IP Library › Granted Patent US 12,191,322
Granted Patent B2
US 12,191,322 · App. 18/437,410 · Granted Jan 7, 2025

Semiconductor device

Inventor: Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1255G09G3/14G09G3/32G09G3/36G11C19/00H01L29/7869H03B1/00H03K3/00H03K17/6871G09G2300/0426G09G2310/0286G09G2330/021
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Quick Facts
Patent No.
US 12,191,322
App. No.
18/437,410
Granted
Jan 7, 2025
Kind
B2
Abstract

Provided is a semiconductor device exemplified by an inverter circuit and a shift register circuit, which is characterized by a reduced number of transistors. The semiconductor device includes a first transistor, a second transistor, and a capacitor. One of a source and a drain of the first transistor is electrically connected to a first wiring, and the other thereof is electrically connected to a second wiring. One of a source and a drain of the second transistor is electrically connected to the first wiring, a gate of the second transistor is electrically connected to a gate of the first transistor, and the other of the source and the drain of the second transistor is electrically connected to one electrode of the capacitor, while the other electrode of the capacitor is electrically connected to a third wiring. The first and second transistors have the same conductivity type.

Claims (45)

1. A semiconductor device comprising:

a shift register circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, a seventh transistor, an eighth transistor, a ninth transistor, a tenth transistor, and an eleventh transistor,

wherein one of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor, one of a source and a drain of the sixth transistor, and a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a second wiring,

wherein a gate of the first transistor is electrically connected to one of a source and a drain of the third transistor, one of a source and a drain of the fourth transistor, and one of a source and a drain of the fifth transistor,

wherein the other of the source and the drain of the second transistor is electrically connected to the other of the source and the drain of the sixth transistor,

wherein a gate of the second transistor is electrically connected to a gate of the third transistor, one of a source and a drain of the seventh transistor, and one of a source and a drain of the eighth transistor,

wherein the other of the source and the drain of the third transistor is electrically connected to the other of the source and the drain of the fifth transistor,

wherein a gate of the fourth transistor is electrically connected to the other of the source and the drain of the fourth transistor and a third wiring,

wherein a gate of the fifth transistor is electrically connected to a fourth wiring,

wherein a gate of the sixth transistor is electrically connected to a fifth wiring,

wherein a gate of the seventh transistor is electrically connected to one of a source and a drain of the ninth transistor,

wherein the other of the source and the drain of the eighth transistor is electrically connected to the other of the source and the drain of the ninth transistor,

wherein a gate of the eighth transistor is electrically connected to a gate of the ninth transistor,

wherein a gate of the ninth transistor is electrically connected to one of a source and a drain of the tenth transistor and one of a source and a drain of the eleventh transistor,

wherein the first wiring is configured to transmit an output signal,

wherein the second wiring is configured to transmit a clock signal,

wherein the third wiring is configured to transmit a first signal,

wherein the fourth wiring is configured to transmit a second signal, and

wherein the fifth wiring is configured to transmit a third signal.

2. A semiconductor device comprising:

a shift register circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, a seventh transistor, an eighth transistor, a ninth transistor, a tenth transistor, and an eleventh transistor,

wherein one of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor, one of a source and a drain of the sixth transistor, and a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a second wiring,

wherein a gate of the first transistor is electrically connected to one of a source and a drain of the third transistor, one of a source and a drain of the fourth transistor, and one of a source and a drain of the fifth transistor,

wherein the other of the source and the drain of the second transistor is electrically connected to the other of the source and the drain of the sixth transistor,

wherein a gate of the second transistor is electrically connected to a gate of the third transistor, one of a source and a drain of the seventh transistor, and one of a source and a drain of the eighth transistor,

wherein the other of the source and the drain of the third transistor is electrically connected to the other of the source and the drain of the fifth transistor,

wherein a gate of the fourth transistor is electrically connected to the other of the source and the drain of the fourth transistor and a third wiring,

wherein a gate of the fifth transistor is electrically connected to a fourth wiring,

wherein a gate of the sixth transistor is electrically connected to a fifth wiring,

wherein a gate of the seventh transistor is electrically connected to one of a source and a drain of the ninth transistor,

wherein the other of the source and the drain of the eighth transistor is electrically connected to the other of the source and the drain of the ninth transistor,

wherein a gate of the eighth transistor is electrically connected to a gate of the ninth transistor, and

wherein a gate of the ninth transistor is electrically connected to one of a source and a drain of the tenth transistor and one of a source and a drain of the eleventh transistor.

