Patent Assignment
Reel/Frame 013736/0321
Assignment of Assignor's Interest
Recorded: 2003-02-19
Received: 2003-02-21
Pages: 6
Assignor
NEC CORPORATION
Executed: 2002-11-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JPX, JAPAN
Covered Properties
(68)
Phase-Locked Loop Circuit of Fractional Frequency -Dividing Type
Application:
10/349,990 →
Image Display Device and Method for Driving the Same
Application:
10/212,452 →
Optical Disk Device Using a New Alternate List for Defect Correction
Application:
10/186,586 →
Semiconductor Device Having an Esd Protective Circuit
Application:
10/178,657 →
Applying apparatus and method of controlling film thickness for enabling uniform thickness
Application:
10/171,250 →
Image data processing method
Application:
10/155,258 →
Phase-shifting mask and method of fabricating the same
Application:
10/152,268 →
Semiconductor device and fabrication process therefor
Application:
10/145,477 →
Method of Designing Integrated Circuit Using Hierarchical Design Technique
Application:
10/136,414 →
Current Mirror Circuit and Analog-Digital Converter
Application:
10/104,761 →
Voltage Controlled Oscillator with Frequency Stabilized and Pll Circuit Using the Same
Application:
10/104,859 →
Semiconductor Device
Application:
10/100,847 →
Semiconductor Device
Application:
10/100,846 →
Semiconductor Memory and Process for Fabricating the Same
Application:
10/100,336 →
Cmos Reference Voltage Circuit
Application:
10/091,776 →
Arithmetic Operation Method for Cyclic Redundancy Check and Arithmetic Operation Circuit for Cyclic Redundancy Check
Application:
10/090,302 →
Negative Voltage Boosting Circuit
Application:
10/080,194 →
Digital Signal Processing Apparatus
Application:
10/077,164 →
Semiconductor Device Having Interconnection Implemented by Refractory Metal Nitride Layer and Refractory Metal Silicide Layer and Process of Fabrication Thereof
Application:
10/074,936 →
Reference Current Circuit and Reference Voltage Circuit
Application:
10/071,022 →
Method for Forming an Interconnect Pattern in a Semiconductor Device
Application:
10/059,647 →
Electron Beam Projection Mask
Application:
10/055,689 →
Semiconductor Memory Device for Reducing Number of Input Cycles for Inputting Test Pattern
Application:
10/052,144 →
Semiconductor device and manufacturing method the same
Application:
10/052,143 →
Solid-State Image Sensor Provided with Divided Photoelectric Conversion Part
Application:
10/047,155 →
Scan Flip-Flop Circuit Capable of Guaranteeing Normal Operation
Application:
10/033,438 →
Semiconductor device and method of fabricating the same
Application:
10/036,955 →
Clock and Data Recovery Circuit and Clock Control Method
Application:
10/022,551 →
Optical Proximity Effect Correcting Method and Mask Data Forming Method in Semiconductor Manufacturing Process, Which Can Sufficiently Correct Optical Proximity Effect, Even Under Various Situations with Regard to Size and Shape of Design Pattern, and Space Width A
Application:
10/011,421 →
Optical proximity effect correcting method and mask data forming method in semiconductor manufacturing process, which can sufficiently correct optical proximity effect, even under various situations with regard to size and shape of design pattern, and space width and position relation between design patterns
Application:
10/011,420 →
Clock Control Circuit and Method
Application:
09/995,517 →
Method of Performing Timing-Driven Layout
Application:
09/995,518 →
Clock Controlling Method and Clock Control Circuit
Application:
09/990,781 →
Alignment marks
Application:
10/035,520 →
Synchronous Signal Generation Circuit and Synchronous Signal Generation Method
Application:
09/965,203 →
Capacitor-Array D/a Converter Including a Thermometer Decoder and a Capacitor Array
Application:
09/963,063 →
Output Buffer Circuit
Application:
09/952,426 →
Charge Transfer Device
Application:
09/942,143 →
Resin encapsulated BGA-type semiconductor device
Application:
09/940,249 →
Method for Forming a Silicide Layer
Application:
09/940,247 →
Method of Fabricating Semiconductor Device Having Trench Interconnection
Application:
09/921,050 →
Method of Forming a Semiconductor Device and an Improved Deposition System
Application:
09/919,389 →
Semiconductor Device, a Charge Pump Circuit and a Pll Circuit That Can Suppress a Switching Noise
Application:
09/915,725 →
Semiconductor element, manufacturing method thereof and BGA-type semiconductor device
Application:
09/915,728 →
Semiconductor Integrated Circuit Device with Level Shift Circuit
Application:
09/912,034 →
A Method of Manufacturing a Multi-Level Interconnection Structure
Application:
09/910,994 →
Clock Controlling Method and Circuit
Application:
09/910,117 →
Reticle System for Measurement of Effective Coherence Factors
Application:
09/907,039 →
Solid State Image Pick-Up Device
Application:
09/907,036 →
Slew Rate Adjusting Circuit
Application:
09/904,283 →
Semiconductor Device Having Definite Size of Input/Output Blocks and Its Designing Method
Application:
09/899,351 →
High Integration-Capable Output Buffer Circuit Unaffected by Manufacturing Process Fluctuations or Changes in Use
Application:
09/884,757 →
Semiconductor memory device and manufacturing method therefor
Application:
09/883,702 →
Method of Manufacturing Semiconductor Device
Application:
09/876,207 →
Variable Drive Current Driver Circuit
Application:
09/874,737 →
Method for manufacturing semiconductor devices
Application:
09/872,683 →
Timing Difference Division Circuit and Signal Controlling Method and Apparatus
Application:
09/864,735 →
Stencil Mask and Method for Manufacturing Same
Application:
09/859,634 →
Semiconductor Device
Application:
09/851,472 →
Method for avoiding excessive overhead while using a form of SSA (static single assignment) extended to use storage locations other than local variables
Application:
09/837,731 →
Air-Tight Vessel Equipped with Gas Feeder Uniformly Supplying Gaseous Component Around Plural Wafers
Application:
09/819,516 →
Resin-Molding Method, Molding Dies and Circuit Base Member
Application:
09/781,789 →
System, Process, Apparatus and Program for Controlling Special Lot Carrying in Semiconductor Carrying Facility
Application:
09/775,903 →
A Voltage Controlled Oscillator with Delay Circuits
Application:
09/769,539 →
Anticorrosive Agent
Application:
09/769,545 →
Semiconductor Device and Process for Producing the Same
Application:
09/770,114 →
Semiconductor Devices Having Different Package Sizes Made by Using Common Parts
Application:
09/767,761 →
Photomask and Pattern Forming Method Used in a Thermal Flow Process and Semiconductor Integrated Circuit Fabricated Using the Thermal Flow Process
Application:
09/757,841 →