Patent Assignment
Reel/Frame 017215/0184
Assignment of Assignor's Interest
Recorded: 2005-12-29
Pages: 6
Assignor
OHMI, TADAHIRO
Executed: 2005-08-27
Assignee
FOUNDATION FOR ADVANCEMENT OF INTERNATIONAL SCIENCE
586-9, USHIGAFUCHI AKATSUKA, TSUKUBA-CITY, IBARAKI PREFECTURE, 305-0062, JAPAN
Covered Properties
(99)
Semiconductor Integrated Circuit
Patent:
4,907,053 →
Application:
07/090,210 →
Semiconductor Manufacturing Apparatus
Patent:
4,874,494 →
Application:
07/157,507 →
Wafer Susceptor
Patent:
4,897,171 →
Application:
07/251,935 →
Apparatus for Forming Film with Surface Reaction
Patent:
4,977,855 →
Application:
07/261,833 →
Semiconductor Device Wirings with Hillocks
Patent:
4,984,060 →
Application:
07/359,764 →
Semiconductor Integrated Circuit
Patent:
5,021,843 →
Application:
07/379,482 →
Wafer Succeptor Apparatus
Patent:
5,119,541 →
Application:
07/391,556 →
Method of Forming a Monocrystalline Film Having a Closed Loop Step Portion on the Substrate
Patent:
5,362,672 →
Application:
07/465,175 →
Reduced Pressure Surface Treatment Apparatus
Patent:
5,110,438 →
Application:
07/536,548 →
Device for Plasma Process
Patent:
5,272,417 →
Application:
07/612,192 →
Piping System for Supplying Ultra-Pure Water
Patent:
5,160,429 →
Application:
07/635,590 →
Semiconductor Manufacturing Apparatus
Patent:
34,106 →
Application:
07/690,541 →
Apparatus for Supplying Ultrahigh Purity Gas
Patent:
5,230,721 →
Application:
07/760,801 →
Process Gas Supplying Apparatus
Patent:
5,241,987 →
Application:
07/773,893 →
Method of Forming Oxide Film
Patent:
5,360,768 →
Application:
07/784,434 →
High Purity Cleaning System
Patent:
5,326,035 →
Application:
07/867,692 →
Method and Apparatus for Measuring the Resistance of Conductive Materials Due to Electromigration
Patent:
5,291,142 →
Application:
07/880,219 →
Electronic Device Provided with Metal Fluoride Film
Patent:
5,352,917 →
Application:
07/966,052 →
Method of Forming Oxide Film
Patent:
5,418,017 →
Application:
08/081,370 →
Method for Manufacturing Dram Memory Cells Having a Thin Metal Oxide Film on a Thin Metal Film
Patent:
5,494,840 →
Application:
08/081,371 →
Apparatus for Forming Thin Film
Patent:
5,372,647 →
Application:
08/081,372 →
Dynamic Semiconductor Memory
Patent:
5,432,732 →
Application:
08/081,375 →
Gas Supply Piping Device for a Process Apparatus
Patent:
5,313,982 →
Application:
08/121,174 →
Apparatus for Cleaning a Wafer Surface
Patent:
5,370,274 →
Application:
08/124,109 →
Method and Apparatus for Evaluating Quantities of Absorbed Impurities
Patent:
5,497,652 →
Application:
08/142,466 →
Method and Device for Measuring Variation in Decomposition Rate of Special Material Gas
Patent:
5,438,001 →
Application:
08/150,128 →
Method of Evaluating Segregation at Solid-Liquid Interface and Segregation Apparatus Thereof
Patent:
5,428,990 →
Application:
08/150,129 →
Method and Device for Measuring Quantities of Impurities in Special Gas
Patent:
5,447,053 →
Application:
08/150,142 →
Method of Producing Pure Water, System Therefor and Cleaning Method Therefor
Patent:
5,439,596 →
Application:
08/167,981 →
Method of and Device for Measuring Water Content
Patent:
5,504,009 →
Application:
08/182,109 →
Plasma Processing Apparatus
Patent:
5,444,259 →
Application:
08/193,083 →
Analyzer
Patent:
5,578,833 →
Application:
08/211,381 →
Method of Forming a Passivation Film
Patent:
5,906,688 →
Application:
08/213,079 →
System for Supplying Ultrapure Water and Method of Washing Substrate, and System for Producing Ultrapure Water and Method of Producing Ultrapure Water
Patent:
5,589,005 →
Application:
08/232,266 →
Method of Forming Passive Oxide Film Based on Chromium Oxide, and Stainless Steel
Patent:
5,580,398 →
Application:
08/244,123 →
Superhigh Purity Fluid Supply Pipe System and Method of Installing the Same
Patent:
5,545,868 →
Application:
08/244,127 →
Method of Manufacturing Reference Samples for Calibrating Amount of Measured Displacement and Reference Sample, and Measuring Instrument and Calibration Method
Patent:
5,602,323 →
Application:
08/256,613 →
Resist Processing Method
Patent:
5,516,626 →
Application:
08/296,276 →
Semiconductor Device
Patent:
5,528,068 →
Application:
08/335,871 →
Power Generator
Patent:
5,643,692 →
Application:
08/382,055 →
Method of Evaluating Current-Driven Conductive Material
Patent:
5,554,938 →
Application:
08/387,920 →
Method of Forming Oxide Passivation Film Having Chromium Oxide Layer on the Surface Thereof, and Stainless Steel Having Excellent Corrosion Resistance
Patent:
5,656,099 →
Application:
08/411,632 →
High Speed Semiconductor Device with a Metallic Substrate
Patent:
5,650,650 →
Application:
08/454,324 →
Stainless Steel Surface Having Passivation Film
Patent:
5,789,086 →
Application:
08/458,755 →
Instrument for Measuring Plasma Excited by High-Frequency
Patent:
5,703,488 →
Application:
08/481,285 →
Neuron Circuit
Patent:
5,621,336 →
Application:
08/488,405 →
Film Formng Method
Patent:
5,660,694 →
Application:
08/505,247 →
Data Sorting Circuit
Patent:
5,822,497 →
Application:
08/507,467 →
Thin Film Forming Equipment
Patent:
5,683,072 →
Application:
08/508,405 →
Semiconductor Device Utilizing Silicide Reaction
Patent:
5,714,795 →
Application:
08/554,053 →
Wafer Cleaning Apparatus and Method Thereof
Patent:
6,003,243 →
Application:
08/596,245 →
Method of Forming Passive Oxide Film Based on Chromium Oxide, and Stainless Steel
Patent:
5,817,424 →
Application:
08/630,811 →
Vacuum Exhausting Apparatus, Semiconductor Manufacturing Apparatus, and Vacuum Processing Method
Patent:
5,863,842 →
Application:
08/655,318 →
Method of Forming Oxide-Passivated Film, Ferrite System Stainless Steel, Fluid Feed System and Fluid Contact Component
Patent:
5,951,787 →
Application:
08/666,312 →
Process Apparatus
Patent:
5,688,330 →
Application:
08/707,915 →
Semiconductor Device with Enhanced Thermal Conductivity
Patent:
5,874,777 →
Application:
08/716,191 →
Material to Be Welded for Butt Welding, Methods of Cutting as Well as Welding the Same, and a Wire
Patent:
5,916,457 →
Application:
08/737,996 →
Steel Having Excellent Corrosion Resistance
Patent:
5,911,841 →
Application:
08/781,777 →
Chemical Mechanical Polishing Apparatus
Patent:
5,931,722 →
Application:
08/800,922 →
Feed Back Circuit
Patent:
5,959,484 →
Application:
08/807,374 →
Cleaning Method
Patent:
5,954,885 →
Application:
08/860,507 →
Thin Film Forming Equipment
Patent:
6,074,538 →
Application:
08/872,467 →
Cleaning Device and Method
Patent:
5,944,907 →
Application:
08/894,996 →
Method and Apparatus for Modifying Surface Material
Patent:
6,110,534 →
Application:
08/901,341 →
Method of Forming Passive Oxide Film Based on Chromium Oxide, and Stainless Steel
Patent:
6,037,061 →
Application:
08/988,150 →
Cleaning Liquid and Cleaning Method
Patent:
5,990,060 →
Application:
09/030,299 →
Parallel Plate Sputtering Device with Rf Powered Auxiliary Electrodes and Applied External Magnetic Field
Patent:
6,153,068 →
Application:
09/035,325 →
Reduced Pressure Device and Method of Making
Patent:
5,989,722 →
Application:
09/085,238 →
Steel Having Excellent Corrosion Resistance and Method of Making the Same
Patent:
6,174,610 →
Application:
09/289,147 →
Plasma Device
Patent:
6,357,385 →
Application:
09/355,229 →
Semiconductor manufacturing apparatus
Application:
09/581,878 →
Device Having a Silicon Oxide Film Containing Krypton
Patent:
6,677,648 →
Application:
09/787,435 →
Flash Memory Device and a Fabrication Process Thereof, Method of Forming a Dielectric Film
Method of Forming a Dielectric Film
Gas insulation wiring structure integrated circuit
Application:
09/979,936 →
Variable Function Information Processor
Plasma device
Application:
10/100,533 →
Publication:
US 2002/0164883
Oxide Film Forming Method
Method for Producing a Powder for Magnetic Ferrite
Flash Memory Device and Fabrication Process Thereof, Method of Forming a Dielectric Film
Flash Memory Device and Fabrication Process Thereof, Method of Forming a Dielectric Film
Dielectric Film and Method of Forming It, Semiconductor Device, Non-Volatile Semiconductor Memory Device, and Production Method for Semiconductor Device
Semiconductor Device
Data processing device
Application:
10/504,968 →
Publication:
US 2005/0105816
Mask Making Method, Mask Making Device, and Mask Drawing Device
Fluorescent Lamp and Method of Manufacturing Same
Visible Light-Reflecting Member
Screw Vacuum Pump with Male and Female Screw Rotors Having Unequal Leads
Vacuum device and vacuum pump
Application:
10/548,225 →
Publication:
US 2006/0182638
Mask repeater and mask manufacturing method
Application:
10/548,287 →
Publication:
US 2006/0104413
Data Analysis Device and Data Recognition Device
Pump
Application:
10/548,764 →
Publication:
US 2006/0127245
Pattern Writing System and Pattern Writing Method
Flash Memory Device and a Fabrication Process Thereof, Method of Forming a Dielectric Film
Flash Memory Device and a Fabrication Process Thereof, Method of Forming a Dielectric Film
Method of Surface Treatment for Manufacturing Semiconductor Device
Welding Method for Fluorine-Passivated Memberfor Welding, Fluorine-Passivated Method After Being Weld, and Welded Parts Priority Data
Automatic Trim for Power Boats
Patent:
6,923,136 →
Application:
10/843,986 →
Semiconductor Device, Method for Forming Silicon Oxide Film, and Apparatus for Forming Silicon Oxide Film
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignors Interest.
