IP Library › Assignment 012381/0616

Patent Assignment

Reel/Frame 012381/0616

Assignment of Assignor's Interest

Recorded: 2001-12-31 Pages: 4

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Assignor

HEWLETT-PACKARD COMPANY, A DELAWARE CORPORATION

Executed: 2001-11-19

Assignee

AGILENT TECHNOLOGIES, INC.

INTELLECTUAL PROPERTY ADMINISTRATION, LEGAL DEPARTMENT, DL429, P.O. BOX 7599, LOVELAND, COLORADO, 80537

Covered Properties (75)

Housing for Interfacing a Semiconductor Device with a Fiber Optic Cable

Patent: 4,479,696 →

Application: 06/478,217 →

Method for Driving a Relay

Patent: 4,617,604 →

Application: 06/689,358 →

Apparatus for Measuring Characteristics of Circuit Elements

Patent: 4,701,701 →

Application: 06/887,675 →

Method for Measuring a Signal's Frequency Components

Patent: 4,686,457 →

Application: 06/891,824 →

Personality Board

Patent: 4,899,106 →

Application: 07/225,492 →

Apparatus Which Uses a Simulated Inductor in the Measurement of an Electrical Parameter of a Device Under Test

Patent: 4,885,528 →

Application: 07/318,286 →

D.C. Biasing Apparatus

Patent: 5,014,012 →

Application: 07/374,117 →

Antilog Circuit with Automatic Gain Control

Patent: 5,014,013 →

Application: 07/418,295 →

Epitaxial Growth Method

Patent: 5,185,288 →

Application: 07/464,275 →

Printed Wiring Boards with Superposed Copper Foils Cores

Patent: 5,045,642 →

Application: 07/509,833 →

Integrated Circuit and Lead Frame Assembly

Patent: 1,267 →

Application: 07/549,504 →

Source Level Control for Impedance Meter

Patent: 5,019,781 →

Application: 07/604,382 →

Identification of Pin-Open Faults by Capacitive Coupling Through the Integrated Circuit Package

Patent: 5,124,660 →

Application: 07/631,609 →

Method and Apparatus for Measuring Breakdown Voltage Trigger and Latchback Voltage of a Semiconductor Device

Patent: 5,057,780 →

Application: 07/659,532 →

Bipolar Transistor Containing a Self-Aligned Emitter Contact and Method for Forming Transistor

Patent: 5,121,184 →

Application: 07/664,685 →

Rapid Wafer Thinning Process

Patent: 5,127,984 →

Application: 07/694,904 →

Method for Manufacturing an Optical Probe

Patent: 5,383,453 →

Application: 07/749,697 →

Light-Emitting Diode with a Thick Transparent Layer

Patent: 5,233,204 →

Application: 07/819,542 →

Apparatus and Method for Measuring Hysteresis Characteristics in a High Frequency Range

Patent: 5,241,269 →

Application: 07/831,997 →

Mechanism for Removably Mounting Dut Board on Test Head

Patent: 5,295,853 →

Application: 07/846,815 →

Surface Preparation for Chemica-Specific Binding

Patent: 6,235,488 →

Application: 07/876,804 →

Apparatus and Method for Generating Synchronized Control Signals in a System for Testing Electronic Parts

Patent: 5,341,091 →

Application: 07/934,368 →

Terminal Device for Electrical Connection

Patent: 5,234,359 →

Application: 07/936,899 →

Reed Relay and Switch Matrix Device Using the Same

Patent: 5,252,936 →

Application: 07/951,718 →

Circuit Element Measuring Apparatus and Method for Measuring a Parameter of a Dut Including a Compensation Network Having an Admittance Characteristic

Patent: 5,216,373 →

Application: 07/952,466 →

Apparatus and Method for Testing Electronic Devices

Patent: 5,289,116 →

Application: 07/952,469 →

Contact Judging Circuit and Contact Judging Method for Impedance Measuring Apparatus

Patent: 5,416,470 →

Application: 07/967,221 →

Two-Terminal Circuit Element Measuring Apparatus for Performing Contact Checks

Patent: 5,321,363 →

Application: 08/001,851 →

Electric Field Emitter Device for Electrostatic Discharge Protection of Integrated Circuits

Patent: 5,357,397 →

Application: 08/030,983 →

Low Leakage Diode Switches for a Tester Circuit for Integrated Circuits

Patent: 5,543,728 →

Application: 08/077,186 →

Balanced Output High-Frequency Transducers and Mixers Using the Same with Symmetrically Located Components

