IP Library › Granted Patent US 12,298,663
Granted Patent B2
US 12,298,663 · App. 15/770,175 · Granted May 13, 2025

Method of manufacturing a pellicle for a lithographic apparatus, a pellicle for a lithographic apparatus, a lithographic apparatus, a device manufacturing method, an apparatus for processing a pellicle, and a method for processing a pellicle

Inventors: Mária Péter (Eindhoven, NL); Erik Achilles Abegg (Eindhoven, NL); Adrianus Johannes Maria Giesbers (Vlijmen, NL); Johan Hendrik Klootwijk (Eindhoven, NL); Maxim Aleksandrovich Nasalevich (Eindhoven, NL); Wilhelmus Theodorus Anthonius Johannes Van Den Einden (Deurne, NL); Willem Joan Van Der Zande (Bussum, NL); Pieter-Jan Van Zwol (Eindhoven, NL); Johannes Petrus Martinus Bernardus Vermeulen (Leende, NL); David Ferdinand Vles (Eindhoven, NL); Willem-Pieter Voorthuijzen ('s-Hertogenbosch, NL)
Assignee: ASML NETHERLANDS B.V.
G03F1/62G03F1/38G03F7/70958G03F7/70983G21K2201/067
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Quick Facts
Patent No.
US 12,298,663
App. No.
15/770,175
Granted
May 13, 2025
Kind
B2
Abstract

Methods of manufacturing a pellicle for a lithographic apparatus including a method involving depositing at least one graphene layer on a planar surface of a substrate. The substrate has a first substrate portion and a second substrate portion. The method further includes removing the first substrate portion to form a freestanding membrane from the at least one graphene layer. The freestanding membrane is supported by the second substrate portion.

Claims (24)

1. A pellicle for a lithographic apparatus, the pellicle comprising at its core at least 10, and no more than 50, adjoining layers of graphene layers, graphene-derivative layers, or a combination of graphene and graphene-derivative layers, forming a freestanding membrane supported by a planar surface of a portion of a substrate in a frame configuration, wherein the planar surface is located outside of the freestanding membrane when viewed in a direction perpendicular to the planar surface, wherein a continuous freestanding area of the freestanding membrane is at least 10 mm 2 , wherein the continuous freestanding area of the freestanding membrane has a maximum sag in use not exceeding 500 microns, wherein the continuous freestanding area of the freestanding membrane is at least 80% transparent to extreme ultraviolet radiation, and wherein a tension control layer to control a tension in the freestanding membrane is located along an outer edge of the freestanding membrane supported by the substrate in the frame configuration.

2. The pellicle of claim 1 , wherein the freestanding membrane comprises a capping layer on either or both sides of the at least 10 adjoining layers.

3. The pellicle of claim 2 , wherein the capping layer is configured to protect the at least 10 adjoining layers from chemical attack by radical species.

4. The pellicle of claim 2 , wherein the capping layer comprises a metal or metal oxide.

5. The pellicle of claim 4 , wherein the capping layer comprises one or more materials selected from: Ru, Mo, B, MoSi 2 , h-BN, HfO 2 , ZrO 2 , Y 2 O 3 , Nb 2 O 5 , La 2 O 3 , Al 2 O 3 .

6. The pellicle of claim 2 , wherein an adhesion layer is provided between the capping layer and the at least 10 adjoining layers.

7. The pellicle of claim 1 , wherein the freestanding membrane comprises a sequence of layers having different chemical compositions, wherein the sequence comprises the at least 10 adjoining layers and at least one layer of a two-dimensional material other than graphene.

8. The pellicle of claim 7 , wherein the at least one layer of a two-dimensional material other than graphene comprises at least one layer of one or more selected from: graphyne, borophene, silicene, stanene, phosphorene, molybdenite, graphane, h-BN, germanane, a layered transition metal carbide and/or carbonitride, and/or a transition metal dichalcogenide.

9. The pellicle of claim 2 , wherein the capping layer comprises at least one layer of a two-dimensional material other than graphene.

10. The pellicle of claim 7 , wherein the portion of the substrate comprises a material comprising Mo, Ru, Pt, Ti, V, Nb, Hf, Ta, W, Fe, Co, Ni or Cu.

11. A patterning device assembly suitable for use in a lithographic process, the patterning device assembly comprising:

a patterning device configured to output patterned radiation; and

the pellicle according to claim 1 .

12. A pellicle for a lithographic apparatus, the pellicle comprising at least one graphene or graphene derivative layer forming a freestanding membrane supported by a planar surface of a portion of a substrate on which the at least one graphene or graphene derivative layer was grown, the planar surface being located outside of the freestanding membrane when viewed in a direction perpendicular to the planar surface, the planar surface having a root mean squared roughness of less than 5 nm, and the planar surface comprising one or more selected from: Mo, Ru, Pt, V, Zr, Nb, Hf, Ta, W, silicized Mo, silicized Ru, silicized Pt, silicized Ti, silicized V, silicized Zr, silicized Nb, silicized Hf, silicized Ta, silicized W, silicized Cr, carbide of Mo, carbide of Ru, carbide of Pt, carbide of Ti, carbide of V, carbide of Zr, carbide of Nb, carbide of Hf, carbide of Ta, carbide of W, and/or carbide of Cr.

13. The pellicle of claim 12 , wherein the freestanding membrane comprises a capping layer on either or both sides of the at least one graphene or graphene derivative layer.

14. The pellicle of claim 12 , wherein the substrate has a layer on a surface that is at an angle to the planar surface.

15. The pellicle of claim 12 , wherein the portion of the substrate comprises a material comprising Mo, Ru, Pt, Ti, V, Nb, Hf, Ta, W, Fe, or Co.

16. A patterning device assembly suitable for use in a lithographic process, the patterning device assembly comprising:

a patterning device configured to output patterned radiation; and

the pellicle according to claim 12 .

17. A pellicle for a lithographic apparatus, the pellicle comprising at least one graphene or graphene derivative layer forming a freestanding membrane supported by a planar surface of a portion of a substrate in a frame configuration, the planar surface being located outside of the freestanding membrane when viewed in a direction perpendicular to the planar surface, and the portion of the substrate comprising a layer of material, between the substrate and the graphene or graphene derivative layer, onto which the graphene or graphene derivative layer was grown and which does not cover the freestanding membrane, the material comprising one or more selected from: Mo, Ru, Pt, V, Zr, Nb, Hf, Ta, W, silicized Mo, silicized Ru, silicized Pt, silicized Ti, silicized V, silicized Zr, silicized Nb, silicized Hf, silicized Ta, silicized W, silicized Cr, carbide of Mo, carbide of Ru, carbide of Pt, carbide of Ti, carbide of V, carbide of Zr, carbide of Nb, carbide of Hf, carbide of Ta, carbide of W, and/or carbide of Cr and wherein a tension control layer to control a tension in the freestanding membrane is located along an outer edge of the freestanding membrane supported by the substrate in the frame configuration.

18. The pellicle of claim 17 , wherein the freestanding membrane comprises a capping layer on either or both sides of the at least one graphene or graphene derivative layer.

19. The pellicle of claim 17 , wherein the substrate has a layer on a surface that is at an angle to the planar surface.

20. The pellicle of claim 17 , further comprising a layer on the side of the at least one graphene or graphene derivative layer opposite to the side of the graphene or graphene derivative layer facing the planar surface of the portion of the substrate.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: PÉTER, MÁRIA; VOORTHUIJZEN, WILLEM-PIETER; GIESBERS, ADRIANUS JOHANNES MARIA; KLOOTWIJK, JOHAN HENDRIK; VAN DEN EINDEN, WILHELMUS THEODORUS ANTHONIUS JOHANNES
To: ASML NETHERLANDS B.V.
Reel/Frame 046102/0207 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: PÉTER, MÁRIA; VOORTHUIJZEN, WILLEM-PIETER; GIESBERS, ADRIANUS JOHANNES MARIA; VLES, DAVID FERDINAND; KLOOTWIJK, JOHAN HENDRIK; VERMEULEN, JOHANNES PETRUS MARTINUS BERNARDUS; VAN DEN EINDEN, WILHELMUS THEODORUS ANTHONIUS JOHANNES; VAN ZWOL, PIETER-JAN
To: ASML NETHERLANDS B.V.
Reel/Frame 046102/0218 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: PÉTER, MÁRIA; ABEGG, ERIK ACHILLES; GIESBERS, ADRIANUS JOHANNES MARIA; KLOOTWIJK, JOHAN HENDRIK; NASALEVICH, MAXIM ALEKSANDROVICH; VAN DEN EINDEN, WILHELMUS THEODORUS ANTHONIUS JOHANNES; VAN DER ZANDE, WILLEM JOAN; VAN ZWOL, PIETER-JAN; VERMEULEN, JOHANNES PETRUS MARTINUS BERNARDUS; VLES, DAVID FERDINAND; VOORTHUIJZEN, WILLEM-PIETER
To: ASML NETHERLANDS B.V.
Reel/Frame 046102/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: PÉTER, MÁRIA; ABEGG, ERIK ACHILLES; GIESBERS, ADRIANUS JOHANNES MARIA; KLOOTWIJK, JOHAN HENDRIK; NASALEVICH, MAXIM ALEKSANDROVICH; VAN DEN EINDEN, WILHELMUS THEODORUS ANTHONIUS JOHANNES; VAN DER ZANDE, WILLEM JOAN; VAN ZWOL, PIETER-JAN; VERMEULEN, JOHANNES PETRUS MARTINUS BERNARDUS; VLES, DAVID FERDINAND; VOORTHUIJZEN, WILLEM-PIETER
To: ASML NETHERLANDS B.V.
Reel/Frame 046102/0258 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2018
From: PÉTER, MÁRIA; ABEGG, ERIK ACHILLES; GIESBERS, ADRIANUS JOHANNES MARIA; KLOOTWIJK, JOHAN HENDRIK; NASALEVICH, MAXIM ALEKSANDROVICH; VAN DEN EINDEN, WILHELMUS THEODORUS ANTHONIUS JOHANNES; VAN DER ZANDE, WILLEM JOAN; VAN ZWOL, PIETER-JAN; VERMEULEN, JOHANNES PETRUS MARTINUS BERNARDUS; VLES, DAVID FERDINAND; VOORTHUIJZEN, WILLEM-PIETER
To: ASML NETHERLANDS B.V.
Reel/Frame 046384/0016 →
Priority Claims (4)
EP 15191052 · Oct 22, 2015 · regional
EP 16156637 · Feb 22, 2016 · regional
EP 16170384 · May 19, 2016 · regional
EP 16186851 · Sep 1, 2016 · regional
Continuity (1)
Related Publication 20190056654A1 · Feb 21, 2019
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