Patent Assignment
Reel/Frame 025193/0138
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Transmission line loss compensation circuit and transmission line loss compensation method
Application:
12/591,984 →
Publication:
US 2010/0142606
Cache Memory and Method of Controlling the Same
Application:
12/603,273 →
Publication:
US 2010/0106910
Semiconductor Device
Application:
12/603,592 →
Publication:
US 2010/0109118
Semiconductor Memory Device
Method for Cutting Electric Fuse
Semiconductor Device
Application:
12/604,910 →
Publication:
US 2010/0102850
Method for Manufacturing a Semiconductor Device
Communication Apparatus and Offset Canceling Method
Method of Fabricating Semiconductor Device with a High Breakdown Voltage Between Neighboring Wells
Fet Phase Shifter for Selectively Phase Shifting Signals Between Different Filtering Characteristics
Semiconductor Memory Device and Semiconductor Memory Device Operation Method
Semiconductor Memory Device and Read Access Method Thereof
Layout Density Verification System and Layout Density Verification Method
Application:
12/612,955 →
Publication:
US 2010/0122226
Model Parameter Extracting Apparatus and Model Parameter Extracting Program for Semiconductor Device Model
Memory Controller and Memory Control Method
Semiconductor Device
Semiconductor Device Having Interconnect Structure for Mim Capacitor and Fuse Elements
Semiconductor Chip Package Having a Semiconductor Element Solder Bonded to a Wiring Board with a Divisional Ridge There Between.
Application:
12/617,106 →
Publication:
US 2010/0123231
Semiconductor Device Having a Common Gate Electrode Formed Over Multiple Active Regions and the Souce and Drain of One Active Region Are Connected to the Respective Source and Drain of the Other Active Region.
Application:
12/617,434 →
Publication:
US 2010/0117156
Semiconductor Device
Application:
12/617,441 →
Publication:
US 2010/0117157
Semiconductor Laser and Manufacturing Process Thereof
Wiring Boad, Semiconductor Device in Which Wiring Board Is Used, and Method for Manufaturing the Same
Semiconductor Device and Method of Manufacturing Semiconductor Device
Application:
12/619,063 →
Publication:
US 2010/0133698
Nonvolatile Semiconductor Memory Device
Method of Manufacturing Porous Insulating Film, Method of Manufacturing Semiconductor Device, and Semiconductor Device
Semiconductor Device and Method of Manufacturing the Same
Layout of Memory Cells and Input/Output Circuitry in a Semiconductor Memory Device
Duty Detection Circuit, Duty Correction Circuit, and Duty Detection Method
Apparatus and Method of Supporting Design of Semiconductor Integrated Circuit
Application:
12/625,968 →
Publication:
US 2010/0138803
Terminal Resistance Device, Semiconductor Device, and Control Method for Terminal Resistance
Transmission-Line Transformer and Amplifier Unit Having the Same
Application:
12/628,695 →
Publication:
US 2010/0134229
Electronic Device and Process for Manufacturing Electronic Device
Microcomputer and Embedded Software Development System
Application:
12/631,277 →
Publication:
US 2010/0145672
Semiconductor Memory Device and Self Refresh Test Method
Map Drawing Device and Map Data Display Control Method
Semiconductor Device and Dummy Pattern Arrangement Method
Semiconductor Device
Field Effect Transistor
D/A Conversion Circuit
Data Processing Circuit
Application:
12/633,023 →
Publication:
US 2010/0146158
Voltage Regulator
Method and Apparatus for Modular Operation
Application:
12/634,157 →
Publication:
US 2010/0146029
Semiconductor Device and Method of Manufacturing the Same
Apparatus and Method for Data Process
Application:
12/636,218 →
Publication:
US 2010/0153688
Semiconductor Device
Semiconductor Device
Semiconductor Integrated Circuit
Semiconductor Device
Semiconductor Device and Control Method of Switch Transistor Thereof
Bolometer-Type Infrared Imaging Apparatus Including a One or Two Dimensional Sensor Array Semiconductor Device
Layout Verification Device, Layout Verification Program, and Layout Verification Method of Layout Pattern of Semiconductor Device
Impedance Adjusting Circuit
Semiconductor Memory
Semiconductor Memory Device
Optically Coupled Device with an Optical Waveguide
Interconnect Substrate, Method of Manufacturing Interconnect Substrate and Semiconductor Device
Can Node, and Communication Method of Communication System Including Can Node
Duty Control Buffer Circuit and Duty Correction Circuit
Source driver and drive method
Application:
12/654,203 →
Publication:
US 2010/0171731
Clock Data Recovery Circuit
Semiconductor Device and Method of Manufacturing Semiconductor Device
Video processing apparatus
Application:
12/654,244 →
Publication:
US 2010/0171884
Semiconductor Device Having Lead Free Solders Between Semiconductor Chip and Frame and Fabrication Method Thereof
Reference Voltage Generator Including Circuits for Switch, Current Source and Control
Display driving semiconductor device
Application:
12/654,247 →
Publication:
US 2010/0194730
Positioning Apparatus and Positioning Method