Patent: 5,465,416 →

Application: 08/145,417 →

Apparatus for Testing and Measuring Electronic Device and Method of Calibrating Its Timing and Voltage Level

Patent: 5,712,855 →

Application: 08/145,419 →

Universal Quadrupole and Method of Manufacture

Patent: 5,525,084 →

Application: 08/218,441 →

Adjustable Optical Component

Patent: 5,513,031 →

Application: 08/245,243 →

Reliable Low Thermal Resistance Package for High Power Flip Clip Ics

Patent: 5,585,671 →

Application: 08/319,764 →

Method of Forming Silicon/Silicon-Germanium Hetrojunction Bipolar Transistor

Patent: 5,633,179 →

Application: 08/320,815 →

Method for Generating Test Vectors for Characterizing and Verifying the Operation of Integrated Circuits

Patent: 5,586,125 →

Application: 08/344,391 →

Method of and Device for Magnetic Resonance Imaging

Patent: 5,800,354 →

Application: 08/345,026 →

Method and Apparatus for Improved Flow and Pressure Measurement and Control

Patent: 5,524,084 →

Application: 08/366,532 →

P-I-N Photodiode with Transparent Conductor N+Layer

Patent: 5,528,071 →

Application: 08/384,488 →

High Throughput Fpga Control Interface

Patent: 5,654,650 →

Application: 08/570,040 →

Voltage/Current Measuring Unit and Method

Patent: 5,579,236 →

Application: 08/634,755 →

Methods, Apparatus and Computer Program Products for Synthesizing Integrated Circuits with Electrostatic Discharge Capability and Correcting Ground Rules Faults Therein

Patent: 5,796,638 →

Application: 08/668,856 →

High Speed, Low Noise, Low Power, Electronic Memory Sensing Scheme

Patent: 5,680,357 →

Application: 08/709,983 →

System and Method for Pattern Matching Using Checksums

Patent: 5,832,235 →

Application: 08/824,536 →

Integrated Circuit Testing Assembly and Method

Patent: 6,169,411 →

Application: 08/867,379 →

Inductively Coupled Plasma Mass Spectroscopic Apparatus

Patent: 5,939,718 →

Application: 08/901,503 →

Attachment Support

Patent: 5,947,433 →

Application: 08/965,170 →

Time-To- Flight Mass Spectrometers and Convergent Lenses for Ion Beams

Patent: 6,057,545 →

Application: 08/998,234 →

Vibration Isolation Platform

Patent: 5,996,960 →

Application: 09/074,869 →

Optimized Memory Organization in a Multi-Channel Architecture

Patent: 6,304,947 →

Application: 09/140,427 →

Method for Implementing a Programmable Logic Device Having Look-Up Table and Product-Term Circuitry

Patent: 6,212,670 →

Application: 09/144,891 →

Remote Measurement of Wavelength Dependent Information About Optical Components

Patent: 6,067,150 →

Application: 09/212,028 →

Advanced Semiconductor Devices Fabricated with Passivated High Aluminum Content Iii-V Materials

Patent: 6,201,264 →

Application: 09/231,411 →

An Apparatus and Method for Mapping Network Topology Elements and Connections

Patent: 6,608,635 →

Application: 09/262,583 →

Graphical System and Method for Invoking Measurements in a Signal Measurement System

Patent: 6,246,408 →

Application: 09/275,283 →

Optical Display Device and Method of Operating an Optical Display Device

Patent: 6,239,716 →

Application: 09/335,418 →

Image Screen and Method of Forming Anti-Reflective Layer Thereon

Patent: 6,594,079 →

Application: 09/368,485 →

Organic Electroluminescent Device

Patent: 6,552,488 →

Application: 09/382,025 →

Method for Operating a Spectrum Analyzer to Display a Marker of a Signal of Interest

Patent: 6,389,365 →

Application: 09/383,065 →

Method and Structure for Uniform Height Solder Bumps on a Semiconductor Wafer

Patent: 6,146,984 →

Application: 09/415,319 →

System for Generating Timing Signal Varyying Over Time from an Ideal Signal by Combining Nominal Parameter Value Signal and Parameter Variation Value Signal

Patent: 6,665,808 →

Application: 09/439,001 →

Test Head Assembly

Patent: 6,507,203 →

Application: 09/451,896 →

Optical Vehicle Display

Patent: 6,396,466 →

Application: 09/452,609 →

Compensation of Timing Errors Caused by Dynamic Thermal Mismatch

Patent: 6,317,001 →

Application: 09/453,187 →

Slope Generator