Patent Assignment
Reel/Frame 027328/0892
Assignment of Assignor's Interest
Recorded: 2011-12-06
Received: 2011-12-06
Pages: 7
Assignor
EASTMAN KODAK COMPANY
Executed: 2011-11-10
Assignee
IMAGE SENSOR TECHNOLOGIES ACQUISITION CORPORATION
1964 LAKE AVENUE, ROCHESTER, NY, 14615, UNITED STATES
Covered Properties
(67)
Image Sensor with Pixel Integration Start Mask
Application:
61/540,107 →
Multiple Gain Charge Sensing
Application:
61/539,092 →
Depleted Charge Multiplying Ccd Image Sensor
Application:
61/539,123 →
Ccd with Improved Dark Reference
Application:
61/539,099 →
STRUCTURE FOR FASTER CLOCKING OF INTERLINE CCDs
Application:
61/539,088 →
Multiple Clocking Modes for a Ccd Imager
Application:
13/241,558 →
Multiple Clocking Modes for a Ccd Imager
Application:
13/241,500 →
Charge Coupled Image Sensor and Method of Operating with Transferring Operation of Charge Packets from Plural Photodetectors to Vertical Ccd Shift Registers (as Amended)
Application:
13/241,547 →
Ccd Image Sensor Having Multiple Clocking Modes
Application:
13/241,526 →
Device Identification and Temperature Sensor Circuit
Application:
13/238,010 →
Device Identification and Temperature Sensor Circuit
Application:
13/238,003 →
Device Identification and Temperature Sensor Circuit
Application:
61/529,287 →
Device Identification and Temperature Sensor Circuit
Application:
61/529,288 →
Stitching Methods Using Multiple Microlithographic Expose Tools
Application:
13/196,197 →
Stitching Methods Using Multiple Microlithographic Expose Tools
Application:
13/196,163 →
Image Sensor with Controllable Vertically Integrated Photodetectors
Application:
13/193,722 →
Image Sensor with Controllable Vertically Integrated Photodetectors
Application:
13/193,677 →
Image Sensor with Controllable Vertically Integrated Photodetectors
Application:
13/193,664 →
Image Sensor with Controllable Vertically Integrated Photodetectors
Application:
13/193,745 →
Image Sensor with Controllable Vertically Integrated Photodetectors
Application:
13/193,714 →
Image Sensor with Controllable Vertically Integrated Photodetectors Using a Buried Layer
Application:
13/193,667 →
Identification of Dies on a Semiconductor Wafer
Application:
13/160,885 →
Identification of Dies on a Semiconductor Wafer
Application:
13/160,901 →
Multi-Purpose Architecture for Ccd Image Sensors
Application:
13/115,242 →
Methods for Producing Image Sensors Having Multi-Purpose Architecture
Application:
13/115,235 →
Multi-Purpose Architecture for Ccd Image Sensors
Application:
13/115,244 →
Ccd Image Sensor
Application:
61/480,390 →
Linear Image Sensor with Multiple Outputs
Application:
13/044,583 →
Linear Image Sensor with Multiple Outputs
Application:
13/044,585 →
Clock Driver for a Capacitance Clock Input
Application:
13/043,809 →
Method for Producing a Linear Image Sensor Having Multiple Outputs
Application:
12/971,743 →
Methods for Gettering in Semiconductor Substrate
Application:
12/971,637 →
Method of Producing an Image with Pixel Signals Produced by an Image Sensor That Includes Multiple Output Channels
Application:
12/967,326 →
Methods for Processing an Image Captured by an Image Sensor Having Multiple Output Channels
Application:
12/967,311 →
Method of Producing an Image Sensor Having Multiple Output Channels
Application:
12/967,341 →
Image Sensor with Charge Multiplication
Application:
12/967,428 →
Image Sensor with Charge Multiplication
Application:
12/967,299 →
Ccd Sensors with Multiple Contact Patterns
Application:
12/845,791 →
Ccd Sensors with Multiple Contact Patterns
Application:
12/845,825 →
Ccd Sensors with Multiple Contact Patterns
Application:
12/845,837 →
Ccd Sensors with Multiple Contact Patterns
Application:
12/845,796 →
Electronic Shutter Control in Image Sensors
Application:
12/770,811 →
Controlling Electronic Shutter in Image Sensors
Application:
12/770,826 →
Electronic Shutter Control in Image Sensors
Application:
12/770,806 →
Electronic Shutter Control in Image Sensors
Application:
12/770,818 →
Multliple Output Charge-Coupled Devices
Application:
12/716,361 →
Multiple Output Charge-Coupled Devices
Application:
12/716,380 →
Vertical Stack of Image Sensors with Cutoff Color Filters
Application:
12/611,200 →
Lateral Overflow Drain and Channel Stop Regions in Image Sensors
Application:
12/609,257 →
A Method of Forming Lateral Overflow Drain and Channel Stop Regions in Image Sensors
Application:
12/609,296 →
Ccd Image Sensors Having Multiple Lateral Overflow Drain Regions for a Horizontal Shift Register
Application:
12/609,029 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,027 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,062 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,073 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/569,993 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,014 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,053 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,017 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,008 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,034 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/569,974 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,048 →
Methods for Capturing and Reading Out Images from an Image Sensor
Application:
12/570,001 →
Ccd Image Sensors with Variable Output Gains in an Output Circuit
Application:
12/568,696 →
Ccd Image Sensors Having Multiple Lateral Overflow Drain Regions for a Horizontal Shift Register
Application:
12/475,825 →
Charge-Coupled Device Image Sensor with Efficient Binning of Same-Color Pixels
Application:
12/339,114 →
System and Method for Draining Residual Charge from Charge-Coupled Device (Ccd) Shift Registers in Image Sensors Having Reset Drains
Application:
12/118,131 →