Semiconductor integrated circuit device
In a p-type region, a nanosheet farthest from an n-type region has a face exposed from a first gate interconnect on the side away from the n-type region in the Y direction. In the n-type region, a nanosheet farthest from the p-type region has a face exposed from a second gate interconnect on the side away from the p-type region in the Y direction. In the p-type region, a nanosheet closest to the n-type region has a face exposed from the first gate interconnect on the side closer to the n-type region in the Y direction. In the n-type region, a nanosheet closest to the p-type region has a face exposed from the second gate interconnect on the side closer to the p-type region in the Y direction.
1. A semiconductor integrated circuit device including standard cells arranged in a first direction,
in each of the standard cells, a p-type region in which p-type transistors are formed and an n-type region in which n-type transistors are formed being disposed adjacently in a second direction vertical to the first direction, the standard cell comprising:
a first nanosheet group including two or more nanosheets, each extending in the first direction, arranged in the second direction in the p-type region;
a second nanosheet group including two or more nanosheets, each extending in the first direction, arranged in the second direction in the n-type region;
a first gate interconnect extending in the second direction, formed to surround peripheries of the nanosheets of the first nanosheet group in the second direction and a third direction perpendicular to the first and second directions; and
a second gate interconnect extending in the second direction, formed to surround peripheries of the nanosheets of the second nanosheet group in the second and third directions,
wherein
in the first nanosheet group, a first nanosheet farthest from the n-type region has a face exposed from the first gate interconnect on a side away from the n-type region in the second direction, and a second nanosheet closest to the n-type region has a face exposed from the first gate interconnect on a side closer to the n-type region in the second direction, and
in the second nanosheet group, a third nanosheet farthest from the p-type region has a face exposed from the second gate interconnect on a side away from the p-type region in the second direction, and a fourth nanosheet closest to the p-type region has a face exposed from the second gate interconnect on a side closer to the p-type region in the second direction.
2. The semiconductor integrated circuit device of claim 1 , wherein
each of the nanosheets of the first and second nanosheet groups has a one-sheet structure or a sheet structure of a plurality of nanosheets overlapping as viewed in plan.
3. The semiconductor integrated circuit device of claim 1 , wherein
the first and second gate interconnects are placed at a same position in the first direction.
4. The semiconductor integrated circuit device of claim 3 , wherein
the standard cell further comprises a gate connecting portion formed between the first and second gate interconnects for connecting the first and second gate interconnects.
5. The semiconductor integrated circuit device of claim 1 , wherein
the first nanosheet group includes fifth and sixth nanosheets adjacent to each other in the second direction, lying between the first and second nanosheets,
the second nanosheet group includes seventh and eighth nanosheets adjacent to each other in the second direction, lying between the third and fourth nanosheets,
faces of the fifth and sixth nanosheets opposed to each other in the second direction are exposed from the first gate interconnect, and
faces of the seventh and eighth nanosheets opposed to each other in the second direction are exposed from the second gate interconnect.
6. The semiconductor integrated circuit device of claim 1 , further comprising:
a first power line extending in the first direction for supplying a first power supply voltage; and
a second power line extending in the first direction for supplying a second power supply voltage,
wherein
the p-type region and the n-type region are formed between the first and second power lines.
7. A semiconductor integrated circuit device, comprising:
a first power line extending in a first direction for supplying a first power supply voltage; and
a second power line extending in the first direction for supplying a second power supply voltage,
a p-type region in which p-type transistors are formed and an n-type region in which n-type transistors are formed being disposed adjacently in a second direction vertical to the first direction between the first and second power lines, the device further comprising:
a first nanosheet group including two or more nanosheets, each extending in the first direction, arranged in the second direction in the p-type region;
a second nanosheet group including two or more nanosheets, each extending in the first direction, arranged in the second direction in the n-type region;
a first gate interconnect extending in the second direction, formed to surround peripheries of the nanosheets of the first nanosheet group in the second direction and a third direction perpendicular to the first and second directions; and
a second gate interconnect extending in the second direction, formed to surround peripheries of the nanosheets of the second nanosheet group in the second and third directions,
wherein
in the first nanosheet group, a first nanosheet farthest from the n-type region has a face exposed from the first gate interconnect on a side away from the n-type region in the second direction, and a second nanosheet closest to the n-type region has a face exposed from the first gate interconnect on a side closer to the n-type region in the second direction, and
in the second nanosheet group, a third nanosheet farthest from the p-type region has a face exposed from the second gate interconnect on a side away from the p-type region in the second direction, and a fourth nanosheet closest to the p-type region has a face exposed from the second gate interconnect on a side closer to the p-type region in the second direction.