IP Library Assignment 059913/0938
Patent Assignment
Reel/Frame 059913/0938

Release of Security Interest

Recorded: 2022-05-10 Pages: 8
Assignor
AGILITY CAPITAL, LLC
Executed: 2007-05-22
Assignee
STRASBAUGH
825 BUCKLEY ROAD, SAN LUIS OBISPO, CALIFORNIA, 93401
Covered Properties (54)
Lap Shaping Machine with Oscillatable Point Cutter and Selectively Rotatable or Oscillatable Lap
Patent: 4,380,412 →
Application: 06/063,036 →
Wafer-Handling Apparatus Having a Resillent Membrane Which Holds Water When a Vacum Is Applied
Patent: 5,423,716 →
Application: 08/178,530 →
Wafer Carrier for Film Planarization
Patent: 5,449,316 →
Application: 08/178,531 →
Chemical Mechanical Polishing Apparatus and Method
Patent: 6,045,716 →
Application: 08/892,795 →
Grinding Process and Apparatus for Planarizing Sawed Wafers
Patent: 5,964,646 →
Application: 08/971,642 →
Parallel Alignment Method and Apparatus for Chemical Mechanical Polishing
Patent: 6,354,926 →
Application: 09/038,875 →
Apparatus for Sensing the Presence of a Wafer
Patent: 5,961,169 →
Application: 09/124,160 →
Apparatus and Method for Reliably Releasing Wet, Thin Wafers
Patent: 6,254,155 →
Application: 09/228,113 →
Accurate Positioning of a Wafer
Patent: 6,131,589 →
Application: 09/247,106 →
Non-Contacting Support for a Wafer
Patent: 6,283,827 →
Application: 09/247,107 →
Sensing the Presence of a Wafer
Patent: 6,267,642 →
Application: 09/247,108 →
Lifting and Rinsing a Wafer
Patent: 6,102,057 →
Application: 09/247,109 →
Slurry Pump Control System
Patent: 6,183,341 →
Application: 09/248,167 →
Optical View Port for Chemical Mechanical Planarization Endpoint Detection
Patent: 6,146,242 →
Application: 09/330,472 →
Method for Chemical Mechanical Polishing
Patent: 6,495,463 →
Application: 09/407,472 →
Publication: US 2002/0068450
Method and Apparatus for Chemical Mechanical Polishing
Patent: 6,361,647 →
Application: 09/432,144 →
Pad Quick Release Device for Chemical Mechanical Polishing
Patent: 6,227,956 →
Application: 09/432,882 →
Polishing pad with built-in optical sensor
Patent: 6,485,354 →
Application: 09/590,470 →
Lifting and Rinsing a Wafer
Patent: 6,505,635 →
Application: 09/608,618 →
Accurate Positioning of a Wafer
Patent: 6,405,740 →
Application: 09/630,507 →
Pad Quick Release Device for Chemical Mechanical Planarization
Patent: 6,464,574 →
Application: 09/693,040 →
Multi-pad apparatus for chemical mechanical planarization
Patent: 6,346,036 →
Application: 09/693,064 →
Pad Support Apparatus for Chemical Mechanical Planarization
Patent: 6,602,121 →
Application: 09/693,148 →
Pad Retrieval Apparatus for Chemical Mechanical Planarization
Patent: 6,527,621 →
Application: 09/693,152 →
Pad Transfer Apparatus for Chemical Mechanical Planarization
Patent: 6,450,860 →
Application: 09/693,153 →
Polishing Chemical Delivery for Small Head Chemical Mechanical Planarization
Patent: 6,514,121 →
Application: 09/699,202 →
Shaping Polishing Pad for Small Head Chemical Mechanical Planarization
Patent: 6,517,419 →
Application: 09/699,280 →
High Planarity Chemical Mechanical Planarization
Patent: 6,520,843 →
Application: 09/699,283 →
Multi-Action Chemical Mechanical Planarization Device and Method
Patent: 6,514,129 →
Application: 09/699,285 →
Spherical Drive Assembly for Chemical Mechanical Planarization
Patent: 6,511,368 →
Application: 09/699,287 →
Wafer Support for Chemical Mechanical Planarization
Patent: 6,379,235 →
