →
Method for Control of Photoresist Develop Processes
Patent:
5,292,605 →
Application:
07/957,660 →
Non-Contact Optical Techniques for Measuring Surface Conditions
Patent:
5,310,260 →
Application:
07/999,278 →
Interference Removal
Patent:
5,414,504 →
Application:
08/019,748 →
Processing Endpoint Detecting Technique and Detector Structure Using Multiple Radiation Sources or Discrete Detectors
Patent:
5,362,969 →
Application:
08/052,401 →
Measuring System Employing a Luminescent Sensor and Methods of Designing the System
Patent:
5,414,266 →
Application:
08/075,680 →
Apparatus and Method for Measuring Temperatures at a Plurality of Locations Using Luminescent-Type Temperature Sensors Which Are Excited in a Time Sequence
Patent:
5,470,155 →
Application:
08/075,743 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
5,499,733 →
Application:
08/122,207 →
Non-Contact Optical Techniques for Measuring Surface Conditions
Patent:
5,490,728 →
Application:
08/180,641 →
Non-Contact Optical Techniques for Measuring Surface Conditions
Patent:
5,769,540 →
Application:
08/180,852 →
Respiratory Gas Analyzer
Patent:
5,464,982 →
Application:
08/215,481 →
Autocalibrating Non-Contact Temperature Measuring Technique Employing Dual Recessed Heat Flow Sensors
Patent:
5,464,284 →
Application:
08/223,631 →
Method and Apparatus for Measuring Atomic Vapor Density in Deposition Systems
Patent:
5,880,823 →
Application:
08/258,243 →
Electro-Optical Board Assembly for Measuring the Temperature of an Object Surface from Infra-Red Emissions Thereof, Including an Automatic Gain Control Therefore
Patent:
5,717,608 →
Application:
08/312,146 →
Sensor Support Subassembly
Patent:
5,582,797 →
Application:
08/396,931 →
Interference Removal
Patent:
5,786,886 →
Application:
08/436,946 →
Temperature Measuring System Having Improved Signal Processing and Multiple Optical Sensors
Patent:
5,600,147 →
Application:
08/465,827 →
In Situ Technique for Monitoring and Controlling a Process of Chemical-Mechanical-Polishing via a Radiative Communication Link
Patent:
6,010,538 →
Application:
08/585,164 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
5,695,660 →
Application:
08/615,417 →
Novel Multiple-Gas Ndir Analyzer
Patent:
5,811,812 →
Application:
08/743,411 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
5,891,352 →
Application:
08/872,885 →
Liquid Etch Endpoint Detection and Process Metrology
Patent:
6,406,641 →
Application:
08/877,537 →
Signal Processing for in Situ Monitoring of the Formation or Removal of a Transparent Layer
Patent:
6,028,669 →
Application:
08/899,470 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
6,110,752 →
Application:
08/918,907 →
Electro Optical Board Assembly for Measuring the Temperature of an Object Surface from Infra Red Emissiions Thereof Including an Automatic Gain Control Therefore
Patent:
5,897,610 →
Application:
08/938,138 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
6,426,232 →
Application:
09/097,429 →
Interference Removal
Patent:
5,946,082 →
Application:
09/097,840 →
Polarization Interferometer Spectrometer with Rotatable Birefringent Element
Patent:
6,222,632 →
Application:
09/287,651 →
Optical Techniques of Measuring Endpoint During the Processing of Material Layers in an Optically Hostile Environment
Patent:
6,077,452 →
Application:
09/291,831 →
Optical Techniques for Measuring Layer Thicknesses and Other Surface Characteristics of Objects Such as Semiconductor Wafers
Patent:
6,570,662 →
Application:
09/317,697 →
Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
Patent:
6,413,147 →
Application:
09/505,929 →
Optical Techniques for Measuring Layer Thicknesses and Other Surface Characteristics of Objects Such as Semiconductor Wafers
Patent:
6,654,132 →
Application:
09/577,795 →
Infrared Spectrophotometer Employing Sweep Diffraction Grating
Patent:
6,528,791 →
Application:
09/688,054 →
In Situ Optical Surface Temperature Measuring Techniques and Devices
Patent:
6,572,265 →
Application:
09/839,857 →
Medical patch with burstable partition
Application:
09/911,770 →
Publication:
US 2003/0021835
Thermal Imaging Combination and Method
Respiratory Gas Analyzer
Method for Adapting an Existing Thermal Imaging Device
Optical Techniques for Measuring Layer Thicknesses and Other Surface Characteristics of Objects Such as Semiconductor Wafers
Patent:
6,934,040 →
Application:
10/672,558 →
In Situ Optical Surface Temperature Measuring Techniques and Devices
Optical Techniques for Measuring Layer Thicknesses and Other Surface Characteristics of Objects Such as Semiconductor Wafers
Devices, systems and methods for determining temperature and/or optical characteristics of a substrate
Application:
11/241,579 →
Publication:
US 2007/0076780
Electrical device measurement probes
Application:
11/337,641 →
Publication:
US 2007/0171958
In Situ Optical Surface Temperature Measuring Techniques and Devices
Systems and methods for monitoring temperature during electrosurgery or laser therapy
Application:
11/499,530 →
Publication:
US 2008/0033300
System and Method for Monitoring Asset Health by Dissolved Gas Measurement
Related Assignments
(1)
Other recorded transfers of the patents in this record — the chain of ownership.