IP Library › Assignment 025172/0946
Patent Assignment
Reel/Frame 025172/0946

Change of Name

Recorded: 2010-10-21 Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties (92)
Signal Processing Circuit for Solid State Image Sensor Having a Structure for Suppressing a Reset Noise
Patent: 5,966,172 →
Application: 08/627,066 →
Cleaning Method and System of Semiconductor Substrate and Production Method of Cleaning Solution
Patent: 6,116,254 →
Application: 08/627,242 →
Logic Circuit for a Semiconductor Memory Device
Patent: 5,804,989 →
Application: 08/627,343 →
Field Effect Transistor and Method of Fabricating the Same
Patent: 6,373,081 →
Application: 08/630,128 →
Method for Fabricating Semiconductor Device Having Buried Contact Structure
Patent: 5,731,225 →
Application: 08/634,402 →
Semiconductor Device with Contacts Formed in Self-Alignment
Patent: 5,989,951 →
Application: 08/634,414 →
Highly-Integrated Thin Film Capacitor with High Dielectric Constant Layer
Patent: 5,883,781 →
Application: 08/635,872 →
Non-Volatile Semiconductor Memory Device
Patent: 5,691,944 →
Application: 08/636,149 →
Operational Amplifier Incorporating Current Matrix Type Digital-to-Analog Converter
Patent: 5,706,006 →
Application: 08/636,189 →
Semiconductor Device with Increased Multi-Bumps and Adhered Multilayered Insulating Films and Method for Installing Same
Patent: 5,757,078 →
Application: 08/637,281 →
Power Semiconductor Device Having Improved Reverse Recovery Voltage
Patent: 5,686,750 →
Application: 08/639,433 →
Semiconductor Device with Multi-Level Structured Insulator and Fabrication Method Thereof
Patent: 6,037,651 →
Application: 08/644,166 →
Method for Cleaning a Semiconductor Wafer with an Improved Cleaning Solution
Patent: 5,814,157 →
Application: 08/645,812 →
Hydrogen Fluoride Vapor Phase Selective Etching Meethod for Fabricating Semiconductor Devices
Patent: 5,922,623 →
Application: 08/646,967 →
Nhort Wavelength Laser Emitting Diode with an Improved Gan System Double Heterostructure
Patent: 5,742,628 →
Application: 08/650,439 →
Nonvolatile Semiconductor Memory Utilizing Polarization of Ferroelectric Material
Patent: 6,515,322 →
Application: 08/650,948 →
Method for Fabricating Semiconductor Device with Polycide Structure for Electrode or Interconnect
Patent: 6,074,925 →
Application: 08/653,327 →
Microprocessor with Multiple Supervisor Interrupt Processing Function
Patent: 5,701,494 →
Application: 08/653,486 →
Pick-Up Apparatus and Method for Semiconductor Chips
Patent: 5,946,408 →
Application: 08/654,926 →
Pick-Up Apparatus and Method for Semiconductor Devices
Patent: 5,946,409 →
Application: 08/654,927 →
Electrostatic Protection Circuit Comprising Plurality of Protective Elements
Patent: 5,724,219 →
Application: 08/655,188 →
Communication Control Device and Method for Use in an Atm System Operable in an Abr Mode
Patent: 5,875,173 →
Application: 08/655,219 →
Semiconductor Device with Electromagnetic Radiation Reduced
Patent: 5,708,372 →
Application: 08/658,411 →
Semiconductor Device Provided with a Level Conversion Means for Enabling a Connection Between Logic Circuits
Patent: 5,726,938 →
Application: 08/662,710 →
Method for Manufacturing of a Semiconductor Device
Patent: 5,753,533 →
Application: 08/663,599 →
Plasma Processing Apparatus
Patent: 5,911,852 →
Application: 08/663,640 →
Latching Circuit Capable of Rapid Operation with Low Electric Power
Patent: 5,812,002 →
Application: 08/664,006 →
Color Linear Image Sensor
Patent: 5,767,901 →
Application: 08/664,180 →
Non-Volatile Semiconductor Memory
Patent: 5,742,615 →
Application: 08/667,145 →
