IP Library › Assignment 025172/0931
Patent Assignment
Reel/Frame 025172/0931

Change of Name

Recorded: 2010-10-21 Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties (92)
Semiconductor Memory Device Having Word Line Driver Requiring Single Word Line Drive Signal
Patent: 5,519,665 →
Application: 08/336,192 →
Semiconductor Device Having an Alignment Mark
Patent: 5,525,840 →
Application: 08/338,207 →
Automatic Repair Data Editing System Associated with Repairing System for Semiconductor Integrated Circuit Device
Patent: 5,568,408 →
Application: 08/339,683 →
Synchronous Dram Memory Module
Patent: 5,495,435 →
Application: 08/339,730 →
Method for Manufacturing Pattern Layer Having Different Minimum Feature Sizes
Patent: 5,641,609 →
Application: 08/339,732 →
Molded Semiconductor Device
Patent: 5,495,125 →
Application: 08/343,971 →
Method of Manufacturing Bipolar Transistor with Reduced Numbers of Steps Without Increasing Collector Resistance
Patent: 5,516,709 →
Application: 08/346,163 →
Bonding Structure of Dielectric Substrates for Impedance Matching Circuits on a Packaging Substrate Involved in Microwave Integrated Circuits
Patent: 5,477,085 →
Application: 08/348,822 →
Oscillation Circuit Having a Current-Controlled Phase Shift Circuit
Patent: 5,485,128 →
Application: 08/349,959 →
Ridge Stripe Type Laser Diode and Method for Fabricating the Same
Patent: 5,478,775 →
Application: 08/350,886 →
Solid State Imaging Device Having Sliding Potential Gradient
Patent: 5,589,698 →
Application: 08/350,897 →
Non-Volatile Semiconductor Memory Device and Method for Erasure and Production Thereof
Patent: 5,535,158 →
Application: 08/350,978 →
Plasma Processing Apparatus
Patent: 5,614,025 →
Application: 08/351,517 →
Process for Manufacturing Semiconductor Device by Filling a via Hole in an Interlayered Film of the Device with Wiring Metal
Patent: 5,543,357 →
Application: 08/351,679 →
High-Breakdown-Voltage Mos Transistor
Patent: 5,523,601 →
Application: 08/353,080 →
Electrically Erasable and Programmable Read Only Memory Device Having Selectively Erasable Sectors
Patent: 5,502,669 →
Application: 08/353,235 →
Method for Fabricating a Gate Electrode Structure of Compound Semiconductor Device
Patent: 5,567,647 →
Application: 08/354,067 →
Decoder Circuit Which Resists a Fluctuation of a Power Supply
Patent: 5,530,380 →
Application: 08/354,150 →
Signal Processing Circuit for Solid State Image Sensor Having a Structure for Suppressing a Reset Noise
Patent: 5,539,457 →
Application: 08/354,829 →
Microwave Plasma Processing Apparatus
Patent: 6,189,481 →
Application: 08/355,009 →
Pulse Width Discriminating Circuit
Patent: 5,479,118 →
Application: 08/355,301 →
Apparatus for Analyzing Organic Substance and Method for the Same
Patent: 5,522,918 →
Application: 08/356,489 →
Semiconductor Circuit Having Input Protective Circuit
Patent: 5,691,557 →
Application: 08/356,965 →
Signal Delaying Outputting Circuit
Patent: 5,523,711 →
Application: 08/358,592 →
Optical Modulator and Method of Producing the Same
Patent: 5,543,957 →
Application: 08/358,622 →
Cleaning Method for Semiconductor Substrate
Patent: 5,472,513 →
Application: 08/360,417 →
Semiconductor Device Having a Circuit for Protecting the Device from Electrostatic Discharge
Patent: 5,521,415 →
Application: 08/361,134 →
Method of Forming a Titanium Silicide Film Involved in a Semiconductor Device
Patent: 5,543,359 →
Application: 08/361,532 →