3. A semiconductor device comprising:

a shift register circuit comprising a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, a seventh transistor, an eighth transistor, and a ninth transistor,

wherein one of a source and a drain of the first transistor is electrically connected to one of a source and a drain of the second transistor, one of a source and a drain of the sixth transistor, and a first wiring,

wherein the other of the source and the drain of the first transistor is electrically connected to a second wiring,

wherein a gate of the first transistor is electrically connected to one of a source and a drain of the third transistor, one of a source and a drain of the fourth transistor, and one of a source and a drain of the fifth transistor,

wherein a gate of the second transistor is electrically connected to a gate of the third transistor, one of a source and a drain of the seventh transistor, and one of a source and a drain of the eighth transistor,

wherein a gate of the fourth transistor is electrically connected to a third wiring,

wherein a gate of the fifth transistor is electrically connected to a fourth wiring,

wherein a gate of the seventh transistor is electrically connected to one of a source and a drain of the ninth transistor, and

wherein a gate of the eighth transistor is electrically connected to a gate of the ninth transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 9, 2024
From: UMEZAKI, ATSUSHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 066425/0649 →
Priority Claims (1)
JP 2011-217150 · Sep 30, 2011 · national
Continuity (11)
Continuation 18096045 · Jan 12, 2023
Continuation 17673958 · Feb 17, 2022
Continuation 17169602 · Feb 8, 2021
Continuation 16699863 · Dec 2, 2019
Continuation 16417864 · May 21, 2019
Continuation 15795321 · Oct 27, 2017
Continuation 15247995 · Aug 26, 2016
Continuation 14594256 · Jan 12, 2015
Continuation 14222822 · Mar 24, 2014
Continuation 13606440 · Sep 7, 2012
Related Publication 20240266369A1 · Aug 8, 2024
References Cited (260)
US 4317051A · Young · 1982 [cited by applicant]
US 4633105A · Tsujimoto · 1986 [cited by examiner]
US 4644190A · Eberhard · 1987 [cited by examiner]
US 5502406A · Traynor et al. · 1996 [cited by applicant]
US 5514994A · Sawada · 1996 [cited by examiner]
US 5517148A · Yin · 1996 [cited by applicant]
US 5867138A · Moon · 1999 [cited by applicant]
US 5966031A · Sekimoto · 1999 [cited by examiner]
US 6215349B1 · Hanson · 2001 [cited by examiner]
US 6242973B1 · Kong · 2001 [cited by examiner]
US 6400189B2 · McDaniel · 2002 [cited by examiner]
US 6788108B2 · Miyake et al. · 2004 [cited by applicant]
US 6927618B2 · Kimura · 2005 [cited by examiner]
US 6975142B2 · Azami et al. · 2005 [cited by applicant]
US 7038653B2 · Moon · 2006 [cited by applicant]
US 7091749B2 · Miyake et al. · 2006 [cited by applicant]
US 7151400B2 · Chen · 2006 [cited by applicant]
US 7253665B2 · Kimura · 2007 [cited by applicant]
US 7265581B2 · Yeh · 2007 [cited by applicant]
US 7301533B2 · Shin et al. · 2007 [cited by applicant]
US 7362139B2 · Miyake et al. · 2008 [cited by applicant]
US 7432737B2 · Yoshida · 2008 [cited by examiner]
US 7436923B2 · Tobita · 2008 [cited by applicant]
US 7468615B1 · Tan et al. · 2008 [cited by applicant]
US 7499518B2 · Tobita et al. · 2009 [cited by applicant]
US 7528643B2 · Kimura · 2009 [cited by examiner]
US 7554379B2 · Pilling et al. · 2009 [cited by applicant]
US 7586478B2 · Azami et al. · 2009 [cited by applicant]
US 7602215B2 · Osame · 2009 [cited by examiner]
US 7627076B2 · Tobita · 2009 [cited by applicant]
US 7674650B2 · Akimoto et al. · 2010 [cited by applicant]
US RE41215E · Miyake et al. · 2010 [cited by applicant]
US 7732819B2 · Akimoto et al. · 2010 [cited by applicant]
US 7738623B2 · Tobita · 2010 [cited by applicant]
US 7764090B2 · Yamashita · 2010 [cited by examiner]
US 7772884B2 · Kwon · 2010 [cited by applicant]
US 7786985B2 · Kimura · 2010 [cited by examiner]
US 7795946B2 · Kim · 2010 [cited by applicant]
US 7825888B2 · Tobita et al. · 2010 [cited by applicant]
US 7893732B2 · Tobita · 2011 [cited by applicant]
US 7903079B2 · Azami et al. · 2011 [cited by applicant]
US 7910490B2 · Akimoto et al. · 2011 [cited by applicant]
US 7932521B2 · Akimoto et al. · 2011 [cited by applicant]
US 7932888B2 · Miyake · 2011 [cited by applicant]
US 7965127B2 · Svensson · 2011 [cited by examiner]
US 7969390B2 · Yoshida · 2011 [cited by examiner]
US 8008950B2 · Jinta · 2011 [cited by applicant]
US 8023610B2 · Miyayama et al. · 2011 [cited by applicant]
US 8040163B2 · Jinta · 2011 [cited by applicant]
US 8067775B2 · Miyairi et al. · 2011 [cited by applicant]
US RE43401E · Miyake et al. · 2012 [cited by applicant]
US 8199871B2 · Liu · 2012 [cited by applicant]
US 8207756B2 · Shionoiri et al. · 2012 [cited by applicant]
US 8212600B2 · Osame · 2012 [cited by examiner]
US 8269547B2 · Nonaka · 2012 [cited by applicant]
US 8274077B2 · Akimoto et al. · 2012 [cited by applicant]
US 8300039B2 · Yamamoto et al. · 2012 [cited by applicant]
US 8314765B2 · Umezaki · 2012 [cited by applicant]
US 8384702B2 · Jinta · 2013 [cited by applicant]
US 8427206B2 · Yamamoto et al. · 2013 [cited by applicant]
US 8446177B2 · Yamamoto et al. · 2013 [cited by applicant]
US 8466463B2 · Akimoto et al. · 2013 [cited by applicant]
US 8508459B2 · Miyake · 2013 [cited by applicant]
US RE44657E · Miyake et al. · 2013 [cited by applicant]
US 8605073B2 · Umezaki et al. · 2013 [cited by applicant]
US 8629069B2 · Akimoto et al. · 2014 [cited by applicant]
US 8669550B2 · Akimoto et al. · 2014 [cited by applicant]
US 8681077B2 · Kimura · 2014 [cited by examiner]
US 8710895B2 · Jo · 2014 [cited by applicant]
US 8743044B2 · Umezaki · 2014 [cited by examiner]
US 8766901B2 · Miyake · 2014 [cited by applicant]
US 8774347B2 · Umezaki · 2014 [cited by applicant]
US 8790959B2 · Akimoto et al. · 2014 [cited by applicant]
US 8796069B2 · Akimoto et al. · 2014 [cited by applicant]
US 8890780B2 · Jinta · 2014 [cited by applicant]
US 8902144B2 · Umezaki · 2014 [cited by applicant]
US 8902374B2 · Umezaki · 2014 [cited by applicant]
US 8994636B2 · Umezaki · 2015 [cited by applicant]
US 9001959B2 · Koyama · 2015 [cited by examiner]
US 9036767B2 · Umezaki · 2015 [cited by applicant]
US 9064753B2 · Miyake · 2015 [cited by applicant]