Salicide Process for Selectively Forming a Monocobalt Disilicide Film on a Silicon Region
Patent: 5,780,361 →
Application: 08/667,647 →
Semiconductor Integrated System Comprising an Output Voltage Level-Selecting Circuit
Patent: 5,712,586 →
Application: 08/669,181 →
Delay Optimizing Method in Logic Circuit Designing
Patent: 5,764,528 →
Application: 08/670,128 →
Nonvolatile Semiconductor Memory Having an Improved Reference Voltage Generating Circuit
Patent: 5,659,503 →
Application: 08/670,998 →
Inductance Reduced Wire-Bonding Type Semiconductor Device
Patent: 5,798,571 →
Application: 08/674,721 →
Buffer Device with Resender
Patent: 5,619,653 →
Application: 08/676,101 →
Frequency Converter Circuit Structure Having Two Sources
Patent: 5,751,033 →
Application: 08/676,914 →
Semiconductor Device
Patent: 5,693,979 →
Application: 08/677,335 →
Data Processor Having Bus Controller for Controlling a Plurality of Buses Independently of Each Other
Patent: 5,889,966 →
Application: 08/679,128 →
Method of Producing Semiconductor Device Having Buried Contact Structure
Patent: 5,804,505 →
Application: 08/679,489 →
Electron Beam Cell Projection Lithography Method for Correcting Coulomb Interaction Effects
Patent: 5,808,310 →
Application: 08/680,643 →
Delay Circuit Using Capacitor and Transistor
Patent: 5,767,719 →
Application: 08/680,975 →
Input Buffer Circuit with Hysteresis for Noise Control
Patent: 5,796,281 →
Application: 08/681,358 →
Semiconductor Device with Zener Diode for Gate Protection, and Method for Fabricating the Same
Patent: 5,736,779 →
Application: 08/681,960 →
Current Sensing Circuit
Patent: 5,670,867 →
Application: 08/685,950 →
Input/Output Protection Device for Use in Semiconductor Device
Patent: 5,717,559 →
Application: 08/686,545 →
Semiconductor Device Including Input Buffer Circuit Capable of Amplifying Input Signal with Low Amplitude in High Speed and Under Low Current Consumption
Patent: 5,900,745 →
Application: 08/687,964 →
Method of Calculating a Parasitic Load in a Semiconductor Integrated Circuit
Patent: 5,847,967 →
Application: 08/688,736 →
Semiconductor Memory Device Including Divisional Decoder Circuit Composed of Nmos Transistors
Patent: 5,652,731 →
Application: 08/691,591 →
Pipeline Data Processing Apparatus of Reduced Circuit Scale
Patent: 5,931,942 →
Application: 08/691,871 →
Plasma Generating Apparatus Used for Fabrication of Semiconductor Device
Patent: 5,810,932 →
Application: 08/692,283 →
Method for Selective Growth of Silicon Epitaxial Film
Patent: 5,861,059 →
Application: 08/694,936 →
Nigh Speed and High Accuracy a/D Converter
Patent: 5,736,951 →
Application: 08/696,601 →
High-Speed Read-Out Semiconductor Memory
Patent: 5,642,319 →
Application: 08/697,860 →
Image Processing System and Method for Converting Ycbcr Data Composed of Luminanace and Chroma into Rgb Data of Three Primary Colors
Patent: 5,671,022 →
Application: 08/698,029 →
Semiconductor Device with Reduced Aspect Ratio Contact Hole
Patent: 5,847,444 →
Application: 08/705,840 →
Positioning/Wiring Method for Flip-Chip Semiconductor Device
Patent: 5,946,477 →
Application: 08/705,856 →
Semiconductor Memory Device That Converges a Floating Gate Threshold Voltage to a Predetermined Positive Value During Data Erasure
Patent: 5,831,304 →
Application: 08/706,531 →
Semiconductor Memory Device Having the Same Access Timing Over Clock Cycles
Patent: 6,038,648 →
Application: 08/707,386 →
High Speed Semiconductor Memory with Burst Mode
Patent: 5,835,443 →
Application: 08/708,759 →
Microcomputer Having a Region Definable by User
Patent: 5,649,219 →
Application: 08/708,884 →
Semiconductor Memory and Method for Substituting a Redundancy Memory Cell
Patent: 5,684,740 →
Application: 08/715,409 →
Semiconductor Device Having Sige Spacer Under an Active Layer
Patent: 5,955,745 →
Application: 08/716,032 →
Subscriber Line Interface Circuit Capable of Realizing by a C-Mos Circuit
Patent: 5,734,714 →
Application: 08/718,181 →
Semiconductor Integrated Circuit Device Equipped with Protective System for Directly Discharging Surge Voltage from Pad to Discharge Line
Patent: 5,875,086 →
Application: 08/718,227 →
Method for Forming Amorphous Carbon Thin by Plasma Chemical Vapor Deposition
Patent: 6,071,797 →
Application: 08/719,958 →
Non-Volatile Semiconductor Memory Device
Patent: 5,834,808 →
Application: 08/719,984 →
Stacked Capacitor Having a Corrugated Electrode
Patent: 5,835,337 →
Application: 08/723,274 →
Edge Detection Circuit for Detecting Edge of Input Signal Without Erroneous Detection
Patent: 5,732,090 →
Application: 08/723,960 →
Reference Current Generating Circuit
Patent: 6,377,113 →
Application: 08/729,399 →
Output Circuit with Overvoltage Protection
Patent: 5,864,245 →
Application: 08/730,603 →
Semiconductor Memory Device Having Small Chip Size and Redundancy Access Time
Patent: 5,841,708 →
Application: 08/731,742 →
Polishing Device Having a Pad Which Has Grooves and Holes
Patent: 5,725,420 →
Application: 08/731,916 →
Method for Fabricating Semiconductor Device with Planarization Step Using Cmp
Patent: 5,733,818 →
Application: 08/734,025 →
A Semiconductor Device Having an Integrated Differential Circuit with an Improved Common-Mode Rejection Ratio (Cmrr)
Patent: 5,773,872 →
Application: 08/735,550 →
Input Circuit for Mode Setting
Patent: 5,764,075 →
Application: 08/736,498 →
Semiconductor Device Having a Polysillicon Resistor Element with Increased Stability and Method of Fabricating Same
Patent: 5,751,050 →
Application: 08/736,506 →
Color Linear Image Sensor Having a Reduced Distance Between Photosensor Arrays
Patent: 5,703,640 →
Application: 08/739,041 →
Semicoonductor Device Having an Organic Resin Layer and Silicon Oxide Layer Containing Fluorine for Preventing Crosstalk Between Metal Lines and a Method of Manufacturing the Same
Patent: 5,939,771 →
Application: 08/739,746 →
Method for Manufacturing Completely Circular Semiconductor Wafers
Patent: 5,716,876 →
Application: 08/739,891 →
"Cmos Integrated Circuit Testing Method and Apparatus Using Quiescent Power Supply Currents Database"
Patent: 5,939,894 →
Application: 08/741,424 →
Synchronous Semiconductor Memory Having a Write Execution Time Dependent Upon a Cycle Time
Patent: 5,867,447 →
Application: 08/745,821 →
Flash Memory Incorporating Microcomputer Having on-Board Writing Function
Patent: 5,872,994 →
Application: 08/745,828 →
Polishing Apparatus Having Retainer Ring Rounded Along Outer Periphery of Lower Surface and Method of Regulating Retainer Ring to Appropriate Configuration
Patent: 5,944,590 →
Application: 08/746,215 →
Method of Forming Shallow Diffusion Layers in a Semiconductor Substrate in the Vicinity of a Gate Electrode
Patent: 5,915,196 →
Application: 08/746,486 →
Buried-Channel Mos Transistor and Process of Producing Same
Patent: 5,719,430 →
Application: 08/747,745 →
Non-Volatile Semiconductor Memory Device Having Nand Structure Cells
Patent: 5,798,547 →
Application: 08/748,278 →
Semiconductor Integrated Circuit Device
Patent: 5,828,107 →
Application: 08/748,495 →
Cmos Semiconductor Device with Improved Layout of Transistors Near Lcd Drive Terminals
Patent: 5,883,415 →
Application: 08/749,942 →
Inspection Method and Wiring Current Observation Method for Semiconductor Device