Application: 09/699,289 →
In Situ Feature Height Measurement During Cmp
Patent: 6,629,874 →
Application: 09/699,290 →
Hard Polishing Pad for Chemical Mechanical Planarization
Patent: 6,551,179 →
Application: 09/706,336 →
Combined Chemical Mechanical Planarization and Cleaning
Patent: 6,692,339 →
Application: 09/706,349 →
Subaperature Chemical Mechanical Planarization with Polishing Pad Conditioning
Patent: 6,547,651 →
Application: 09/709,972 →
Optical View Port for Chemical Mechanical Planarization Endpoint Detection
Patent: 6,488,568 →
Application: 09/712,825 →
Polishing Pad with Built-in Optical Sensor
Patent: 6,739,945 →
Application: 09/970,252 →
Publication: US 2002/0090887
Method of Spin Etching Wafers with an Alkali Solution
Patent: 6,743,722 →
Application: 10/059,701 →
Publication: US 2003/0143861
Method of Preparing Whole Semiconductor Wafer for Analysis
Patent: 6,921,719 →
Application: 10/065,589 →
Publication: US 2004/0087146
Method for Making a Polishing Pad with Built-in Optical Sensor
Patent: 6,696,005 →
Application: 10/145,332 →
Publication: US 2003/0209830
Polishing Pad with Optical Sensor
Patent: 6,726,528 →
Application: 10/146,494 →
Publication: US 2003/0216107
Polishing Pad Sensor Assembly with a Damping Pad
Patent: 6,884,150 →
Application: 10/216,107 →
Publication: US 2003/0216108
Protection of Work Piece During Surface Processing
Patent: 7,018,268 →
Application: 10/249,433 →
Publication: US 2003/0211813
Method for Applying an Insert or Tape to Chucks or Wafer Carriers Used for Grinding, Polishing, or Planarizing Wafers
Patent: 6,638,389 →
Application: 10/259,536 →
Publication: US 2003/0079828
Endpoint Detection System for Wafer Polishing
Patent: 6,695,681 →
Application: 10/303,621 →
Publication: US 2003/0109196
Coupler for Coupling an Accessory to a Dipper Arm and a Control System for Such a Coupler
Patent: 6,964,122 →
Application: 10/313,576 →
Publication: US 2003/0204972
Modular Method for Chemical Mechanical Planarization
Patent: 6,855,030 →
Application: 10/327,712 →
Publication: US 2004/0048550
Device for Supporting Thin Semiconductor Wafers
Patent: 6,885,206 →
Application: 10/365,081 →
Publication: US 2004/0155671
Subaperture Chemical Mechanical Planarization with Polishing Pad Conditioning
Patent: 6,945,856 →
Application: 10/374,494 →
Publication: US 2003/0153250
Wafer Carrier Pivot Mechanism
Patent: 7,156,946 →
Application: 10/425,896 →
Publication: US 2004/0226656
Slurry Pump Control System
Patent: 6,878,037 →
Application: 10/626,490 →
Publication: US 2004/0142636
Retaining Ring for Wafer Carriers
Patent: 6,869,348 →
Application: 10/680,995 →
Publication: US 2005/0075062
Method of Backgrinding Wafers While Leaving Backgrinding Tape on a Chuck
Patent: 7,059,942 →
Application: 10/717,032 →
Publication: US 2004/0157536
Devices and Methods for Optical Endpoint Detection During Semiconductor Wafer Polishing
Patent: 7,235,154 →
Application: 10/754,360 →
Publication: US 2005/0150599
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 23, 2011
From: LAM RESEARCH CORPORATION
To: APPLIED MATERIALS, INC.
Reel/Frame 026006/0750 →
Security Interest Mar 7, 2017
From: STRASBAUGH AND R.H. STRASBAUGH
To: BFI BUSINESS FINANCE DBA CAPITALSOURCE BUSINESS FINANCE GROUP
Reel/Frame 041904/0158 →
Assignment of Assignor's Interest Mar 8, 2017
From: BFI BUSINESS FINANCE DBA CAPITALSOURCE BUSINESS FINANCE GROUP
To: REVASUM, INC.
Reel/Frame 041909/0687 →