US 9099562B2 · Akimoto et al. · 2015 [cited by applicant]
US 9311876B2 · Umezaki · 2016 [cited by applicant]
US 9337184B2 · Umezaki · 2016 [cited by applicant]
US 9337191B2 · Umezaki et al. · 2016 [cited by applicant]
US 9396703B2 · Jinta · 2016 [cited by applicant]
US 9543039B2 · Amano · 2017 [cited by examiner]
US 9583513B2 · Umezaki · 2017 [cited by examiner]
US 9715845B2 · Umezaki · 2017 [cited by examiner]
US 9715860B2 · Yang · 2017 [cited by examiner]
US 9755643B2 · Inoue · 2017 [cited by examiner]
US 9761190B2 · Umezaki · 2017 [cited by applicant]
US 9767751B2 · Dai · 2017 [cited by examiner]
US 9792859B2 · Jinta · 2017 [cited by applicant]
US 9830878B2 · Koyama · 2017 [cited by examiner]
US 9842861B2 · Umezaki · 2017 [cited by examiner]
US 9858880B2 · Dai · 2018 [cited by examiner]
US 9865211B2 · Cao · 2018 [cited by examiner]
US 9941308B2 · Umezaki · 2018 [cited by applicant]
US 10008519B1 · Umezaki · 2018 [cited by applicant]
US 10068543B2 · Yamamoto · 2018 [cited by examiner]
US 10121435B2 · Umezaki · 2018 [cited by applicant]
US 10153303B2 · Umezaki et al. · 2018 [cited by applicant]
US 10586505B2 · Umezaki et al. · 2020 [cited by applicant]
US 10593274B2 · Umezaki · 2020 [cited by applicant]
US 11037513B2 · Umezaki · 2021 [cited by applicant]
US 11170728B2 · Umezaki et al. · 2021 [cited by applicant]
US 11373609B2 · Umezaki · 2022 [cited by applicant]
US 11455969B2 · Umezaki et al. · 2022 [cited by applicant]
US 11568830B2 · Umezaki · 2023 [cited by applicant]
US 20020080651A1 · Tanzawa et al. · 2002 [cited by applicant]
US 20020140458A1 · Sato et al. · 2002 [cited by applicant]
US 20040164978A1 · Shin et al. · 2004 [cited by applicant]
US 20050046445A1 · Kasuga · 2005 [cited by examiner]
US 20060061385A1 · Jinta et al. · 2006 [cited by applicant]
US 20060164376A1 · Moon · 2006 [cited by applicant]
US 20060170638A1 · Sloof et al. · 2006 [cited by applicant]
US 20070064469A1 · Umezaki · 2007 [cited by applicant]
US 20070085847A1 · Shishido · 2007 [cited by examiner]
US 20070132686A1 · Kimura · 2007 [cited by examiner]
US 20070159442A1 · Cheng · 2007 [cited by examiner]
US 20070170465A1 · Kwon et al. · 2007 [cited by applicant]
US 20070182448A1 · Kwon et al. · 2007 [cited by applicant]
US 20080062112A1 · Umezaki · 2008 [cited by examiner]
US 20080219401A1 · Tobita · 2008 [cited by examiner]
US 20080308796A1 · Akimoto et al. · 2008 [cited by applicant]
US 20080308805A1 · Akimoto et al. · 2008 [cited by applicant]
US 20080308806A1 · Akimoto et al. · 2008 [cited by applicant]
US 20090008639A1 · Akimoto et al. · 2009 [cited by applicant]
US 20090224245A1 · Umezaki · 2009 [cited by examiner]
US 20090305461A1 · Akimoto et al. · 2009 [cited by applicant]
US 20100110623A1 · Koyama et al. · 2010 [cited by applicant]
US 20100133533A1 · Umezaki · 2010 [cited by applicant]
US 20100136743A1 · Akimoto et al. · 2010 [cited by applicant]
US 20100188385A1 · Boiko · 2010 [cited by examiner]
US 20100237911A1 · Svensson · 2010 [cited by examiner]
US 20100252826A1 · Yamazaki et al. · 2010 [cited by applicant]
US 20100253393A1 · Yamamoto · 2010 [cited by examiner]
US 20100271111A1 · Jinta · 2010 [cited by examiner]