Semiconductor Device Having a Silicon Oxide Film Containing Fluorine Atoms
Patent: 5,521,424 →
Application: 08/361,536 →
Method of Controlling Semiconductor Storage Circuit
Patent: 5,539,693 →
Application: 08/362,157 →
Data Processing System Having a Function of Changing Bus Width
Patent: 5,764,950 →
Application: 08/363,824 →
Integrated Semiconductor Device with Temperature Sensing Circuit and Method for Operating Same
Patent: 5,500,547 →
Application: 08/364,240 →
Phase Differential Circuit Having High Synchronicity
Patent: 5,675,264 →
Application: 08/364,971 →
Parallel-To-Serial Data Conversion Circuit
Patent: 5,654,707 →
Application: 08/365,073 →
Diagnostic Circuit
Patent: 5,541,936 →
Application: 08/365,451 →
Keyed Pulse Sensor Circuit
Patent: 5,559,836 →
Application: 08/372,859 →
Aperture for Use in Electron Beam System for Pattern Writing
Patent: 5,557,110 →
Application: 08/375,487 →
Multiple Quantum Well Semiconductor Laser
Patent: 5,509,026 →
Application: 08/384,333 →
Non-Volatile Semiconductor Memory Device Having a Memory Cell Group Operative as a Redundant Memory Cell Group for Replacement of Another Group
Patent: 5,523,976 →
Application: 08/388,453 →
Address Generating Circuit Using a Base Pointer of Loop Area
Patent: 5,471,600 →
Application: 08/392,420 →
Phase Locked Loop (Pll) Circuit Having Variable Loop Filter for Shortened Locking Time
Patent: 5,534,823 →
Application: 08/394,635 →
Fabrication Process for Multilevel Interconnections in a Semiconductor Device
Patent: 5,506,177 →
Application: 08/394,943 →
Page Mode Access Memory Controller Including Plural Address Latches and a Comparator
Patent: 5,644,747 →
Application: 08/398,442 →
Huffman Code Decoding Circuit
Patent: 5,617,089 →
Application: 08/399,752 →
Dynamic Fault Imaging System Using Electron Beam and Method of Analyzing Fault
Patent: 5,548,211 →
Application: 08/400,199 →
Moving Picture Coding and Decoding Circuit
Patent: 5,589,885 →
Application: 08/400,499 →
Microcomputer Free from Control of Central Processing Unit (Cpu) for Receving and Writing Instructions into Memory Independent of and During Execution of Cpu
Patent: 5,664,199 →
Application: 08/405,918 →
Method for Wet Processing of a Semiconductor Substrate
Patent: 5,676,760 →
Application: 08/408,082 →
Phase Control Circuit Having a Plurality of Differential Circuits
Patent: 5,528,124 →
Application: 08/408,904 →
Method of Fabricating Vertical-Type Double Diffused Mosfet Having a Self-Aligned Field Oxide Film
Patent: 5,559,045 →
Application: 08/409,614 →
Method for Producing Electrolyzed Water
Patent: 5,543,030 →
Application: 08/410,309 →
Serial Data Transfer Apparatus for Determining a Reception Time and a Transmission Time
Patent: 5,566,343 →
Application: 08/412,856 →
Clock Driver Circuit
Patent: 5,596,296 →
Application: 08/413,416 →
Single Point Bonding Method
Patent: 5,662,263 →
Application: 08/413,907 →
Non-Volatile Semiconductor Memory Having Programming Region for Injecting and Ejecting Carriers into and from Floating Gate
Patent: 5,656,838 →
Application: 08/422,931 →
Method for Manufacturing Ldd Type Mis Device
Patent: 5,614,432 →
Application: 08/426,650 →
Electrically Erasable and Programmable Read Only Memory Device Equipped with Inspection Circuit for Threshold Levels of Memory Cells
Patent: 5,532,959 →
Application: 08/427,833 →
Frequency Characteristic of Semiconductor Device in Ultra-High Frequency Band
Patent: 5,576,661 →
Application: 08/428,349 →
Method for Producing a Semiconductor Device Comprising a Refractory Metal Silicide Layer
