Patent Assignment
Reel/Frame 016334/0537
Assignment of Assignor's Interest
Recorded: 2005-03-08
Pages: 8
Assignor
SEIKO INSTRUMENTS INC.
Executed: 2005-02-14
Assignee
SII NANO TECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN
Covered Properties
(83)
Method for Repairing a Pattern Film
Patent:
4,849,642 →
Application:
07/130,886 →
Apparatus for Repairing a Pattern Film
Patent:
4,851,097 →
Application:
07/138,360 →
Method of Correcting a Pattern Film
Patent:
4,902,530 →
Application:
07/157,922 →
Method and Apparatus for Modifying Patterned Film
Patent:
4,874,460 →
Application:
07/272,017 →
Focused Ion Beam Apparatus Having Charged Particle Energy Filter
Patent:
4,983,830 →
Application:
07/373,035 →
Viscoelasticity Measuring Apparatus
Patent:
4,967,601 →
Application:
07/388,830 →
Thermal Analysis Apparatus
Patent:
5,013,159 →
Application:
07/420,311 →
Cooling Device of Heating Furnace in Thermal Analyzer
Patent:
4,979,896 →
Application:
07/426,292 →
Apparatus for Preparation and Observation of a Topographic Section
Patent:
5,023,453 →
Application:
07/427,537 →
Graph Display Device
Patent:
5,309,171 →
Application:
07/433,304 →
Fluorescent X-Ray Film Thickness Gauge
Patent:
5,060,247 →
Application:
07/436,874 →
Amplitude Measurement Device for Viscoelasticity Analysis
Patent:
4,984,469 →
Application:
07/437,224 →
Preparation and Observation Method of Micro-Section
Patent:
5,028,780 →
Application:
07/444,716 →
Automatic Cooling System
Patent:
5,117,639 →
Application:
07/521,331 →
Electron Beam Device
Patent:
5,023,457 →
Application:
07/530,791 →
Composite Scanning Tunneling Microscope
Patent:
5,142,145 →
Application:
07/548,671 →
Composite Scanning Tunnelling Microscope with a Positioning Function
Patent:
5,117,110 →
Application:
07/557,856 →
Controlling a Liquid Metal Ion Source by Analog Feedback and Digital Cpv Control
Patent:
5,111,053 →
Application:
07/656,848 →
An Ion Beam Processing Apparatus and Gas Gun Therefor
Patent:
5,148,024 →
Application:
07/676,447 →
Method of Stabilizing Operation for a Liquid Metal Ion Source
Patent:
5,153,440 →
Application:
07/679,861 →
Tension Type Dynamic Viscoelasticity Measuring Apparatus
Patent:
5,154,085 →
Application:
07/748,859 →
Thermomechanical Analyzer
Patent:
5,287,749 →
Application:
07/774,092 →
Tension Type Dynamic Viscoelasticity Measuring Apparatus
Patent:
5,182,950 →
Application:
07/783,047 →
Method for Automatic Sample Positioning
Patent:
5,215,923 →
Application:
07/792,276 →
Thermal Analysis Device
Patent:
5,293,404 →
Application:
07/799,060 →
Furnace for Viscoelasticity Measuring Device with C0NCENTRIC Gas Cooling Shield
Patent:
5,200,975 →
Application:
07/799,357 →
Thermogravimetric Apparatus
Patent:
5,215,377 →
Application:
07/799,833 →
Waveform Display Device
Patent:
5,379,239 →
Application:
07/799,834 →
Heat Analyzer
Patent:
5,228,778 →
Application:
07/914,103 →
Apparatus for Thermogravimetry
Patent:
5,306,087 →
Application:
07/934,391 →
Analysis of Integrated Circuit Operability Using a Focused Ion Beam
Patent:
5,376,883 →
Application:
07/984,921 →
Method for Correcting a Patterned Film Using an Ion Beam
Patent:
5,405,734 →
Application:
08/036,449 →
Fluorescent X-Ray Film Thickness Measuring Apparatus
Patent:
5,299,252 →
Application:
08/044,363 →
Inductively Coupled Plasma Mass Spectrometry Device
Patent:
5,334,834 →
Application:
08/045,422 →
Parallel Plate Dielectric Constant Measuring Apparatus Having Means for Preventing Sample Deformation
Patent:
5,389,884 →
Application:
08/057,766 →
Scanning Probe Microscope Having a Directional Coupler and a Z-Direction Distance Adjusting Piezoelectric Element
Patent:
5,324,935 →
Application:
08/057,767 →
Dielectric Constant-Measuring Apparatus
Patent:
5,345,183 →
Application:
08/059,392 →
Apparatus for Thermal Analysis
Patent:
5,448,504 →
Application:
08/065,054 →
Inductively Coupled Plasma Mass Spectrometer
Patent:
5,477,048 →
Application:
08/118,820 →
Thermomechanical Analyzer
Patent:
5,370,457 →
Application:
08/134,846 →
Dynamic Viscoelasticity Apparatus
Patent:
5,452,614 →
Application:
08/135,483 →
Method of Automatically Setting Coordinate Conversion Factor