US 20110057918A1 · Kimura et al. · 2011 [cited by applicant]
US 20110084960A1 · Miyake. et al. · 2011 [cited by applicant]
US 20110089417A1 · Yamazaki et al. · 2011 [cited by applicant]
US 20110089975A1 · Yamazaki et al. · 2011 [cited by applicant]
US 20110104851A1 · Akimoto et al. · 2011 [cited by applicant]
US 20110117697A1 · Akimoto et al. · 2011 [cited by applicant]
US 20110121290A1 · Akimoto et al. · 2011 [cited by applicant]
US 20110122988A1 · Miyayama et al. · 2011 [cited by applicant]
US 20110140108A1 · Kimura et al. · 2011 [cited by applicant]
US 20110148497A1 · Ishii · 2011 [cited by applicant]
US 20110149189A1 · Azami et al. · 2011 [cited by applicant]
US 20110156024A1 · Koyama et al. · 2011 [cited by applicant]
US 20110163311A1 · Akimoto et al. · 2011 [cited by applicant]
US 20110176357A1 · Koyama et al. · 2011 [cited by applicant]
US 20110193182A1 · Takemura · 2011 [cited by applicant]
US 20110199365A1 · Umezaki et al. · 2011 [cited by applicant]
US 20110215787A1 · Shionoiri et al. · 2011 [cited by applicant]
US 20110227066A1 · Umezaki · 2011 [cited by applicant]
US 20110260158A1 · Takemura · 2011 [cited by examiner]
US 20110273407A1 · Chung · 2011 [cited by examiner]
US 20110278564A1 · Yoneda · 2011 [cited by applicant]
US 20110285442A1 · Saito · 2011 [cited by applicant]
US 20120051117A1 · Yamazaki et al. · 2012 [cited by applicant]
US 20120061668A1 · Miyairi. et al. · 2012 [cited by applicant]
US 20120063206A1 · Furutani et al. · 2012 [cited by applicant]
US 20120099360A1 · Takemura · 2012 [cited by applicant]
US 20120140550A1 · Endo et al. · 2012 [cited by applicant]
US 20120182788A1 · Kurokawa · 2012 [cited by applicant]
US 20130082760A1 · Umezaki · 2013 [cited by examiner]
US 20130093025A1 · Miyake · 2013 [cited by examiner]
US 20130140617A1 · Umezaki · 2013 [cited by applicant]
US 20130147524A1 · Hachida · 2013 [cited by examiner]
US 20130154909A1 · Jinta · 2013 [cited by examiner]
US 20130162305A1 · Watanabe · 2013 [cited by examiner]
US 20130169319A1 · Sasaki · 2013 [cited by examiner]
US 20130181223A1 · Kimura · 2013 [cited by examiner]
US 20130234760A1 · Wang · 2013 [cited by examiner]
US 20130249872A1 · Kang · 2013 [cited by examiner]
US 20130249884A1 · Kim · 2013 [cited by examiner]
US 20130314139A1 · Umezaki · 2013 [cited by examiner]
US 20140042496A1 · Ohmaru · 2014 [cited by examiner]
US 20140043066A1 · Yoon · 2014 [cited by examiner]
US 20140086379A1 · Ma · 2014 [cited by examiner]
US 20140203855A1 · Kim · 2014 [cited by examiner]
US 20140204009A1 · Kim · 2014 [cited by examiner]
US 20140264518A1 · Matsuzaki · 2014 [cited by examiner]
US 20150256157A1 · Kozuma · 2015 [cited by examiner]
US 20150340513A1 · Akimoto et al. · 2015 [cited by applicant]
US 20160027815A1 · Yamazaki · 2016 [cited by examiner]
US 20160343337A1 · Dai · 2016 [cited by examiner]
US 20170062483A1 · Kimura · 2017 [cited by examiner]
US 20170125122A1 · Miyake · 2017 [cited by examiner]
US 20170125440A1 · Kozuma · 2017 [cited by examiner]
US 20170186398A1 · Du · 2017 [cited by examiner]
US 20170250309A1 · Kimura · 2017 [cited by examiner]
US 20170301376A1 · Kurokawa · 2017 [cited by examiner]
US 20170309345A1 · Umezaki · 2017 [cited by examiner]