Patent: 5,883,003 →
Application: 08/428,673 →
Semiconductor Device Capable of Increasing Reliability
Patent: 5,548,157 →
Application: 08/441,573 →
Method of Making a Compound Semiconductor Field-Effect Transistor
Patent: 5,770,489 →
Application: 08/444,026 →
Method of Flattening the Surface of a Semiconductor Device by Polishing
Patent: 5,643,837 →
Application: 08/445,222 →
Method for Manufacturing Bump Leaded Film Carrier Type Semiconductor Device
Patent: 5,683,942 →
Application: 08/450,728 →
Electron Beam Exposure System Capable of Correcting Proximity Effect
Patent: 5,563,419 →
Application: 08/451,076 →
Semiconductor Circuit Device Capable of Reducing Influence of a Parasitic Capacitor
Patent: 5,479,045 →
Application: 08/451,169 →
Mos Differential Voltage-to-Current Converter Circuit with Improved Linearity
Patent: 5,552,729 →
Application: 08/458,776 →
Electron Beam Shaping Mask for an Electron Beam System with Pattern Writing Capability
Patent: 5,593,761 →
Application: 08/458,849 →
Mos Differential Voltage-to-Current Converter Circuit with Improved Linearity
Patent: 5,552,730 →
Application: 08/458,907 →
Non-Volatile Semiconductor Memory Device Capable of Checking the Threshold Value of Memory Cells
Patent: 5,513,193 →
Application: 08/467,349 →
Microprocessor for Selecting Different External Data Bus Terminal Width Regardless of Data Transfer Mode
Patent: 5,548,766 →
Application: 08/478,113 →
Data Processing System Having a Saturation Arithmetic Operation Function
Patent: 5,684,728 →
Application: 08/489,622 →
Microwave Plasma Processing System
Patent: 5,529,632 →
Application: 08/490,087 →
Microwave Plasma Processing System
Patent: 5,545,258 →
Application: 08/490,088 →
Silicon on Insulating Substrate
Patent: 6,004,406 →
Application: 08/490,351 →
Avalanche Photo-Diode for Producing Sharp Pulse Signal
Patent: 5,569,942 →
Application: 08/494,556 →
High Speed Synchronous Logic Data Latch Apparatus
Patent: 5,648,931 →
Application: 08/494,998 →
Method for Fabricating Semiconductor Device with Chemical-Mechanical Polishing Process for Planarization of Interlayer Insulation Films
Patent: 5,575,886 →
Application: 08/503,088 →
Method for Polishing Semiconductor Substrate and Apparatus for the Same
Patent: 5,906,532 →
Application: 08/504,011 →
Information Processing Apparatus for Emulation
Patent: 5,797,021 →
Application: 08/506,496 →
Method of Manufacturing a Semiconductor Device Comprising a Non-Volatile Memory Cell Having a Multi-Layered Floating Gate
Patent: 5,639,679 →
Application: 08/509,631 →
Data Processor Having Precise Timer Output
Patent: 5,680,593 →
Application: 08/510,651 →
Image Sub-Sampling Apparatus
Patent: 5,565,925 →
Application: 08/513,409 →
A Bipolar Transistor Having Collector Groove Extending Below a Major Surface of a Substrate
Patent: 5,637,911 →
Application: 08/513,640 →
Fabrication Process of Compound Semiconductor Device
Patent: 5,514,605 →
Application: 08/516,292 →
Method of Reducing the Number of Access Times to a Reference Frame Memory in Image Compression
Patent: 5,828,785 →
Application: 08/518,224 →
Information Processing Apparatus with Write Protection Function of Specific Storage Area
Patent: 5,721,872 →
Application: 08/519,769 →
Method and System for Testing an Interconnection in a Semiconductor Integrated Circuit
Patent: 5,804,980 →
Application: 08/520,501 →
Method and Apparatus for Producing an Image Signal with an Improved S/N Ratio
