IP Library › Granted Patent US 12,495,619
Granted Patent B2
US 12,495,619 · App. 18/388,883 · Granted Dec 9, 2025

Semiconductor device and method for manufacturing the same

Inventors: Junichi Koezuka (Tochigi, JP); Yukinori Shima (Gunma, JP); Hajime Tokunaga (Kanagawa, JP); Toshinari Sasaki (Tokyo, JP); Keisuke Murayama (Kanagawa, JP); Daisuke Matsubayashi (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H10D99/00H01L21/022H01L21/02263H10D30/6706H10D30/6755H10D64/685H10D86/423H10D86/60
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Quick Facts
Patent No.
US 12,495,619
App. No.
18/388,883
Granted
Dec 9, 2025
Kind
B2
Abstract

To reduce defects in an oxide semiconductor film in a semiconductor device. To improve the electrical characteristics and the reliability of a semiconductor device including an oxide semiconductor film. In a semiconductor device including a transistor including a gate electrode formed over a substrate, a gate insulating film covering the gate electrode, a multilayer film overlapping with the gate electrode with the gate insulating film provided therebetween, and a pair of electrodes in contact with the multilayer film, a first oxide insulating film covering the transistor, and a second oxide insulating film formed over the first oxide insulating film, the multilayer film includes an oxide semiconductor film and an oxide film containing In or Ga, the first oxide insulating film is an oxide insulating film through which oxygen is permeated, and the second oxide insulating film is an oxide insulating film containing more oxygen than that in the stoichiometric composition.

Claims (82)

1 . A display device comprising:

a substrate;

a first wiring over the substrate, the first wiring comprising a first region configured to function as a gate electrode;

a gate insulating film over the gate electrode;

an oxide semiconductor film over and overlapping with the gate electrode with the gate insulating film provided therebetween;

an oxide film comprising indium over and in contact with the oxide semiconductor film;

a second wiring electrically connected to the oxide semiconductor film, the second wiring comprising a second region configured to function as one of a source electrode and a drain electrode;

a conductive film electrically connected to the oxide semiconductor film, the conductive film comprising a third region configured to function as the other of the source electrode and the drain electrode;

an oxide insulating film over the source electrode and the drain electrode;

a nitride insulating film over the oxide insulating film;

an organic resin film over the nitride insulating film;

an insulating film over and in contact with the organic resin film;

a first electrode in contact with the conductive film in a first opening provided in the oxide insulating film and the nitride insulating film, a second opening provided in the organic resin film, and a third opening provided in the insulating film;

a second electrode comprising a fourth region overlapping with the first electrode with the insulating film provided therebetween;

a spacer; and

a liquid crystal layer over the second electrode,

wherein, in a top view, the spacer overlaps with the first wiring and the second wiring,

wherein the first electrode is configured to function as a pixel electrode,

wherein the second electrode is configured to function as a common electrode,

wherein the second electrode is in contact with a top surface of the organic resin film,

wherein the insulating film is in contact with a bottom surface of the first electrode,

wherein the insulating film is in contact with the nitride insulating film,

wherein the fourth region, in which the second electrode overlaps with the first electrode with the insulating film provided therebetween, overlaps with the oxide semiconductor film and the oxide film comprising indium, and

wherein each of the first electrode and the second electrode comprises indium, tin, and oxygen.

2 . The display device according to claim 1 ,

wherein the oxide semiconductor film comprises indium, gallium, and zinc, and

wherein, in a cross-sectional view, the second region is in contact with a side surface of the oxide semiconductor film.

3 . The display device according to claim 1 ,

wherein the oxide semiconductor film comprises indium, and

wherein an atomic ratio of the indium in the oxide semiconductor film is different from the atomic ratio of the indium in the oxide film comprising indium.