US 20180047758A1 · Kaneyasu · 2018 [cited by examiner]
US 20180053794A1 · Umezaki · 2018 [cited by examiner]
US 20180061350A1 · Sung · 2018 [cited by examiner]
US 20180114799A1 · Miyake · 2018 [cited by examiner]
US 20180151593A1 · Inoue · 2018 [cited by examiner]
US 20190206354A1 · Umezaki · 2019 [cited by applicant]
US 20200118507A1 · Kimura · 2020 [cited by examiner]
US 20200175938A1 · Umezaki et al. · 2020 [cited by applicant]
US 20210390923A1 · Kawashima · 2021 [cited by examiner]
US 20220076628A1 · Yamazaki · 2022 [cited by examiner]
US 20230005446A1 · Umezaki et al. · 2023 [cited by applicant]
US 20230154426A1 · Umezaki · 2023 [cited by applicant]
EP 1770788A · 2007 [cited by applicant]
EP 1995787A · 2008 [cited by applicant]
EP 1998373A · 2008 [cited by applicant]
EP 1998374A · 2008 [cited by applicant]
EP 1998375A · 2008 [cited by applicant]
EP 2221973A · 2010 [cited by applicant]
GB 2099651 · 1982 [cited by applicant]
JP 57196627A · 1982 [cited by applicant]
JP 59016424A · 1984 [cited by applicant]
JP 60140924A · 1985 [cited by applicant]
JP 06048780B · 1994 [cited by applicant]
JP 08083486A · 1996 [cited by applicant]
JP 2002328643A · 2002 [cited by applicant]
JP 2003179479A · 2003 [cited by applicant]
JP 2004064528A · 2004 [cited by applicant]
JP 2004103226A · 2004 [cited by applicant]
JP 2004260788A · 2004 [cited by applicant]
JP 2005123865A · 2005 [cited by applicant]
JP 2007123861A · 2007 [cited by applicant]
JP 2007179660A · 2007 [cited by applicant]
JP 2008122939A · 2008 [cited by applicant]
JP 2009077208A · 2009 [cited by applicant]
JP 2009188867A · 2009 [cited by applicant]
JP 2009219081A · 2009 [cited by applicant]
JP 2009272839A · 2009 [cited by applicant]
JP 2010152347A · 2010 [cited by applicant]
JP 2011028237A · 2011 [cited by applicant]
JP 2011055235A · 2011 [cited by applicant]
JP 2011101209A · 2011 [cited by applicant]
JP 2011191754A · 2011 [cited by applicant]
JP 2011229129A · 2011 [cited by applicant]
JP 2011229136A · 2011 [cited by applicant]
KR 20070070087A · 2007 [cited by applicant]
KR 20070087506A · 2007 [cited by applicant]
KR 20070087520A · 2007 [cited by applicant]
KR 20070100146A · 2007 [cited by examiner]
KR 20080031114A · 2008 [cited by applicant]
KR 20080074026A · 2008 [cited by applicant]
KR 20080081822A · 2008 [cited by applicant]
KR 20210082142A · 2021 [cited by examiner]
TW 200605509 · 2006 [cited by applicant]
TW 200627768 · 2006 [cited by applicant]
TW 201014178 · 2010 [cited by applicant]
TW 201103258 · 2011 [cited by applicant]
TW 201120909 · 2011 [cited by applicant]
WO WO2009081619 · 2009 [cited by applicant]
WO WO2010061723 · 2010 [cited by applicant]
WO WO2010150607 · 2010 [cited by applicant]
WO WO2011102227 · 2011 [cited by applicant]
Fukumoto.E et al., “High Mobility Oxide Semiconductor TFT for Circuit Integration of AM-OLED”, IDW '10 : Proceedings of the 16th International Display Workshops, Dec. 1, 2010, pp. 631-634. [cited by applicant]
Taiwanese Office Action (Application No. 101135569) Dated Jan. 29, 2016. [cited by applicant]
Korean Office Action (Application No. 2012-0107008) Dated Oct. 22, 2018. [cited by applicant]