IP Library › Granted Patent US 10,431,536
Granted Patent B2
US 10,431,536 · App. 16/033,733 · Granted Oct 1, 2019

Interposer substrate and semiconductor package

Inventors: Hyon Chol Kim (Hwaseong-si, KR); Bok Sik Myung (Seongnam-si, KR); Ok Gyeong Park (Yongin-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L23/49838H01L23/49811H01L23/49822H01L23/49827H01L25/105H01L2225/1041
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Quick Facts
Patent No.
US 10,431,536
App. No.
16/033,733
Granted
Oct 1, 2019
Kind
B2
Abstract

A semiconductor package includes a first semiconductor package including a first substrate and a lower semiconductor chip mounted on the first substrate, a second semiconductor package stacked on the first semiconductor package and including a second substrate and an upper semiconductor chip mounted on the second substrate, and an interposer substrate interposed between the first semiconductor package and the second semiconductor package and having a recess recessed from a lower surface facing the lower semiconductor chip, wherein the interposer substrate includes a dummy wiring layer disposed to be adjacent to the recess, in a region overlapped with the lower semiconductor chip, and no electrical signal is applied to the dummy wiring layer.

Claims (44)

1. A semiconductor package comprising:

a first semiconductor package including a first substrate and a lower semiconductor chip mounted on the first substrate;

a second semiconductor package stacked on the first semiconductor package and including a second substrate and an upper semiconductor chip mounted on the second substrate; and

an interposer substrate interposed between the first semiconductor package and the second semiconductor package and having a recess recessed from a lower surface facing the lower semiconductor chip,

wherein the interposer substrate includes a dummy wiring layer disposed to be adjacent to the recess in a region overlapped with the lower semiconductor chip, and

wherein the dummy wiring layer is electrically floating.

2. The semiconductor package of claim 1 , wherein the interposer substrate further includes a lower insulating layer covering a lower surface of the dummy wiring layer.

3. The semiconductor package of claim 1 , wherein at least a portion of the dummy wiring layer is exposed to the recess.

4. The semiconductor package of claim 3 , wherein at least a portion of the dummy wiring layer is in contact with an upper surface of the lower semiconductor chip.

5. The semiconductor package of claim 1 , wherein the dummy wiring layer has a single pattern or includes a plurality of patterned patterns.

6. The semiconductor package of claim 1 , wherein the interposer substrate further includes protrusions spaced apart from each other on a lower surface forming the recess.

7. The semiconductor package of claim 6 , wherein at least portions of the protrusions are in contact with an upper surface of the lower semiconductor chip.

8. The semiconductor package of claim 1 , wherein the interposer substrate includes:

a core insulating layer having an embedded wiring layer;

a lower insulating layer disposed below the core insulating layer and having the recess; and

an interconnecting wiring layer disposed on a lower surface of the lower insulating layer, on a periphery of the recess.

9. The semiconductor package of claim 8 , wherein the dummy wiring layer is disposed within the lower insulating layer.

10. The semiconductor package of claim 8 , wherein the core insulating layer and the lower insulating layer include different materials.

11. The semiconductor package of claim 10 , wherein the core insulating layer includes glass fiber and the lower insulating layer consists of a resin and an inorganic filler.

12. The semiconductor package of claim 8 , further comprising:

connecting terminals disposed between the interconnecting wiring layer and the first substrate.

13. The semiconductor package of claim 1 , wherein the interposer substrate further includes a peripheral wiring layer disposed on a perimeter of the recess, on the same vertical level as the dummy wiring layer.

14. The semiconductor package of claim 1 , wherein the first substrate has a cavity corresponding to a region in which the lower semiconductor chip is mounted.

15. A semiconductor package comprising:

a substrate;

a semiconductor chip mounted on the substrate;

an interposer substrate disposed on the semiconductor chip and electrically connected to the substrate; and

connecting terminals connecting the substrate and the interposer substrate,

wherein the interposer substrate includes:

a core insulating layer having an embedded wiring layer;

a lower insulating layer disposed below the core insulating layer and having a recess recessed from a lower surface facing the semiconductor chip;

a dummy wiring layer disposed between the embedded wiring layer and the semiconductor chip above the recess, the dummy wiring layer being electrically floating; and

an interconnecting wiring layer disposed on a lower surface of the lower insulating layer and connected to the connecting terminals, on a periphery of the recess.

16. The semiconductor package of claim 15 , wherein the dummy wiring layer is disposed on a lower surface of the core insulating layer.

17. The semiconductor package of claim 15 , wherein the dummy wiring layer is disposed within the lower insulating layer.

18. The semiconductor package of claim 15 , wherein the lower insulating layer exposes at least a portion of the dummy wiring layer.

19. An interposer substrate comprising:

a core insulating layer having an embedded wiring layer;

a lower insulating layer disposed below the core insulating layer and having a recess recessed from a lower surface at the center of the lower surface; and

a dummy wiring layer disposed on a lower surface of the core insulating layer above the recess,

wherein the dummy wiring layer is electrically floating.

20. The interposer substrate of claim 19 , further comprising:

an interconnecting wiring layer disposed on a lower surface of the lower insulating layer, on a perimeter of the recess; and

connecting terminals disposed on a lower surface of the interconnecting wiring layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2018
From: KIM, HYON CHOL; MYUNG, BOK SIK; PARK, OK GYEONG
To: SAMSUNG ELECTRONICS CO., LTD
Reel/Frame 046452/0224 →
Priority Claims (1)
KR 10-2017-0180989 · Dec 27, 2017 · national
Continuity (1)
Related Publication 20190198437A1 · Jun 27, 2019
Cited By (25)
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