Patent: 6,066,956 →
Application: 08/751,725 →
Non-Volatile Storage Device
Patent: 5,784,316 →
Application: 08/753,373 →
Process of Selectively Producing Refractory Metal Silicide Uniform in Thickness Regardless of Conductivity Type of Silicon Thereunder
Patent: 6,033,978 →
Application: 08/754,519 →
Resin Sealing Mold Die Set with Less Resin Remainder for Semiconductor Device
Patent: 5,766,649 →
Application: 08/754,806 →
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 1, 1996
From: SHIRAMIZU, YOSHIMI
To: NEC CORPORATION
Reel/Frame 007982/0678 →
Assignment of Assignor's Interest Apr 1, 1996
From: SATO, FUMIHIKO
To: NEC CORPORATION
Reel/Frame 007967/0633 →
Assignment of Assignor's Interest Apr 10, 1996
From: MORIKAWA, JUNKO; TAKAHASHI, HIDEMASA; ASANO, KAZUNORI
To: NEC CORPORATION
Reel/Frame 007963/0428 →
Assignment of Assignor's Interest Apr 18, 1996
From: YAMAMORI, ATSUSHI
To: NEC CORPORATION
Reel/Frame 007960/0884 →
Assignment of Assignor's Interest Apr 18, 1996
From: TAKAHASHI, TOSHIFUMI
To: NEC CORPORATION
Reel/Frame 007994/0328 →
Assignment of Assignor's Interest Apr 18, 1996
From: YAMAMICHI, SHINTARO; LESAICHERRE, PIERRE YVES
To: NEC CORPORATION
Reel/Frame 007975/0292 →
Assignment of Assignor's Interest Apr 22, 1996
From: KONDOH, ICHIRO
To: NEC CORPORATION
Reel/Frame 008242/0360 →
Assignment of Assignor's Interest Apr 24, 1996
From: MATSUDA, SHUICHI; SHOJI, KAZUTAKA
To: NEC CORPORATION
Reel/Frame 007973/0518 →
Assignment of Assignor's Interest May 8, 1996
From: TSUTSUI, HIROAKI; MATSUMURA, TAKAO; OIKAWA, HIROKAZU; YOKOI, MASAYUKI
To: NEC CORPORATION
Reel/Frame 008007/0245 →
Assignment of Assignor's Interest May 20, 1996
From: FUJII, HIROAKI
To: NEC CORPORATION
Reel/Frame 008057/0234 →
Assignment of Assignor's Interest May 24, 1996
From: SATOH, SHUJI
To: NEC CORPORATION
Reel/Frame 008025/0164 →
Assignment of Assignor's Interest May 24, 1996
From: AISOU, FUMIKI
To: NEC CORPORATION
Reel/Frame 008247/0315 →
Assignment of Assignor's Interest May 29, 1996
From: HORI, NOBUHIRO
To: NEC CORPORATION
Reel/Frame 008026/0218 →
Assignment of Assignor's Interest May 29, 1996
From: HONDA, MOTOHARU
To: NEC CORPORATION
Reel/Frame 008025/0220 →
Assignment of Assignor's Interest May 30, 1996
From: NARITA, KAORU
To: NEC CORPORATION
Reel/Frame 008027/0937 →
Assignment of Assignor's Interest Jun 5, 1996
From: IGARASHI, HATSUHIDE; TAKAYAMA, SHIGERU; MATSUURA, YOSHIHIRO; NAGAISHI, HATSUHIRO
To: NEC CORPORATION
Reel/Frame 008038/0532 →
Assignment of Assignor's Interest Jun 5, 1996
From: OHGANE, SHOJI; TOMIMITSU, YASUHARU
To: NEC CORPORATION
Reel/Frame 008025/0978 →
Assignment of Assignor's Interest Jun 13, 1996
From: OKAMOTO, TOSHIHARU
To: NEC CORPORATION
Reel/Frame 008043/0305 →
Assignment of Assignor's Interest Jul 2, 1996
From: HATTORI, SHIGEO
To: NEC CORPORATION
Reel/Frame 008054/0860 →
Assignment of Assignor's Interest Jul 3, 1996
From: HASEGAWA, EIJI
To: NEC CORPORATION
Reel/Frame 008020/0259 →
Assignment of Assignor's Interest Aug 19, 1996
From: MIZUNIWA, TETSUO; SHIRAMIZU, YOSHIMI
To: NEC CORPORATION
Reel/Frame 008089/0677 →
Assignment of Assignor's Interest Aug 22, 1996
From: NAGY, BELA G.
To: SAINT-GOBAIN/NORTON INDUSTRIAL CERAMICS CORPORATION
Reel/Frame 008099/0835 →
Assignment of Assignor's Interest Jan 15, 1998
From: WATANABE, HIROHITO
To: NEC CORPORATION
Reel/Frame 008926/0390 →
Assignment of Assignor's Interest Nov 15, 2002
From: NEC CORPORATION
To: NEC COMPOUND SEMICONDUCTOR DEVICES, LTD.
Reel/Frame 013496/0038 →
Assignment of Assignor's Interest Feb 6, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013758/0595 →