Sep 28, 1988
From: UMEDA, MASARU
To: TADAHIRO OHMI
Reel/Frame 004972/0272 →
Assignment of Assignors Interest.
Jul 25, 1989
From: UMEDA, MASARU
To: TADAHIRO, OHMI
Reel/Frame 005423/0445 →
Assignment of Assignors Interest.
Feb 1, 1990
From: TADASHI, SHIBATA; MASARU, UMEDA
To: TADAHIRO OHMI,
Reel/Frame 005601/0201 →
Assignment of Assignors Interest.
Jul 10, 1990
From: SHIBATA, TADASHI; UMEDA, MASARU
To: TADAHIRO OHMI,
Reel/Frame 005528/0671 →
Assignment of Assignors Interest.
Jul 30, 1990
From: SHIBATA, TADASHI; UMEDA, MASARU
To: OHMI, TADAHIRO
Reel/Frame 005388/0253 →
Assignor Sells to Assignee a One-Half (1/2) Interest.
Aug 5, 1991
From: OHMI, TADAHIRO
To: MITSUBISHI CORPORATION
Reel/Frame 005791/0397 →
Assignment of Assignors Interest.
Dec 2, 1991
From: SUGIYAMA, KAZUHIKO; NAKAHARA, FUMIO
To: OHMI, TADAHIRO
Reel/Frame 005984/0106 →
Assignment of Assignors Interest.
Jan 21, 1992
From: MORITA, MIZUHO
To: TADAHIRO OHMI
Reel/Frame 005978/0387 →
Assignment of Assignors Interest.
Sep 8, 1992
From: YAGI, YASUYUKI
To: TADAHIRO OHMI
Reel/Frame 006332/0761 →
Assignment of Assignors Interest.
Sep 8, 1992
From: OHWADA, MAKOTO
To: TADAHIRO OHMI
Reel/Frame 006332/0759 →
Assignment of Assignors Interest.
Sep 8, 1992
From: KAWAKAMI, MICHIYA
To: TADAHIRO OHMI
Reel/Frame 006332/0757 →
Assignment of Assignors Interest.
Sep 8, 1992
From: TAKAHARA, KIYOSHI
To: TADAHIRO OHMI
Reel/Frame 006332/0755 →
Assignment of Assignor's Interest
May 11, 1994
From: OHMI, TADAHIRO
To: MITSUBISHI CORPORATION
Reel/Frame 006975/0063 →
Assignment of Assignor's Interest
May 11, 1994
From: OHMI, TADAHIRO
To: MITSUBISHI CORPORATION
Reel/Frame 006970/0417 →
Assignment of Assignor's Interest
May 11, 1994
From: OHMI, TADAHIRO
To: MITSUBISHI CORPORATION
Reel/Frame 006979/0782 →
Assignment of Assignor's Interest
Dec 8, 2003
From: OHMI, TADAHIRO; SUGAWA, SHIGETOSHI; HIRAYAMA, MASAKI; SHIRAI, YASUYUKI
To: OHMI, TADAHIRO
Reel/Frame 014771/0725 →
Assignment of Assignor's Interest
Sep 2, 2004
From: OHMI, TADAHIRO; MOCHIZUKU, KENJI; KOTANI, KOJI
To: TADAHIRO OHMI
Reel/Frame 015103/0055 →
Assignment of Assignor's Interest
Dec 7, 2005
From: OHMI, TADAHIRO
To: TOKYO ELECTRON LIMITED
Reel/Frame 016851/0959 →
Assignment of Assignor's Interest
May 15, 2007
From: TOKYO ELECTRON LIMITED
To: FOUNDATION FOR ADVANCEMENT OF INTERNATIONAL SCIENCE
Reel/Frame 019287/0532 →
Assignment of Assignor's Interest
Jul 20, 2021
From: HANES, MITCHELL E.
To: SYNGENTA CROP PROTECTION AG
Reel/Frame 056911/0679 →