Semiconductor Integrated Circuit and Method of Saving and Restoring Internal State of the Same
Backlight Brightness Control for Panel Display Device Including Controlling a Brightness of the Backlight to Have a Variable Brightness in a Portion of a Period
Semiconductor Device Including a Test Circuit of a Multivalued Logic Circuit Having an Impedance Control
Driver circuit of display device
Application:
12/654,352 →
Publication:
US 2010/0182300
Voltage regulator circuit
Application:
12/654,353 →
Publication:
US 2010/0181972
Oscillation Circuit
Semiconductor Device and Operation Mode Switch Method
Signal voltage generation circuit, display panel driving device, and display apparatus
Application:
12/654,799 →
Publication:
US 2010/0182348
Booster Circuit and Pwm Signal Generator
Test circuit including tap controller selectively outputting test signal based on mode and shift signals
Impedance Measurement Method and Impedance Measurement Device
Ring buffer circuit and control circuit for ring buffer circuit
Electronic device
Application:
12/654,834 →
Publication:
US 2010/0176517
Controller driver, display device, and control method therefor
Operational amplifier, semiconductor device, and display device
Application:
12/654,836 →
Publication:
US 2010/0182301
DC/DC converter circuit
Application:
12/654,874 →
Publication:
US 2010/0181979
Display Driver Including Plurality of Amplifier Circuits Receiving Delayed Control Signal and Display Device
Semiconductor device
Application:
12/654,903 →
Publication:
US 2010/0270672
Optical Module and Process for Manufacturing the Same
Semiconductor device which exposes die pad without covered by interposer and its manufacturing method
Application:
12/654,928 →
Publication:
US 2010/0181658
Display-driver data line driving device
Application:
12/654,959 →
Publication:
US 2010/0182310
Operational Amplifier
Digital Phase-Locked Loop
Semiconductor Device Manufacturing Method, Wafer Treatment System, and Recording Medium
Device wire adapter and communication control method to perform data transfer between wireless USB host and wired USB device
Application:
12/654,989 →
Publication:
US 2010/0205334
Image processing apparatus, image processing method, and program
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 21, 2009
From: MIWA, HIDEYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023404/0901 →
Assignment of Assignor's Interest
Oct 22, 2009
From: UEDA, TAKEHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023410/0478 →
Assignment of Assignor's Interest
Oct 22, 2009
From: SAKURAI, MASATO; SAWAIRI, AKIHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023405/0983 →
Assignment of Assignor's Interest
Oct 22, 2009
From: HIROTA, TAKUYA; YANAGIDA, TAKAO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023410/0187 →
Assignment of Assignor's Interest
Oct 26, 2009
From: KAWANO, MASAYA; SOEJIMA, KOJI; TAKAHASHI, NOBUAKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023422/0519 →
Assignment of Assignor's Interest
Oct 26, 2009
From: INAGAWA, OSAMU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023422/0718 →
Assignment of Assignor's Interest
Oct 27, 2009
From: MORI, HIDEMITSU; TAKIMOTO, KAZUHIRO; SHOU, TOSHIYUKI; SASAKI, KENJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023430/0590 →
Assignment of Assignor's Interest
Nov 3, 2009
From: MIYA, TATSUYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023459/0706 →
Assignment of Assignor's Interest
Nov 4, 2009
From: HIBINO, KENJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023469/0104 →
Assignment of Assignor's Interest
Nov 4, 2009
From: SHIMOGAWA, KENJIYU; FURUTA, HIROSHI; NAGA, SHUNSAKU; SHIRAI, TAKAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023468/0035 →
Assignment of Assignor's Interest
Nov 6, 2009
From: HATANAKA, YUUKICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023483/0550 →
Assignment of Assignor's Interest
Nov 9, 2009
From: MIWA, HIDEYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023490/0610 →
Assignment of Assignor's Interest
Nov 10, 2009
From: OOKA, HIDEYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023495/0543 →
Assignment of Assignor's Interest
Nov 13, 2009
From: TAKAHASHI, KOUHEI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023514/0296 →
Assignment of Assignor's Interest
Nov 13, 2009
From: TSUTSUI, GEN; IMAI, KIYOTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023513/0243 →
Assignment of Assignor's Interest
Nov 30, 2009
From: HIROTA, KATSUHISA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023579/0972 →
Assignment of Assignor's Interest
Dec 7, 2009
From: KATO, HIROMU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023652/0729 →
Assignment of Assignor's Interest
Dec 30, 2009
From: OSHIDA, DAISUKE; KUNISHIMA, HIROYUKI; OKADA, NORIO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023716/0177 →
Assignment of Assignor's Interest
Jan 11, 2010
From: FUKUI, TADASHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023760/0115 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →