Patent Assignment
Reel/Frame 025346/0868
Change of Name
Recorded: 2010-11-11
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Mos Type Semiconductor Device Having Electrostatic Discharge Protection Arrangement
Communication System, Communication Device, and Communication Method
Format Conversion Method and Apparatus and Format Conversion Control Program
Digital Filter and Filtering Method
Optical Disk Drive and Method for Controlling Sled Motor Within Optical Disk Drive
Cleaning Solution and Manufacturing Method for Semiconductor Device
Noise Canceller Circuit
Electronic control device and data adjustment method
Application:
11/117,326 →
Publication:
US 2005/0246513
Monitoring Device, Transceiver System and Its Control Method
Signal Amplifier
Function Verification Method
Voltage Regulator with Improved Power Supply Rejection Ratio Characteristics and Narrow Response Band
Electrode Pad Arrangement with Open Side for Waste Removal
Semiconductor Device and Method for Manufacturing Same
Semiconductor Device and Method for Manufacturing Same
Image Processing Overlaying One Image on Another
Data Transfer and Alignment Device and Method for Transferring Data Acquired from Memory
Semiconductor Device and Method for Manufacturing Same
Semiconductor Laser and Manufacturing Process Therefor
Semiconductor Device with Improved Stress Migration Resistance and Manufacturing Process Therefor
Communication Message Conversion Device, Communication Method and Communication System
Wiring Board and Semiconductor Package Using the Same
Pll Circuit and Frequency Setting Circuit Using the Same
Apparatus for Inputting Clock Signal and Data Signals of Small Amplitude Level with Start Timing of Inputting Clock Signal Ahead of That of Inputting Data Signals
Drive Circuit, Operation State Detection Circuit, and Display Device
Semiconductor Device
Semiconductor Device Having High Dielectric Constant Layers of Different Thicknesses
Controller Driver and Display Apparatus
Semiconductor Memory Device
Semiconductor Memory Device for Build-in Fault Diagnosis
Driving Circuit of Display Device
Patent:
40,739 →
Application:
11/131,473 →
Prefix Processing Technique for Faster Ip Routing
Prefix optimizations for a network search engine
Application:
11/133,227 →
Publication:
US 2006/0198379
Semiconductor Memory Device and Operating Method of the Same
Bump Structure
Semiconductor Device
Drive Circuit for Driving an Image Display Unit
Patent:
40,773 →
Application:
11/133,483 →
Semiconductor Memory Device and Method of Entry of Operation Modes Thereof
Phase Synchronous Circuit
Semiconductor Device Including Vanadium Oxide Sensor Element with Restricted Current Density
Interrupt Generation Circuit for Intermediate Response to Edge Detection Signal, When Count Value of Main Timer Is Less Than Pre-Stored Value
Semiconductor Device with Connecting via and Dummy via and Method of Manufacturing the Same
Semiconductor Storage Device
Semiconductor Device and Method of Manufacturing the Same
Data Transmission Apparatus and a Data Receiving Apparatus Used for the Same
Method of Manufacturing Semiconductor Device Having Multiple Gate Oxide Films
Satellite Broadcasting Converter, Control Circuit Incorporated Therein, and Detector Circuit Used in Such Control Circuit
Semiconductor Device with Power Supply Impurity Region
Semiconductor Device
Method for Processing Interior of Vapor Phase Deposition Apparatus, Method for Depositing Thin Film and Method for Manufacturing Semiconductor Device
Semiconductor Integrated Circuit, Method for Designing Semiconductor Integrated Circuit and System for Designing Semiconductor Integrated Circuit
Receiving Device and Analog-to-Digital Conversion Device
Level Shifter and Buffer Circuit
Apparatus and Method for Lcd Panel Drive for Achieving Time-Divisional Driving and Inversion Driving
Semiconductor Device and Semiconductor Wafer and a Method for Manufacturing the Same
Photodector and Photodetecting Device
Semiconductor Chip and Method for Manufacturing the Same and Semiconductor Device
Short Detection Circuit and Short Detection Method
Etching and Cleaning Methods and Etching and Cleaning Apparatuses Used Therefor
Nonvolatile Memory
Hierarchical Module
Semiconductor Device
Voltage Comparator Circuit
Mos Type Semiconductor Device Having Electrostatic Discharge Protection Arrangement
Light Exposure Apparatus and Method of Light Exposure Using Immersion Lithography with Saturated Cyclic Hydrocarbon Liquid
Semiconductor Protection Device
Semiconductor Wafer and Manufacturing Process for Semiconductor Device
Analog-To-Digital Conversion System, Correction Circuit, and Correction Method
Frequency Multiply Circuit Using Smd, with Arbitrary Multiplication Factor
High-Frequency Ic and Gps Receiver
Semiconductor Device
Soi Substrate and Method for Manufacturing the Same
Solid-State Image Sensing Device and Method for Manufacturing the Same
Semiconductor Memory Device and Manufacturing Method Therefor
Method of fabricating a semiconductor device
Integrated Circuit Apparatus Controlling Source Voltage of Mosfet Based on Temperature
Semiconductor Device and Method for Manufacturing the Same
Data Line Driver Capable of Generating Fixed Gradation Voltage Without Switches
De-Interleaver, Mobile Communication Terminal, and De-Interleaving Method
Semiconductor Device Having a Through Electrode
Semiconductor Device and Semiconductor Module Employing Thereof
Semiconductor Device Providing a First Electrical Conductor and a Second Electrical Conductor in One Through Hole and Method for Manufacturing the Same
Small-Sized Data Line Driver Capable of Generating Definite Non-Video Gradation Voltage
Electronic Package and Semiconductor Device Using the Same
Phase Shifter
Pulse Width Modulation Circuit with Multiphase Clock
Semiconductor Device, Semiconductor Device Module and Method of Manufacturing the Semiconductor Device
Gradation Voltage Selecting Circuit, Driver Circuit, Liquid Crystal Drive Circuit, and Liquid Crystal Display Device
Wiring Substrate for Mounting Semiconductors, Method of Manufacturing the Same, and Semiconductor Package
Semiconductor Device and Method of Manufacturing Same
Satellite Broadcasting Converter, Control Circuit Incorporated Therein, and Detector Circuit Used in Such Control Circuit
Semiconductor Chip Mounting Arrangement
Related Assignments
(18)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 26, 2005
From: MANABE, MASAO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016511/0422 →
Assignment of Assignor's Interest
Apr 26, 2005
From: HARAGUCHI, YOSHIZUMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016520/0027 →
Assignment of Assignor's Interest
Apr 27, 2005
From: SHIME, ISAO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016527/0523 →
Assignment of Assignor's Interest
Apr 27, 2005
From: AOKI, HIDEMITSU; SUZUKI, TATSUYA; OHWADA, TAKUO; IKEGAMI, KAORU
To: NEC ELECTRONICS CORPORATION; KANTO KAGAKU KABUSHIKI KAISHA
Reel/Frame 016511/0338 →
Assignment of Assignor's Interest
Apr 27, 2005
From: ARAMAKI, YOSHINORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016514/0448 →
Assignment of Assignor's Interest
Apr 27, 2005
From: MITSUISHI, MASAFUMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016514/0838 →
Assignment of Assignor's Interest
Apr 29, 2005
From: ADACHI, MASAHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016518/0053 →
Assignment of Assignor's Interest
Apr 29, 2005
From: OBA, KAORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016528/0556 →
Assignment of Assignor's Interest
May 2, 2005
From: MORIYA, TARO; NAKASHIBA, YASUTAKA; UCHIYA, SATOSHI; FURUMIYA, MASAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016529/0768 →
Assignment of Assignor's Interest
May 4, 2005
From: OHBUCHI, EISAKU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016535/0153 →
Assignment of Assignor's Interest
May 10, 2005
From: OKUYAMA, TOMOYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016209/0651 →
Assignment of Assignor's Interest
May 17, 2005
From: IWAZUMI, KEIICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016220/0149 →
Assignment of Assignor's Interest
May 17, 2005
From: IIMA, TOMOFUMI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016220/0140 →
Assignment of Assignor's Interest
Jun 15, 2005
From: KAWAKAMI, DAISUKE
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016339/0400 →
Assignment of Assignor's Interest
Jun 29, 2005
From: KODAMA, NORIYUKI; SAWAHATA, KOICHI; HIRATA, MORIHISA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 016740/0580 →
Change of Address
Nov 19, 2015
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 037146/0351 →
Assignment of Assignor's Interest
Nov 19, 2015
From: KANTO KAGAKU KABUSHIKI KAISHA
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 037082/0069 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →