RF impedance matching network
In one embodiment, an RF impedance matching circuit is disclosed. The matching circuit is coupled between a plasma chamber and an RF source. The matching circuit includes a first electronically variable capacitor (EVC) having a first variable capacitance, a terminal of the first EVC being operably coupled to the RF input, and a second EVC having a second variable capacitance, a terminal of the second EVC being operably coupled to the RF output. A control circuit determines, based on a first parameter, a first capacitance value for the first EVC and a second capacitance value for the second EVC. The control circuit then generates a control signal to alter the first and second variable capacitances accordingly. The alteration of the capacitances, while the frequency of the RF source is not altered, causes RF power reflected back to the RF source to decrease.
1. A radio frequency (RF) impedance matching circuit comprising:
an RF input configured to operably couple to an RF source and to receive an RF signal at a first frequency from the RF source, the RF source having a fixed output impedance;
an RF output configured to operably couple to a plasma chamber;
a first electronically variable capacitor (EVC) coupled to the RF input to receive the RF signal from the RF source at the first frequency;
a second EVC separate and distinct from the first EVC, the second EVC coupled to the RF input to receive the RF signal from the RF source at the first frequency, wherein the first EVC has two terminals, the second EVC has two terminals, and the two terminals of the first EVC are not both common to the two terminals of the second EVC; and
a control circuit operably coupled to the first and second EVCs and configured to:
determine a first parameter related to the plasma chamber, the matching circuit, or the RF source;
determine, based on the first parameter, both:
a first capacitance value or configuration (CVOC) for the first EVC; and
a second CVOC for the second EVC; and
generate one or more control signals to alter the first EVC to the first CVOC and the second EVC to the second CVOC;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease.
2. The RF impedance matching circuit of claim 1 wherein the first CVOC or the second CVOC is a capacitance value, the capacitance value being a numeric amount of capacitance.
3. The RF impedance matching circuit of claim 1 :
wherein each of the first EVC and the second EVC comprises a plurality of fixed capacitors, each fixed capacitor having a corresponding switch to activate or deactivate the fixed capacitor; and
wherein the first CVOC or the second CVOC is a configuration, each configuration being indicative of an activated or deactivated state for each fixed capacitor.
4. The RF impedance matching circuit of claim 1 wherein the first EVC and the second EVC are not in parallel.
5. The RF impedance matching circuit of claim 1 :
wherein the RF signal has a frequency; and
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the first frequency of the RF signal from the RF source is not altered.
6. The RF impedance matching circuit of claim 1 wherein the determination of the first CVOC and the second CVOC comprises a determination that, of possible combinations of CVOCs for the first and second EVCs, the first CVOC and the second CVOC together are most likely to achieve an impedance match.
7. The RF impedance matching circuit of claim 1 wherein the alteration of the first EVC and the second EVC occur simultaneously.
8. The RF impedance matching circuit of claim 1 wherein the control circuit does not determine the first CVOC or the second CVOC based on an error value indicative of reflected power.
9. The RF impedance matching circuit of claim 1 :
wherein the control circuit is further configured to repeat the determining the first and second CVOCs and generating the one or more control signals to alter the first and second EVCs to cause an impedance match; and
wherein the repeated determinations of the first and second CVOCs by the control circuit are not based on bringing an error signal indicative of reflected power to zero.
10. The RF impedance matching circuit of claim 1 :
wherein the RF signal has a frequency;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the first frequency of the RF signal from the RF source is not altered; and
wherein the alteration of the first and second EVCs causes the RF power reflected back to the RF source to begin decreasing with 150 μsec of the determination of the first parameter.
11. The RF impedance matching circuit of claim 1 :
wherein the RF signal has a frequency;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the first frequency of the RF signal from the RF source is not altered;
wherein the steps of determining the first and second CVOCs and generating the one or more control signals to alter the first and second EVCs are repeated to cause an impedance match; and
wherein the impedance match is caused in an elapsed time of 500 μsec or less.
12. The RF impedance matching circuit of claim 1 :
wherein the second EVC comprises a plurality of fixed capacitors, each fixed capacitor having a corresponding switch to activate or deactivate the fixed capacitor; and
wherein each corresponding switch comprises a plurality of PiN or NiP diodes coupled in series.
13. The RF impedance matching circuit of claim 1 wherein the first parameter is determined using a look-up table.
14. The RF impedance matching circuit of claim 1 wherein the first parameter is a variable impedance of the plasma chamber.
15. The RF impedance matching circuit of claim 14 wherein the variable impedance of the plasma chamber is determined based on either a parameter detected by a sensor positioned at the RF input or a parameter detected by a sensor at the RF output.
16. The RF impedance matching circuit of claim 1 wherein the RF output is coupled directly to the plasma chamber.
17. The RF impedance matching circuit of claim 1 wherein there is no fixed impedance matching section coupled between the RF output and the plasma chamber.
18. A method for radio frequency (RF) impedance matching, the method comprising:
coupling an RF impedance matching circuit between an RF source having a fixed impedance and a plasma chamber, the matching circuit comprising:
a first electronically variable capacitor (EVC) coupled to an RF input of the matching circuit to receive an RF signal from an RF source at a first frequency; and
a second EVC separate and distinct from the first EVC, the second EVC coupled to the RF input to receive the RF signal from the RF source at the first frequency, wherein the first EVC has two terminals, the second EVC has two terminals, and the two terminals of the first EVC are not both common to the two terminals of the second EVC;
receiving, at the RF input of the matching circuit, the RF signal at the first frequency from the RF source;
determining a first parameter related to the plasma chamber, the matching circuit, or the RF source;
determining, based on the first parameter, both:
a first capacitance value or configuration (CVOC) for the first EVC; and
a second CVOC for the second EVC; and
generating one or more control signals to alter the first EVC to the first CVOC and the second EVC to the second CVOC;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease.
19. The method of claim 18 wherein the first CVOC or the second CVOC is a capacitance value, the capacitance value being a numeric amount of capacitance.
20. The method of claim 18 :
wherein each of the first EVC and the second EVC comprises a plurality of fixed capacitors, each fixed capacitor having a corresponding switch to activate or deactivate the fixed capacitor; and
wherein the first CVOC or the second CVOC is a configuration, each configuration being indicative of an activated or deactivated state for each fixed capacitor.
21. The method of claim 18 :
wherein the RF signal has a frequency; and
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the frequency of the RF signal from the RF source is not altered.
22. The method of claim 18 wherein the determination of the first CVOC and the second CVOC comprises a determination that, of possible combinations of CVOCs for the first and second EVCs, the first CVOC and the second CVOC together are most likely to achieve an impedance match.
23. The method of claim 18 wherein the alteration of the first EVC and the second EVC occur simultaneously.
24. The method of claim 18 wherein the determination of the first CVOC and the second CVOC are not based on an error value indicative of reflected power.
25. The method of claim 18 :
further comprising repeating the steps of determining the first and second CVOCs and generating the one or more control signals to alter the first and second EVCs to cause an impedance match; and
wherein the repeated determinations of the first and second CVOCs are not based on bringing an error signal indicative of reflected power to zero.
26. A semiconductor processing tool comprising:
a plasma chamber configured to deposit a material onto a substrate or etch a material from the substrate; and
an impedance matching circuit operably coupled to the plasma chamber, the matching circuit comprising:
an RF input configured to operably couple to an RF source and to receive an RF signal at a frequency from the RF source, the RF source having a fixed output impedance;
an RF output configured to operably couple to the plasma chamber;
a first electronically variable capacitor (EVC) coupled to the RF input to receiver the RF signal from the RF source at the first frequency;
a second EVC separate and distinct from the first EVC, wherein the first EVC, the second EVC coupled to the RF input to receive the RF signal from the RF source at the first frequency has two terminals, the second EVC has two terminals, and the two terminals of the first EVC are not both common to the two terminals of the second EVC; and
a control circuit operably coupled to the first and second EVCs and configured to:
determine a first parameter related to the plasma chamber, the matching circuit, or the RF source;
determine, based on the first parameter, both (a) a first capacitance value or configuration (CVOC) for the first EVC, and (b) a second CVOC for the second EVC; and
generate one or more control signals to alter the first EVC to the first CVOC and the second EVC to the second CVOC;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease.
27. The processing tool of claim 26 wherein the first CVOC or the second CVOC is a capacitance value, the capacitance value being a numeric amount of capacitance.
28. The processing tool of claim 26 :
wherein each of the first EVC and the second EVC comprises a plurality of fixed capacitors, each fixed capacitor having a corresponding switch to activate or deactivate the fixed capacitor; and
wherein the first CVOC or the second CVOC is a configuration, each configuration being indicative of an activated or deactivated state for each fixed capacitor.
29. The processing tool of claim 26 wherein the first EVC and the second EVC are not in parallel.
30. The processing tool of claim 26 :
wherein the RF signal has a frequency; and
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the frequency of the RF signal from the RF source is not altered.
31. The processing tool of claim 26 wherein the determination of the first CVOC and the second CVOC comprises a determination that, of possible combinations of CVOCs for the first and second EVCs, the first CVOC and the second CVOC together are most likely to achieve an impedance match.
32. The processing tool of claim 26 wherein the alteration of the first EVC and the second EVC occur simultaneously.
33. The processing tool of claim 26 wherein the control circuit does not determine the first CVOC or the second CVOC based on an error value indicative of reflected power.
34. The processing tool of claim 26 :
wherein the control circuit is further configured to repeat the determining the first and second CVOCs and generating the one or more control signals to alter the first and second EVCs to cause an impedance match; and
wherein the repeated determinations of the first and second CVOCs by the control circuit are not based on bringing an error signal indicative of reflected power to zero.
35. The processing tool of claim 26 :
wherein the RF signal has a frequency;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the frequency of the RF signal from the RF source is not altered; and
wherein the alteration of the first and second EVCs causes the RF power reflected back to the RF source to begin decreasing with 150 μsec of the determination of the first parameter.
36. The processing tool of claim 26 :
wherein the RF signal has a frequency;
wherein the alteration of the first EVC and the second EVC causes RF power reflected back to the RF source to decrease while the first frequency of the RF signal from the RF source is not altered;
wherein the steps of determining the first and second CVOCs and generating the one or more control signals to alter the first and second EVCs are repeated to cause an impedance match; and
wherein the impedance match is caused in an elapsed time of 500 μsec or less.
37. The processing tool of claim 26 :
wherein the second EVC comprises a plurality of fixed capacitors, each fixed capacitor having a corresponding switch to activate or deactivate the fixed capacitor; and
wherein each corresponding switch comprises a plurality of PiN or NiP diodes coupled in series.
38. The processing tool of claim 26 wherein the first parameter is determined using a look-up table.
39. The processing tool of claim 26 wherein the first parameter is a variable impedance of the plasma chamber.
40. The processing tool of claim 39 wherein the variable impedance of the plasma chamber is determined based on either a parameter detected by a sensor positioned at the RF input or a parameter detected by a sensor at the RF output.
41. The processing tool of claim 26 wherein the RF output is coupled directly to the plasma chamber.
42. The processing tool of claim 26 wherein there is no fixed impedance matching section coupled between the RF output and the plasma chamber.