Patent:
5,444,245 →
Application:
08/158,739 →
Scanning Probe Microscope
Patent:
5,440,121 →
Application:
08/174,292 →
Thermogravimetric Apparatus with a Balance Arm Vibrating Function
Patent:
5,466,066 →
Application:
08/184,027 →
Particle Analysis Method
Patent:
5,477,049 →
Application:
08/184,122 →
Automatic Cooling Apparatus
Patent:
5,418,351 →
Application:
08/184,562 →
Surface Analyzing and Processing Apparatus
Patent:
5,440,122 →
Application:
08/186,137 →
Focused Charged Beam Apparatus, and Its Processing and Observation Method
Patent:
5,525,806 →
Application:
08/191,863 →
Coating Thickness Gauge by X-Ray Fluorescence
Patent:
6,061,425 →
Application:
08/194,369 →
Sample Holding Apparatus
Patent:
5,484,252 →
Application:
08/199,446 →
Thermal Analyser
Patent:
5,442,949 →
Application:
08/201,272 →
Focused Ion Beam Apparatus and Method
Patent:
5,574,280 →
Application:
08/204,468 →
Inductive Plasma Mass Spectrometer
Patent:
5,426,299 →
Application:
08/208,009 →
Microelectronic Processing Machine
Patent:
5,489,339 →
Application:
08/208,145 →
Method of Finding the Center of a Band-Shaped Region
Patent:
5,425,066 →
Application:
08/210,387 →
An Alignment Assembly for Aligning Spring Element with a Laser Beam in a Probe Microscope
Patent:
5,423,514 →
Application:
08/217,747 →
Scanning Type Probe Microscope
Patent:
5,506,400 →
Application:
08/220,103 →
Analyzing Method for Foreign Matter States
Patent:
5,457,725 →
Application:
08/220,598 →
Focused Ion Beam Apparatus
Patent:
5,438,197 →
Application:
08/272,545 →
Thermal Analysis Instrument
Patent:
5,599,104 →
Application:
08/311,739 →
Electron Beam Microanalyzer
Patent:
5,483,065 →
Application:
08/321,676 →
Micromachining Method for Workpiece Observation
Patent:
6,395,347 →
Application:
08/351,093 →
Micro Area Analyzing Method
Patent:
5,541,973 →
Application:
08/412,665 →
Method for Measuring the Coefficient of Heat Conductivity of a Sample
Patent:
5,711,604 →
Application:
08/552,548 →
Humidity Control Thermal Analyzer
Patent:
5,669,554 →
Application:
08/561,194 →
An Optical Scanning System Utilizing an Atomic Force Microscope and an Optical Microscope
Patent:
5,650,614 →
Application:
08/564,747 →
Analyzing Method and Apparatus for Minute Foreign Substances, and Manufacturing Methods for Manufacturing Semiconductor Device and Liquid Crystal Display Device Using the Same
Patent:
5,877,035 →
Application:
08/600,141 →
Method for Analyzing Minute Foreign Substance Elements
Patent:
6,124,142 →
Application:
08/600,142 →
Thermomechanical Analyzer Equipped with a Thermogravimetry Function
Patent:
5,826,983 →
Application:
08/678,045 →
Sample Container Sealer Having Function of Setting Load
Patent:
5,718,097 →
Application:
08/688,497 →
Plasma Ion Mass Analyzing Apparatus
Patent:
6,031,379 →
Application:
08/724,996 →
Method of Detecting Plastic Deformation in Steel Using a Differential Type Magnetic Field Sensor
Patent:
5,982,172 →
Application:
08/746,794 →
Plasma Ion Source Mass Analyzer
Patent:
5,804,821 →
Application:
08/856,605 →
Thermogravimetric Instrument
Patent:
6,057,516 →
Application:
08/896,664 →
Ion Beam Working Apparatus
Patent:
6,118,122 →
Application:
08/922,892 →
Focused Ion Beam Optical Axis Adjustment Method and Focused Ion Beam Apparatus
Patent:
5,969,355 →
Application:
08/923,562 →
Focused Ion Beam Optical Axis Adjustment Method and Focused Ion Beam Apparatus
Patent:
5,917,186 →
Application:
08/925,976 →
Fluorescent X-Ray Spectroscope
Patent:
6,154,517 →
Application:
09/064,332 →
Analyzing Method and Apparatus for Minute Foreign Substances, and Manufacturing Methods for Manufacturing Semiconductor Device and Liquid Crystal Display Device Using the Same
Patent:
6,255,127 →
Application:
09/187,938 →
Focused Ion Beam Processing Apparatus
Patent:
6,365,905 →
Application:
09/324,264 →
Thermo-Mechanical Analyzer
Patent:
6,599,010 →
Application:
09/517,673 →
Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal display elements by use thereof
Patent:
6,355,495 →
Application:
09/553,339 →
Automatic Focusing System for Scanning Electron Microscope Equipped with Laser Defect Detection Function