4 . A display device comprising:

a substrate;

a first wiring over the substrate, the first wiring comprising a first region configured to function as a gate electrode;

a gate insulating film over the gate electrode;

an oxide semiconductor film over and overlapping with the gate electrode with the gate insulating film provided therebetween;

an oxide film comprising indium over and in contact with the oxide semiconductor film;

a second wiring electrically connected to the oxide semiconductor film, the second wiring comprising a second region configured to function as one of a source electrode and a drain electrode;

a conductive film electrically connected to the oxide semiconductor film, the conductive film comprising a third region configured to function as the other of the source electrode and the drain electrode;

an oxide insulating film over the source electrode and the drain electrode;

a nitride insulating film over the oxide insulating film;

an organic resin film over the nitride insulating film;

an insulating film over and in contact with the organic resin film;

a first electrode in contact with the conductive film in a first opening provided in the oxide insulating film and the nitride insulating film, a second opening provided in the organic resin film, and a third opening provided in the insulating film;

a second electrode comprising a fourth region overlapping with the first electrode with the insulating film provided therebetween;

a spacer; and

a liquid crystal layer over the second electrode,

wherein, in a top view, the spacer overlaps with the first wiring and the second wiring,

wherein the first electrode is configured to function as a pixel electrode,

wherein the second electrode is configured to function as a common electrode,

wherein the second electrode is in contact with a top surface of the organic resin film, and

wherein the insulating film is in contact with the nitride insulating film.

5 . The display device according to claim 4 ,

wherein the oxide semiconductor film comprises indium, gallium, and zinc, and

wherein, in a cross-sectional view, the second region is in contact with a side surface of the oxide semiconductor film.

6 . The display device according to claim 4 ,

wherein the oxide semiconductor film comprises indium, and

wherein an atomic ratio of the indium in the oxide semiconductor film is different from the atomic ratio of the indium in the oxide film comprising indium.

7 . A display device comprising:

a substrate;

a first wiring over the substrate, the first wiring comprising a first region configured to function as a gate electrode;

a gate insulating film over the gate electrode;

an oxide semiconductor film over and overlapping with the gate electrode with the gate insulating film provided therebetween;

a second wiring electrically connected to the oxide semiconductor film, the second wiring comprising a second region configured to function as one of a source electrode and a drain electrode;

a conductive film electrically connected to the oxide semiconductor film, the conductive film comprising a third region configured to function as the other of the source electrode and the drain electrode;

an oxide insulating film over the source electrode and the drain electrode;

a nitride insulating film over the oxide insulating film;

an organic resin film over the nitride insulating film;

an insulating film over and in contact with the organic resin film;

a first electrode in contact with the conductive film;

a second electrode comprising a fourth region overlapping with the first electrode with the insulating film provided therebetween;

a spacer; and

a liquid crystal layer over the second electrode.

8 . The display device according to claim 7 ,

wherein the oxide semiconductor film comprises indium, gallium, and zinc, and

wherein, in a cross-sectional view, the second region is in contact with a side surface of the oxide semiconductor film.

9 . The display device according to claim 7 ,

wherein the first electrode is in contact with the conductive film in a first opening provided in the oxide insulating film and the nitride insulating film, a second opening provided in the organic resin film, and a third opening provided in the insulating film,

wherein, in a top view, the spacer overlaps with the first wiring and the second wiring,

wherein the first electrode is configured to function as a pixel electrode,

wherein the second electrode is configured to function as a common electrode,

wherein the second electrode is in contact with a top surface of the organic resin film, and

wherein the insulating film is in contact with the nitride insulating film.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2023
From: KOEZUKA, JUNICHI; SHIMA, YUKINORI; TOKUNAGA, HAJIME; SASAKI, TOSHINARI; MURAYAMA, KEISUKE; MATSUBAYASHI, DAISUKE
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 065537/0582 →
Priority Claims (4)
JP 2012-234602 · Oct 24, 2012 · national
JP 2012-234606 · Oct 24, 2012 · national
JP 2012-286826 · Dec 28, 2012 · national
JP 2013-051659 · Mar 14, 2013 · national
Continuity (6)
Continuation 17227450 · Apr 12, 2021
Continuation 16878758 · May 20, 2020
Continuation 16429176 · Jun 3, 2019
Continuation 15150587 · May 10, 2016
Division 14060925 · Oct 23, 2013
Related Publication 20240079479A1 · Mar 7, 2024
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