Patent Assignment
Reel/Frame 015035/0270
Confirmatory Assignment
Recorded: 2004-08-03
Pages: 6
Assignor
CARL-ZEISS-STIFTUNG
Executed: 2004-06-30
Assignee
CARL ZEISS SMT AG
CARL-ZEISS-STRASSE, OBERKOCHEN, 73447, GERMANY
Covered Properties
(26)
Reticular Objective for Microlithography-Projection Exposure Installations
Patent:
6,366,410 →
Application:
09/125,621 →
Optical System with Polarization Compensator
Patent:
6,252,712 →
Application:
09/252,636 →
Optical Arrangement and Projection Illumination Equipment for Microlithography with Passive Thermal Compensation
Application:
09/255,137 →
Reticle with Crystal Support Material and Pellicle
Patent:
6,825,913 →
Application:
09/261,080 →
Active Mirror
Patent:
6,193,381 →
Application:
09/272,850 →
Catadioptric Projection Objective with Adaptive Mirror and Projection Exposure Method
Application:
09/321,908 →
Assembly of Optical Element and Mount
Patent:
6,229,657 →
Application:
09/328,938 →
Process for the Correction of Non-Rotationally-Symmetrical Image Errors
Patent:
6,198,579 →
Application:
09/336,341 →
Positioning Device
Patent:
6,276,066 →
Application:
09/354,532 →
Catadioptric Optical System and Exposure Apparatus Having the Same
Patent:
6,496,306 →
Application:
09/364,382 →
Microlithographic Reduction Objective, Projection Exposure Equipment and Process
Patent:
6,349,005 →
Application:
09/416,105 →
Catadioptric Objective Comprising Two Intermediate Images
Patent:
6,600,608 →
Application:
09/434,702 →
Projection Objective
Patent:
6,522,484 →
Application:
09/444,063 →
Objective with Crystal Lenses and Projection Exposure Equipment for Microlithography
Patent:
6,683,729 →
Application:
09/451,505 →
Optical imaging device, particularly an objective, with at least one optical element
Patent:
6,191,898 →
Application:
09/483,320 →
Optical projection system
Application:
09/746,728 →
Publication:
US 2002/0001141
Process for the Decontamination of Microlithographic Projection Exposure Devices
Optical Projection System
SIO2-Coated Mirror Substrate for Euv
Microlithographic Illumiation System with Depolarizer
Patent:
6,535,273 →
Application:
09/756,028 →
Beamsplitter
Application:
09/759,956 →
Publication:
US 2001/0024329
Microlithographic Illuminating System and Microlithographic Projection Exposure Arrangement Incorporating Said System
Optical Arrangement and Projection Exposure System for Microlithography with Passive Thermal Compensation
Catadioptric Optical System and Exposure Apparatus Having the Same
Catadioptric Projection Objective with Adaptive Mirror and Projection Exposure Method
Optical Arrangement and Projection Exposure System for Microlithography with Passive Thermal Compensation
Application:
10/826,823 →
Publication:
US 2004/0207825
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 7, 2004
From: CARL-ZEISS -STIFTUNG, HEIDENHEIM-BRENZ
To: CARL ZEISS SMT AG
Reel/Frame 015428/0524 →
Assignment of Assignor's Interest
Sep 24, 2007
From: WAGNER, CHRISTIAN; TRUNZ, MICHAEL; HILGERS, RALF
To: CARL ZEISS SMT AG
Reel/Frame 019865/0234 →
A Modifying Conversion
Jan 18, 2011
From: CARL ZEISS SMT AG
To: CARL ZEISS SMT GMBH
Reel/Frame 025763/0367 →