Patent: 5,821,998 →
Application: 08/521,756 →
Data Processor Having Data Bus and Instruction Fetch Bus Provided Separately from Each Other
Patent: 5,706,423 →
Application: 08/523,252 →
Method of Manufacturing Semiconductor Device
Patent: 5,624,583 →
Application: 08/523,896 →
Photocoupler Device Having Light Emitting Device and Photo Detector
Patent: 5,665,983 →
Application: 08/524,769 →
Chopper Type Comparator for an Analog-to-Digital Converter
Patent: 5,546,028 →
Application: 08/524,805 →
Related Assignments (25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 4, 1994
From: CHISHIKI, SHIGEO
To: NEC CORPORATION
Reel/Frame 007200/0422 →
Assignment of Assignor's Interest Nov 9, 1994
From: TOMINAGA, MAKOTO
To: NEC CORPORATION
Reel/Frame 007207/0546 →
Assignment of Assignor's Interest Nov 14, 1994
From: SUGAHARA, KENJI
To: NEC CORPORATION
Reel/Frame 007209/0205 →
Assignment of Assignor's Interest Nov 14, 1994
From: MAEDA, TETSUNORI
To: NEC CORPORATION
Reel/Frame 007206/0330 →
Assignment of Assignor's Interest Nov 14, 1994
From: NISHIMOTO, SHOZO
To: NEC CORPORATION
Reel/Frame 007202/0095 →
Assignment of Assignor's Interest Nov 18, 1994
From: UEMURA, KAZUYOSHI
To: NEC CORPORATION
Reel/Frame 007219/0144 →
Assignment of Assignor's Interest Nov 21, 1994
From: YAMAZAKI, TORU
To: NEC CORPORATION
Reel/Frame 007227/0873 →
Assignment of Assignor's Interest Nov 28, 1994
From: KOSE, YASUSHI
To: NEC CORPORATION
Reel/Frame 007228/0869 →
Assignment of Assignor's Interest Nov 29, 1994
From: YAMAGATA, YASUSHI
To: NEC CORPORATION
Reel/Frame 007234/0880 →
Assignment of Assignor's Interest Dec 2, 1994
From: SAITOH, KENJI
To: NEC CORPORATION
Reel/Frame 007254/0925 →
Assignment of Assignor's Interest Dec 6, 1994
From: TAKAHASHI, KIYOSHI
To: NEC CORPORATION
Reel/Frame 007250/0339 →
Assignment of Assignor's Interest Dec 6, 1994
From: AZUMA, KUNIHIKO
To: NEC CORPORATION
Reel/Frame 007258/0889 →
Assignment of Assignor's Interest Dec 6, 1994
From: KONDOH, CHIAKI
To: NEC CORPORATION
Reel/Frame 007250/0319 →
Assignment of Assignor's Interest Dec 7, 1994
From: FUJII, HIROAKI
To: NEC CORPORATION
Reel/Frame 007278/0807 →
Assignment of Assignor's Interest Dec 7, 1994
From: AKIMOTO, TAKESHI
To: NEC CORPORATION
Reel/Frame 007279/0076 →
Assignment of Assignor's Interest Dec 7, 1994
From: NAKASHIBA, YASUTAKA
To: NEC CORPORATION
Reel/Frame 007264/0131 →
Assignment of Assignor's Interest Dec 8, 1994
From: TSUNAI, SHIRO
To: NEC CORPORATION
Reel/Frame 007253/0441 →
Assignment of Assignor's Interest Dec 8, 1994
From: YAMADA, YOSHIAKI; ITO, NOBUKAZU; MIYAKAWA, KUNIKO; YAMANAKA, MICHIKO
To: NEC CORPORATION
Reel/Frame 007274/0744 →
Assignment of Assignor's Interest Dec 9, 1994
From: YANAGIGAWA, HIROSHI
To: NEC CORPORATION
Reel/Frame 007264/0895 →
Assignment of Assignor's Interest Dec 13, 1994
From: AKIMOTO, TAKESHI
To: NEC CORPORATION
Reel/Frame 007269/0122 →
Assignment of Assignor's Interest Dec 14, 1994
From: KOUI, TOMOAKI; TAKANO, SHINJI
To: NEC CORPORATION
Reel/Frame 007300/0321 →
Assignment of Assignor's Interest Dec 14, 1994
From: TACHIYAMA, TSUYOSHI
To: NEC CORPORATION
Reel/Frame 007258/0619 →
Assignment of Assignor's Interest Dec 15, 1994
From: SHIRAMIZU, YOSHIMI
To: NEC CORPORATION
Reel/Frame 007285/0642 →
Assignment of Assignor's Interest Dec 16, 1994
From: WATANABE, TOSHIO
To: NEC CORPORATION
Reel/Frame 007283/0755 →
Assignment of Assignor's Interest Apr 28, 1995
From: NIIJIMA, SHINJI
To: NEC CORPORATION
Reel/Frame 007452/0660 →